We provide a method of assessing an acquired mass spectrum, the method including the steps of: obtaining a model isotope pattern for a chemical compound of known elemental composition, providing mass spectrum data obtained from a mass spectrometer in analysis of the chemical compound, and performing location matching by comparing the mass spectrum data to the isotope pattern to match a reference location in the isotope pattern with respective corresponding candidate locations in the mass spectrum data, the location matching including: determining a likelihood function over the mass spectrum data, representing the likelihood that each location in the mass spectrum data correctly corresponds to the reference location of the isotope pattern, determining a set of candidate locations each corresponding to a local maxima in the determined likelihood function, and at each candidate location, determining an associated error bar based on the curvature of the likelihood function at that location.

An analysis system and/or method including a mass spectrometer. The mass spectrometer may be configured to conduct a measurement on a sample using at least one laser-shot and generate a distribution of measured data for the at least one laser-shot on the sample. The measurement on the sample is a manufacturing technique. The manufacturing technique relates to component costs.

Disclosed herein is a method of processing mass spectral data comprising making direct calibration measurements to determine a calibration shift of the mass spectrometry instrument at a calibration time and determining a set of intrinsic ion species that persist across multiple acquisition periods. The direct calibration measurements are then used together with an expected variation in calibration shift as well as the set of intrinsic ion species to calculate the calibration shift of the mass spectrometry instrument at one or more time point(s) of interest other than the calibration time.

A method of correcting mass spectral data comprises making calibration measurements of first intrinsic components (A, B, C) at one or more calibration times (t1) using calibrants which have known mass to charge ratio (m/z) values or previously mass measured mass to charge ratio (m/z) values, making a list of second intrinsic components (D, E, F) which are present during more than one acquisition periods, wherein the second intrinsic components have mass to charge ratio (m/z) values that were not present or observed during or close to the one or more calibration times (t1) but which do overlap in time with the first intrinsic components (A, B, C), and utilising the list to calculate a mass or mass to charge ratio (m/z) correction factor for one or more acquisition periods which are not close or adjacent in time to an acquisition period containing a directly calibrated mass to charge ratio (m/z) value.

This invention has as its object a method of filtering an ion beam to isolate ions having a targeted charge to mass ratio, the method comprising: providing a quadrupole mass filter device (2), emitting an ion beam (1′) from a source (1) towards a quadrupole mass filter device (2), applying an electrical field between the rods (3, 3′) of each pair of opposite rods (3, 3′) of the device (2), each field being defined by combined direct and alternative potentials, calibrating each of the electrical fields in order to create at least one exact focusing point (8) at the exit (5), method characterized in that it also consists in generating, by means of rods (3, 3′) which are segmented longitudinally, an electrical field extending between and along each pair of segmented rods (3, 3′), calibrating said local field segments by adjusting the settings of their respective individual DC and AC potentials in order to create at least one intermediate node, creating and maintaining an unstable motion region or region of variable stability (10) in the vicinity of and at said at least one intermediate node location.

In mass spectrometry significant error is introduced during sample preparation (sample-to-sample error), during ion generation (ion suppression), and during ion transmission (ion transmission losses). We demonstrate the ability to correct for ion suppression and ion transmission losses, and that once corrected for ion losses, a sample-to-sample normalization of the analytical sample to the internal standard is possible. By normalizing to a standard sample the analytical sample becomes completely comparable to any similarly treated sample.

A method for calibrating at least one mass spectrometry device having a first defined hardware configuration comprises at least one manufacturer-site pre-calibration step establishing at least one reference calibration function f.sub.p for a generic type of mass spectrometry devices having a second defined hardware configuration, wherein the second defined hardware configuration is equivalent to the first defined hardware configuration, wherein the reference calibration function f.sub.p describes a relationship of at least one concentration c of at least one analyte in at least one calibrator sample, wherein the reference calibration function f.sub.p is a parametrized function f.sub.p(concentration), with p=(p.sub.1,p.sub.2, . . . p.sub.n) being a set of parameters of the reference calibration function and n being a positive integer; determining calibration values {circumflex over (p)}=({circumflex over (p)}.sub.1,{circumflex over (p)}.sub.2, . . . {circumflex over (p)}.sub.n) for the set of parameters of the reference calibration function for the generic type of mass spectrometry devices.

An analytical device includes: a first electrode to which a pulse voltage for accelerating ions is applied; at least one switching element that controls application of the pulse voltage to the first electrode; a second electrode that defines a space in which the ions fly; an ion detector that detects the ions; and a vacuum vessel that has the second electrode inside, wherein: the switching element is in contact with an insulator, and the insulator is in contact with the vacuum vessel.

The invention generally relates to a sample dispenser including an internal standard and methods of use thereof.

A method for checking a validity of a mass axis calibration of a mass spectrometer (MS) of an analyzer system, comprising obtaining a mass axis check sample spanning a predetermined m/z measurement range of the MS and automatically processing the sample, performing multiple full scan mode MS measurements of different types using the MS for the at least two mass axis points to obtain measurement data, wherein the different types include at least a first full scan MS measurement in a positive mode and a second measurement in a negative mode, or at least a first full scan measurement for a first mass filter and a second full scan measurement for a second mass filter; comparing the measurement data for each of the at least two mass axis points with respective reference data and determining if a condition is out of specification based on a result of the comparing steps.