Calibration of a mass spectrometer is described. In one aspect, a mass spectrometer can generate an offset value indicative of the mass difference between the corrected and reference external calibrant ion data. By comparing the offset value to a threshold, a preliminary mass calibration can be modified, or a recalibration of the mass spectrometer is performed.

This patent document discloses a method for instrument calibration. In particular, the method can be applied to reduction of random errors by averaging fitting equation coefficients.

A method for relative quantitative analysis of a polymer using MALDI mass spectrometry, the method comprising the steps of preparing a plurality of polymer specimens having a thickness variation of 30% or less by electrospraying a solution including a polymer sample, a monomeric internal standard material, and a matrix through a mask for each different concentration of the polymer sample; obtaining MALDI mass spectra by irradiating laser beams to each of the plurality of polymer specimens, and calculating a signal intensity ratio of the polymer sample to the small molecule internal standard from peak results of the spectra; and depicting the calculated signal intensity ratio according to the concentration of the polymer sample to prepare a quantitative calibration curve, and the method capable of providing MALDI mass spectra with reduced overlapping peaks and thereby providing the relative quantitative analysis of a polymer with improved accuracy.

The present invention relates to methods of improving analytical instruments and improved analytical instruments. The aforementioned method employs a calibration correction module that calibrates the machine to effect measurements with the minimum possible relative squared error. This results in a significant improvement of the analytical instrument in question that leads to more precise and accurate results.

An optimization control system may receive mass spectra of ions emitted from an ionization emitter toward an inlet of a mass spectrometer and control, based on the mass spectra, an automated motion system to adjust a position of the emitter relative to the inlet.

The present disclosure relates to the technical field of calibration of basic parameters of mass spectrometers, and provides a method for on-orbit calibration of basic parameters of a mass spectrometer. Based on the characteristic that a molten silicate mineral can adsorb a gas in an environment, under vacuum conditions, a silicate mineral is heated to obtain the molten silicate mineral. The molten silicate mineral is put in an environment with a standard gas for adsorption, rapid cooling is conducted to obtain a standard sample, and the standard sample is preloaded into a thermal control device of the mass spectrometer. When the mass spectrometer enters a definitive orbit for testing a substance, on-orbit heating is conducted on the standard sample to make the adsorbed standard gas released into the mass spectrometer so as to achieve the calibration of the basic parameters of the mass spectrometer.

The invention generally relates to a sample dispenser including an internal standard and methods of use thereof.

Methods for testing or adjusting a charged-particle detector are provided. A diagnostic and/or adjustment method for a charged-particle detector of an instrument includes providing, from a photon source, photons incident on the charged-particle detector. Moreover, the method includes detecting a response by the charged-particle detector to the photons incident thereon. Related detection systems are also provided.

An analytical system including a mass spectrometer (MS) coupled to liquid chromatography (LC) via an ionization source (IS), and an automated method of maintaining the analytical system in a QC-compliant status are described. The method comprises determining a deviation of the analytical system from a QC-compliant status by determining a deviation of one or more predetermined parameters in an m/z spectrum above one or more predetermined thresholds, triggering an IS and/or MS maintenance procedure upon determining a deviation from the QC-compliant status, determining a return or a failed return to the QC-compliant status during and/or after the IS and/or MS maintenance procedure by determining a return or a failed return respectively of the one or more predetermined parameters in an m/z spectrum below the one or more predetermined thresholds, triggering another IS and/or MS maintenance procedure upon determining a failed return to the QC-compliant status.

A data processing device configured to create, based on a plurality of spectra each obtained from each of a plurality of specimens containing a predetermined component at known concentrations different from one another, a calibration curve showing a relationship between a concentration of the component in the specimen and an area of a peak corresponding to the component of a spectrum of the specimen, where each of the plurality of spectra has a peak top at a position depending on a component contained in a specimen. The device includes a display unit and a peak range setting unit configured to allow an operator to set both end positions of a peak or a position of a baseline corresponding to the component included in the displayed spectrum.