Patent classifications
H01J49/0013
Methods and systems for integrating ion manipulation devices
A switch for coupling a first ion manipulation device to a second ion manipulation device comprises a first surface and a second surface, at least one first electrode coupled to each of the first and second surface and configured to receive a first voltage and generate a first potential, and at least one second electrode coupled to each of the first and second surface and configured to receive a second voltage and generate a second potential, wherein the first potential inhibits the motion of ions along a first direction and the second potential inhibits the motion of ions along a second direction different from the first direction.
SYSTEMS AND METHODS FOR SEPARATING IONS AT ABOUT OR ABOVE ATMOSPHERIC PRESSURE
The invention generally relates to systems and methods for separating ions at about or above atmospheric pressure. In certain embodiments, the invention provides systems that include an ionization source that generates ions and an ion trap. The ion trap is maintained at about or above atmospheric pressure and includes a plurality of electrodes and at least one inlet configured to receive a gas flow and at least one outlet. The system is configured such that a combination of a gas flow and one or more electric fields produced by the electrodes separates the ions based on mass-to-charge ratio and sends the separated ions through the at least one outlet of the ion trap.
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
Compact mass spectrometer
A miniature mass spectrometer is disclosed comprising an atmospheric pressure ionization source and a first vacuum chamber having an atmospheric pressure sampling orifice or capillary, a second vacuum chamber located downstream of the first vacuum chamber and a third vacuum chamber located downstream of the second vacuum chamber. An ion detector is located in the third vacuum chamber. A first RF ion guide is located within the first vacuum chamber and a second RF ion guide is located within the second vacuum chamber. The ion path length from the atmospheric pressure sampling orifice or capillary to an ion detecting surface of the ion detector is 400 mm. The mass spectrometer further comprises a tandem quadrupole mass analyzer, a 3D ion trap mass analyzer, a 2D or linear ion trap mass analyzer, a Time of Flight mass analyzer, a quadrupole-Time of Flight mass analyzer or an electrostatic mass analyzer arranged in the third vacuum chamber. The product of the pressure P.sub.1 in the vicinity of the first RF ion guide and the length L.sub.1 of the first RF ion guide is in the range 10-100 mbar-cm and the product of the pressure P.sub.2 in the vicinity of the second RF ion guide and the length L.sub.2 of the second RF ion guide is in the range 0.05-0.3 mbar-cm.
HIGHLY-MULTIPLEXED NEMS-ARRAY READOUT SYSTEM BASED ON SUPERCONDUCTING CAVITY OPTOMECHANICS
A NEMS readout system includes a sensor array comprising a plurality of sensors. Each sensor of the plurality of sensors including a resonator with frequency characteristics different from the resonator of each other sensor of the plurality of sensors. A readout signal indicative of a plurality of output signals is collected from the sensor array. Each output signal of the plurality of output signals corresponding to one of the plurality of sensors. An analysis of the plurality of output signals is performed to identify a plurality of resonant frequencies and to detect a frequency shift associated with at least one of the plurality of resonant frequencies.
Systems and methods for separating ions at about or above atmospheric pressure
The invention generally relates to systems and methods for separating ions at about or above atmospheric pressure. In certain embodiments, the invention provides systems that include an ionization source that generates ions and an ion trap. The ion trap is maintained at about or above atmospheric pressure and includes a plurality of electrodes and at least one inlet configured to receive a gas flow and at least one outlet. The system is configured such that a combination of a gas flow and one or more electric fields produced by the electrodes separates the ions based on mass-to-charge ratio and sends the separated ions through the at least one outlet of the ion trap.
Sample analysis systems and methods of use thereof
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
MASS ANALYZER
A mass analyzer for scanning sample gases is disclosed. The mass analyzer comprises an ionizer for generating ions from a sample; a mass filter with an accumulator section integrated in the mass filter and accumulates filtered ions prior to ejecting from the mass filter; and an ion detector that is configured to detecting ejected ions from the mass filter. The mass filter may include a quadrupole array and the accumulator section includes an ion trap array.
Zero voltage mass spectrometry probes and systems
The invention generally relates to zero volt mass spectrometry probes and systems. In certain embodiments, the invention provides a system including a mass spectrometry probe including a porous material, and a mass spectrometer (bench-top or miniature mass spectrometer). The system operates without an application of voltage to the probe. In certain embodiments, the probe is oriented such that a distal end faces an inlet of the mass spectrometer. In other embodiments, the distal end of the probe is 5 mm or less from an inlet of the mass spectrometer.
MASS SPECTROMETRY PROBES AND SYSTEMS FOR IONIZING A SAMPLE
The invention generally relates to mass spectrometry probes and systems for ionizing a sample. In certain embodiments, the invention provides a mass spectrometry probe including a substrate in which a portion of the substrate is coated with a material, a portion of which protrudes from the substrate.