A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic sampling tube are described. In an embodiment, the concentric APCI surface ionization probe includes an outer tube, an inner capillary, and a voltage source coupled to the outer tube and the inner capillary. The inner capillary is housed within and concentric with the outer tube such that ionized gas (e.g., air) travels out of the outer tube, reacts with a sample, and the resulting analyte ions are sucked into the inner capillary. A supersonic sampling tube can include a tube coupled to a mass spectrometer and/or concentric APCI surface ionization probe, where the tube includes at least one de Laval nozzle.

The invention generally relates to enclosed desorption electrospray ionization probes, systems, and methods. In certain embodiments, the invention provides a source of DESI-active spray, in which a distal portion of the source is enclosed within a transfer member such that the DESI-active spray is produced within the transfer member.

Mass spectrometry systems include an ionizer, mass analyzer and the detector, with a high pressure chamber holding the mass analyzer and a separate chamber holding the detector to allow for differential background pressures where P2<P1 which generates gas flow through an unsealed, sealed or partially sealed ion trap and enhances detected signal relative to when P2=P1.

Mass spectrometry systems include an ionizer, mass analyzer and the detector, with a high pressure chamber holding the mass analyzer and a separate chamber holding the detector to allow for differential background pressures where P2<P1 which generates gas flow through an unsealed, sealed or partially sealed ion trap and enhances detected signal relative to when P2=P1.

The invention generally relates to enclosed desorption electrospray ionization probes, systems, and methods. In certain embodiments, the invention provides a source of DESI-active spray, in which a distal portion of the source is enclosed within a transfer member such that the DESI-active spray is produced within the transfer member.

The disclosure features mass spectrometry systems that include: an ion source; a module featuring an ion trap, an ion detector, and a module housing that at least partially surrounds the ion trap and the ion detector; and a vacuum pump featuring a housing having a recess dimensioned to receive the module, so that when the module is positioned within the recess of the vacuum pump housing, a portion of the module is surrounded by the vacuum pump housing, and during operation of the system, the ion source, ion trap, ion detector, and vacuum pump are connected along a common gas flow path and heat is transferred from the vacuum pump to the module.

Mass spectrometry systems or assemblies therefore include an ionizer that includes at least one planar conductor, a mass analyzer with a planar electrode assembly, and a detector comprising at least one planar conductor. The ionizer, the mass analyzer and the detector are attached together in a compact stack assembly. The stack assembly has a perimeter that bounds an area that is between about 0.01 mm.sup.2 to about 25 cm.sup.2 and the stack assembly has a thickness that is between about 0.1 mm to about 25 mm.

The invention generally relates to enclosed desorption electrospray ionization probes, systems, and methods. In certain embodiments, the invention provides a source of DESI-active spray, in which a distal portion of the source is enclosed within a transfer member such that the DESI-active spray is produced within the transfer member.

An electronic device 1 for analyzing a gas composition, which is present in an environment A at an environment pressure Pa, is described. The device 1 is portable and comprises a gas sampling module 7, an ion filtering module 8 and an ion detecting module 9. The sampling module 7 is configured to adjust an input gaseous flow Fi of gaseous particles from the environment A and an output gaseous flow Fo so as to reproduce inside the sampling module 7 a gas composition representative of the gas composition to be analyzed. In addition, the sampling module 7 is configured to ionize said gaseous particles and to emit the ions produced, so as to generate an ion flow I having an ion composition representative of the gas composition to be analyzed. The ion filtering module 8 is operatively connected to the sampling module 7 to receive the ion flow I, and is configured to controllably select at least one type of ions present in the ion flow I and to generate a corresponding at least one homogeneous ion beam I, having an intensity representative of the concentration of the corresponding gas particle in the gaseous composition to be analyzed. The ion detecting module 9 is operatively connected to the ion filtering module 8 to receive the at least one ion beam I, and is configured to measure the intensity of such least one ion beam I and to generate a corresponding electric signal S representative of the concentration of the corresponding gas particle in the gaseous composition to be analyzed.

The device 1 further comprises pumping means 95, configured to extract gas from the device 1, so as to control an ionization pressure Pi that is present inside the sampling module 7. The sampling module 7 is configured in such a way that the input gaseous flow Fi comprises a plurality of micro-flows at a molecular or predominantly molecular regime, at the environment pressure Pa, and the output gaseous flow Fo is a flow at a molecular or predominantly molecular regime, at the ionization pressure Pi.

This invention relates to systems and methods for measuring quantitatively multiple species or heavy metals, including mercury, and other toxic pollutants. More specifically, the systems and methods of the invention allows for determination of the analytes even at very low concentration, through concentration on a collection interface, desorption and analysis by mass spectrometry. The invention also provides for a portable device or kit for modifying an existing mass spectrometer.