An apparatus includes a first pair of opposing electrode arrangements that confine ions between them in a portion of a confinement volume inwardly laterally in a first confinement direction with respect to a longitudinal ion propagation direction, each opposing electrode arrangement including an arrangement of RF electrodes situated to receive an unbiased RF voltage having an alternate phase between adjacent RF electrodes of the arrangement of RF electrodes so as to provide the confining of ions between the first pair of opposing electrode arrangements, and a second pair of opposing electrode arrangements that confine the ions between the second pair in the confinement volume inwardly laterally in a second confinement direction that complements the first confinement direction, each opposing electrode arrangement of the second pair including an arrangement of RF electrodes that receive an unbiased RF voltage having an alternate phase between adjacent RF electrodes.

Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.

The invention relates to the measurement of current profiles of free-flying ion or electron clusters which impinge on a detector electrode of a Faraday detector. The detector electrode here consists of a large number of structural elements in a bipolar arrangement, where neighboring structural elements have opposite polarities and structural elements with the same polarity are electrically connected, and a voltage is applied between neighboring structural elements so that before ions or electrons impinge on the detection electrode, they are essentially deflected onto the structural elements with one of the two polarities. If the current profiles on the structural elements of the two polarities are measured separately and subtracted from each other, a current profile which corresponds to the pure ion or electron current profile is obtained without using a screen grid.

A data dependent acquisition method of mass spectrometry using a dual analyser mass spectrometer for analysing a sample comprises the steps of: ionising the sample to produce a plurality of precursor ions; performing, by a first mass analyser, an MS1 scan of the precursor ions from the sample and identifying precursor ions of interest; selecting and fragmenting precursor ions of interest to produce first fragmented ions, and performing, by a second mass analyser, MS2 scans of the first fragmented ions; selecting and fragmenting further precursor ions of interest to produce second fragmented ions, and performing, by the first mass analyser, MS2 scans of the second fragmented ions, wherein the second mass analyser operates in an opposite polarity to the first mass analyser so as to generate MS2 scans of fragmented ions having an opposite polarity to the fragmented ions of the MS2 scans generated by the first mass analyser.

A dual-mode ion detector for a mass and/or ion mobility spectrometer comprising a first conversion electrode (20) that is maintained, in use, at a negative potential and arranged for converting incident positive ions (32) into secondary electrons (34), and a second conversion electrode (22) that is maintained, in use, at a positive potential and arranged for converting incident negative ions (42) into secondary positive ions (44) and/or secondary electrons (74). The detector also comprises an electron detecting surface (26) and an entrance electrode (24) for drawing ions into the ion detector. The ion detector is switchable between a first mode for detecting positive ions and a second mode for detecting negative ions.

Among other things, we describe methods and apparatus for the ionization of target molecular analytes of interest, e.g., for use in mass spectrometry. In some implementations, a thin molecular stream is emitted in either single or a split mode and encounters both an electron-impact ion source and trochoidal electron monochromator placed sequentially or coincidently. The first ion source emits high-energy electrons (70 eV) to generate characteristic positively-charged mass fragment spectra while the second source emits low-energy electrons in a narrow bandwidth to generate negative molecular ions or other ions via electron capture ionization. The dual ion source may be coupled to analytical instruments such as a gas chromatograph and to any number of mass analyzers such as a polarity switching quadrupole mass analyzer or to multiple mass analyzers.

Using the intensity ratio of peaks on a standard mass spectrum of the target compound and peaks with the same m/z on the measured mass spectrum near the retention time of said compound, a scale factor waveform close to the chromatogram shape based on the target compound alone is computed, and m/z candidates for quantitation are extracted based on the correlation between the measured mass chromatogram of the target compound and the scale factor waveform. Furthermore, an intensity ratio is determined with reference to the m/z peaks showing the greatest scale factor on the measured mass spectrum at the measurement time point showing the greatest scale factor in the scale factor waveform, and m/z candidates for quantitation/confirmation are narrowed down based on whether they fall within an allowable range based on peak intensity ratio on the standard mass spectrum.

The present invention relates to a particle beam mass spectrometer and particle measurement method by means of same. More particularly, the present invention relates to a particle beam mass spectrometer including: a particle focusing unit focusing a particle beam induced by gas flow; an electron gun forming a charged particle beam by accelerating thermal electrons to ionize the particle beam focused by the particle focusing unit; a deflector deflecting the charged particle beam according to kinetic energy to charge ratio; and a sensing unit measuring a current induced by the deflected charged particle beam, wherein the deflector includes at least one particle beam separation electrode provided at each of opposite sides with respect to a progress axis of the charged particle beam before being deflected.

A time-of-flight mass spectrometry device includes an electrode to which a DC high voltage is applied in order to form an ion flight space and a high voltage power supply device that applies the high voltage to the electrode. The high voltage power supply device includes a high voltage generating circuit that generates the high voltage, and a voltage control circuit that is selectively set to a convergence responsiveness priority mode in which the high voltage generating circuit is controlled such that the high voltage has first convergence responsiveness and first stability or a stability priority mode in which the high voltage generating circuit is controlled such that the high voltage has second convergence responsiveness that is lower than the first convergence responsiveness and second stability that is higher than the first stability.

The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.