The invention relates to methods and devices for analysing sample material on a sample carrier, comprising an operating mode as follows: providing a time-of-flight mass analyser with an ion generating unit having a mount for the sample carrier, an ion receiver, a flight route between them determining the longest time-of-flight, an ion selector along the route, and a clock generator for repeatedly triggering an ion generating pulse at the sample carrier and a subsequent pulse for accelerating ion species onto the flight route; defining one or more ranges of mass-to-charge ratios (m/z), each with an upper limit corresponding to a time-of-flight shorter than the longest time-of-flight; selecting a cycling of ion generating pulses such that the duration between successive pulses is shorter than the longest time-of-flight but longer than the acceleration time; and analysing the sample material using the mass analyser, the selected pulse cycling, and the ion selector.