Patent classifications
H01J49/26
SPECTROMETRIC ANALYSIS OF MICROBES
A method of analysis using mass spectrometry and/or ion mobility spectrometry is disclosed. The method comprises: using a first device to generate smoke, aerosol or vapour from a target comprising or consisting of a microbial population; mass analysing and/or ion mobility analysing said smoke, aerosol or vapour, or ions derived therefrom, in order to obtain spectrometric data; and analysing said spectrometric data in order to analyse said microbial population.
Imaging data analyzer
When a user designates a region of interest for a plurality of groups targeted for difference analysis in a microscopic observation image of a sample, an m/z candidate search unit searches for candidates for m/z presumed to differ, based on collected mass spectral data. An intensity histogram creation unit processing unit creates and displays a graph showing a frequency distribution of peak intensities at measurement points included in the ROI of the groups for each of the m/z candidates. If this graph exhibits multimodality, the data distribution is not suitable for a statistical hypothesis test. An intensity range determination unit limits an intensity range in accordance with a user's instruction. Then, ROI correction unit corrects the ROI so as to include only measurement points with peak intensities within the limited intensity range. A test processing unit performs a statistical hypothesis test using the data corresponding to the corrected ROI.
SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICE
A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.
SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROMETRY METHOD AND MASS SPECTROMETRY DEVICE
A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.
SYSTEM AND METHOD FOR ANALYSING VOLATILE ORGANIC COMPOUNDS (VOC) BY LOW-TEMPERATURE PLASMA AND MASS SPECTROMETRY (LTP-MS)
A system and method for analyzing volatile organic compounds (VOCs) adsorbed on an adsorbent membrane, by low-temperature plasma and mass spectrometry (LTP-MS). The system includes a receptacle for receiving the adsorbent membrane, a low-temperature plasma ionizer configured to emit a plasma stream in a plasma emission direction, thereby ionizing the VOCs adsorbed by the membrane and forming a VOC-laden ionized gas, and a mass spectrometer for analyzing the ionized VOCs.
SYSTEM AND METHOD FOR ANALYSING VOLATILE ORGANIC COMPOUNDS (VOC) BY LOW-TEMPERATURE PLASMA AND MASS SPECTROMETRY (LTP-MS)
A system and method for analyzing volatile organic compounds (VOCs) adsorbed on an adsorbent membrane, by low-temperature plasma and mass spectrometry (LTP-MS). The system includes a receptacle for receiving the adsorbent membrane, a low-temperature plasma ionizer configured to emit a plasma stream in a plasma emission direction, thereby ionizing the VOCs adsorbed by the membrane and forming a VOC-laden ionized gas, and a mass spectrometer for analyzing the ionized VOCs.
Systems and methods for using variable mass selection window widths in tandem mass spectrometry
Systems and methods are used to analyze a sample using variable mass selection window widths. A tandem mass spectrometer is instructed to perform at least two fragmentation scans of a sample with different mass selection window widths using a processor. The tandem mass spectrometer includes a mass analyzer that allows variable mass selection window widths. The selection of the different mass selection window widths can be based on one or more properties of sample compounds. The properties may include a sample compound molecular weight distribution that is calculated from a molecular weight distribution of expected compounds or is determined from a list of molecular weights for one or more known compounds. The tandem mass spectrometer can also be instructed to perform an analysis of the sample before instructing the tandem mass spectrometer to perform the at least two fragmentation scans of the sample.
Simultaneous positive and negative ion accumulation in an ion trap for mass spectroscopy
A mass spectrometer ion reaction device, useful for performing ion-ion reactions (eg. ETD, PTR) is described. The device includes a plurality of non-linear rods, that form a pair of quadrupole rod sets. The device includes an axial passageway, that allows injections of ions of both polarities into the device, and a three dimensional trapping region. Anions and cations that are injected into the device are spatially separated into different trapping regions by a DC dipole electric field generated by a DC voltage source. The device also includes a plurality of lenses to confine, transmit or receive ions in/from the device.
Ion source for mass spectrometers
Ion sources for use in mass spectrometry (MS) systems are described. The ion sources each comprise an ion funnel and an ionization source configured to ionize neutral analyte molecules.
Ion source for mass spectrometers
Ion sources for use in mass spectrometry (MS) systems are described. The ion sources each comprise an ion funnel and an ionization source configured to ionize neutral analyte molecules.