A terahertz security inspection robot is provided, including: a housing including a main housing and a head housing rotatably connected to the main housing; a terahertz wave imaging mechanism including a mirror assembly arranged in the head housing and a detector array arranged in the main housing; and a rotating mechanism configured to cause the head housing and the mirror assembly located in the head housing to rotate with respect to the main housing, so that the mirror assembly of the terahertz wave imaging mechanism is oriented in different directions to respectively perform terahertz scanning and imaging on objects to be inspected in different inspection regions in a security inspection scene.

A terahertz security inspection robot is provided, including: a housing including a main housing and a head housing rotatably connected to the main housing; a terahertz wave imaging mechanism including a mirror assembly arranged in the head housing and a detector array arranged in the main housing; and a rotating mechanism configured to cause the head housing and the mirror assembly located in the head housing to rotate with respect to the main housing, so that the mirror assembly of the terahertz wave imaging mechanism is oriented in different directions to respectively perform terahertz scanning and imaging on objects to be inspected in different inspection regions in a security inspection scene.

Aspects of the subject disclosure may include, for example, different groups of network devices mounted on utility poles. The different groups of network devices can be arranged along different paths. A communication path for transmitting wireless signals can alternate between the different groups of network devices. Other embodiments are disclosed.

Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.

An over-the-air test system for testing a device under test over-the-air is described. The over-the-air test system includes a reflector with a focal point, one center antenna and antenna elements. The center antenna is orientated towards the focal point of the reflector. The antenna elements are symmetrically located around the center antenna. An operational frequency range of the center antenna is different to an operational frequency range of the antenna elements. Further, a method of performing an over-the-air measurement of a device under test by using an over-the-air test system is described.

An over-the-air test system for testing a device under test over-the-air is described. The over-the-air test system includes a reflector with a focal point, one center antenna and antenna elements. The center antenna is orientated towards the focal point of the reflector. The antenna elements are symmetrically located around the center antenna. An operational frequency range of the center antenna is different to an operational frequency range of the antenna elements. Further, a method of performing an over-the-air measurement of a device under test by using an over-the-air test system is described.

The present invention is an antenna provided with: a plurality of radiating parts formed on a base plate; a waveguide tube inside of which radio waves emitted from the radiating parts propagate; a lens having a plurality of curved surfaces having a substantially hyperbolic shape and disposed in an opening of the waveguide tube; and a protruding part formed in a tapered shape between the plurality of radiating parts. The tip of the protruding part is formed at a position lower than an opening surface.

The present invention is an antenna provided with: a plurality of radiating parts formed on a base plate; a waveguide tube inside of which radio waves emitted from the radiating parts propagate; a lens having a plurality of curved surfaces having a substantially hyperbolic shape and disposed in an opening of the waveguide tube; and a protruding part formed in a tapered shape between the plurality of radiating parts. The tip of the protruding part is formed at a position lower than an opening surface.

An electronic device in provided, including an antenna using a horn structure capable of using at least a portion of a metal member as a signal waveguide structure of the antenna. The device includes a housing, a display, a printed circuit board, and at least one wireless communication circuit, where a waveguide hole is provided to connect at least a portion of a through hole and an electronic component and is used as an operating channel of the electronic component together with the waveguide hole.