According to one embodiment, a semiconductor device includes a first circuit configured to generate a first voltage, a second circuit configured to transfer the generated first voltage to a first terminal, and a third circuit configured to generate a first signal that demonstrates a first level when a voltage at the first terminal is higher than or equal to a threshold voltage, and a second level when the voltage of the first terminal is lower than the threshold voltage, wherein the second circuit is configured to interrupt transfer of the first voltage, based on the first signal at the second level.

According to one embodiment, a semiconductor device includes a first circuit configured to generate a first voltage, a second circuit configured to transfer the generated first voltage to a first terminal, and a third circuit configured to generate a first signal that demonstrates a first level when a voltage at the first terminal is higher than or equal to a threshold voltage, and a second level when the voltage of the first terminal is lower than the threshold voltage, wherein the second circuit is configured to interrupt transfer of the first voltage, based on the first signal at the second level.

An output module includes a first connection terminal, a second connection terminal, a power supply terminal, a controller, an output device, and a first cutoff switch. The first connection terminal is connected to a high potential side terminal of an external load. The second connection terminal is connected to a low potential side terminal of the external load. The power supply terminal is provided with an external power supply from an external power source. The output device is configured to operate by receiving a power supply generated by or based on the external power supply and to output an analog voltage or an analog current of a value instructed by the controller toward the first connection terminal. The first cutoff switch is configured to be controlled by the controller to open and close a first path between the second connection terminal and a ground.

A disclosed under-voltage lockout (UVLO) circuit includes an automatic UVLO threshold configuration. The UVLO circuit may include an over-voltage protection circuit that receives power from a power source, a peak detector that detects a peak voltage output for the power source, a voltage threshold generator that sets a UVLO threshold based on the peak voltage output, and a comparator that compares an instantaneous voltage with the UVLO threshold and configures an operating mode of a device based on the comparison.

A disclosed under-voltage lockout (UVLO) circuit includes an automatic UVLO threshold configuration. The UVLO circuit may include an over-voltage protection circuit that receives power from a power source, a peak detector that detects a peak voltage output for the power source, a voltage threshold generator that sets a UVLO threshold based on the peak voltage output, and a comparator that compares an instantaneous voltage with the UVLO threshold and configures an operating mode of a device based on the comparison.

An under-voltage lockout (UVLO) circuit includes an automatic UVLO threshold configuration. The UVLO circuit may include an over-voltage protection circuit that receives power from a power source, a peak detector that detects a peak voltage output for the power source, a voltage threshold generator that sets a UVLO threshold based on the peak voltage output, and a comparator that compares an instantaneous voltage with the UVLO threshold and configures an operating mode of a device based on the comparison.

An under-voltage lockout (UVLO) circuit includes an automatic UVLO threshold configuration. The UVLO circuit may include an over-voltage protection circuit that receives power from a power source, a peak detector that detects a peak voltage output for the power source, a voltage threshold generator that sets a UVLO threshold based on the peak voltage output, and a comparator that compares an instantaneous voltage with the UVLO threshold and configures an operating mode of a device based on the comparison.

A method for analyzing power quality events in an electrical system includes processing electrical measurement data from or derived from energy-related signals captured by at least one of a plurality of metering devices in the electrical system to generate or update a plurality of dynamic tolerance curves. Each of the plurality of dynamic tolerance curves characterizes a response characteristic of the electrical system at a respective metering point of a plurality of metering points in the electrical system. Power quality data from the plurality of dynamic tolerance curves is selectively aggregated to analyze power quality events in the electrical system.

A method for analyzing power quality events in an electrical system includes processing electrical measurement data from or derived from energy-related signals captured by at least one of a plurality of metering devices in the electrical system to generate or update a plurality of dynamic tolerance curves. Each of the plurality of dynamic tolerance curves characterizes a response characteristic of the electrical system at a respective metering point of a plurality of metering points in the electrical system. Power quality data from the plurality of dynamic tolerance curves is selectively aggregated to analyze power quality events in the electrical system.

An apparatus, system, and method for are provided. A device includes a first tunable replica circuit configured to detect an undervoltage and overclocking event, a second tunable replica circuit configured to detect an overvoltage and underclocking event, and a countermeasures component configured to alter a circuit of the device responsive to detection of the undervoltage and overclocking event or the overvoltage and underclocking event.