Examples provide methods and apparatus for controlling a DC bias current in an RF amplifier. In one example where the RF amplifier is implemented on an amplifier die, a reference voltage is produced across a reference resistor implemented on the amplifier die, the DC bias current is measured, and a current controller, which is implemented on a controller die that is separate from the amplifier die, operates a feedback loop using the reference voltage to control a level of the DC bias current.

Embodiments relate to sensing a current provided by a power supply circuit. The current sensing circuit includes a sense transistor for sensing the current provided by a main transistor, a driver for controlling a bias provided to the sense transistor and the main transistor, and a sense resistor for converting the sensed current to a voltage value. Moreover, the current sensing circuit includes a controller that modifies at least one of: (a) a resistance of the main transistor by adjusting the bias voltage provided by the driver, (b) a gain ratio between a load current and a sensing current by adjusting a number of individual devices that are active in the sense transistor, and (c) a resistance of the sense resistor.

A power amplifier system having a power amplifier with a signal input and a signal output, bias circuitry coupled to the signal input, and a radio frequency (RF) peak detector having an input coupled to the signal output is disclosed. The RF peak detector is configured to generate a peak voltage signal. Temperature-compensated overvoltage protection circuitry coupled between an output of the RF peak detector and a control input of the bias circuitry is configured to respond to the peak voltage signal crossing over a predetermined peak voltage threshold and to provide an overvoltage protection control signal to cause the bias circuitry to adjust biasing for the power amplifier to reduce an overvoltage condition at the RF peak detector input.

Methods, apparatus, systems and articles of manufacture are disclosed for current sensing and current limiting. An example apparatus includes a first main transistor including a first main transistor gate terminal coupled between an output terminal and an intermediate node; a second main transistor including a second main transistor gate terminal coupled between the intermediate node and a ground terminal; a first amplifier including a first amplifier output coupled to the first main transistor gate terminal; a second amplifier including a second amplifier output coupled to the second main transistor gate terminal; and a third amplifier including a third amplifier inverting input coupled to the intermediate node, a third amplifier non-inverting input coupled to a sense transistor, and a third amplifier output coupled to a third gate terminal of a third transistor.

Embodiments relate to sensing a current provided by a power supply circuit. The current sensing circuit includes a sense transistor for sensing the current provided by a main transistor, a driver for controlling a bias provided to the sense transistor and the main transistor, and a sense resistor for converting the sensed current to a voltage value. Moreover, the current sensing circuit includes a controller that modifies at least one of: (a) a resistance of the main transistor by adjusting the bias voltage provided by the driver, (b) a gain ratio between a load current and a sensing current by adjusting a number of individual devices that are active in the sense transistor, and (c) a resistance of the sense resistor.

Thermally-sensitive structures and methods for sensing the temperature in a region of a FET during device operation are described. The region may be at or near a region of highest temperature achieved in the FET. Metal resistance thermometry (MRT) can be implemented with gate or source structures to evaluate the temperature of the FET.

A current sensing circuit includes a current sense amplifier and a correction circuit. The current sense amplifier has an offset voltage. The correction circuit is configured to evaluate the offset voltage of the current sense amplifier. The correction circuit is further configured to issue a correction signal to the current sense amplifier based upon the evaluated offset voltage. The correction signal is to adjust the offset voltage.

Devices and methods for generating a bias voltage for a transceiver operating in time division multiplexing operation, and corresponding transceivers are provided. In this case, the bias voltage is controlled in guard intervals between transmission and reception of signals by the transceiver.

Thermally-sensitive structures and methods for sensing the temperature in a region of a FET during device operation are described. The region may be at or near a region of highest temperature achieved in the FET. Metal resistance thermometry (MRT) can be implemented with gate or source structures to evaluate the temperature of the FET.

In an embodiment, a class-AB amplifier includes: an output stage that includes a pair of half-bridges configured to be coupled to a load; and a current sensing circuit coupled to a first half-bridge of the pair of half-bridges. The current sensing circuit includes a resistive element and is configured to sense a load current flowing through the load by: mirroring a current flowing through a first transistor of the first half-bridge to generate a mirrored current, flowing the mirrored current through the resistive element, and sensing the load current based on a voltage of the resistive element.