A programmable delay device that provides delays of more than 100 ns over a broad bandwidth is disclosed. The device includes an input stage that employs M sampling switched capacitor elements such that each sampling switched capacitor element samples at a rate of only 1/M of the fundamental sampling rate. The device includes a programmable delay stage with M programmable switched capacitor banks, each programmable switched capacitor bank having N delay switched capacitor storage elements. Thus, the programmable delay stage includes a total of M×N delay switched capacitor storage elements, thereby reducing the sampling rate by a factor of M×N. This reduced sampling rate permits much smaller sampling switches, resulting in reduced leakage current and enabling far longer programmable delay times. Lastly, the device includes an output reconstruction stage that reconstructs a delayed version of the input RF signal by combining signals from the programmable delay stage.

A programmable delay device that provides delays of more than 100 ns over a broad bandwidth is disclosed. The device includes an input stage that employs M sampling switched capacitor elements such that each sampling switched capacitor element samples at a rate of only 1/M of the fundamental sampling rate. The device includes a programmable delay stage with M programmable switched capacitor banks, each programmable switched capacitor bank having N delay switched capacitor storage elements. Thus, the programmable delay stage includes a total of M×N delay switched capacitor storage elements, thereby reducing the sampling rate by a factor of M×N. This reduced sampling rate permits much smaller sampling switches, resulting in reduced leakage current and enabling far longer programmable delay times. Lastly, the device includes an output reconstruction stage that reconstructs a delayed version of the input RF signal by combining signals from the programmable delay stage.

A comb signal generator that includes at least two signal sources that each provide a signal, wherein the signals provided by the at least two signal sources are shaped similarly. The com signal generator also has a combining circuit connected with the at least two signal sources, wherein the combining circuit is configured to combine the signals provided by the at least two signal sources, thereby generating a combined signal. Further, the com signal generator includes a clipping circuit connected with the combining circuit, wherein the clipping circuit is configured to receive and process the combined signal, thereby generating a comb signal. Further, a method of providing a phase and amplitude reference is described.

A comb signal generator that includes at least two signal sources that each provide a signal, wherein the signals provided by the at least two signal sources are shaped similarly. The com signal generator also has a combining circuit connected with the at least two signal sources, wherein the combining circuit is configured to combine the signals provided by the at least two signal sources, thereby generating a combined signal. Further, the com signal generator includes a clipping circuit connected with the combining circuit, wherein the clipping circuit is configured to receive and process the combined signal, thereby generating a comb signal. Further, a method of providing a phase and amplitude reference is described.

A jitter generator may include a duty cycle code generator that generates a duty cycle control signal and an input buffer that outputs a signal based on its duty cycle. The input buffer may be coupled to the duty cycle code generator and to a source of a clock signal. After receiving the clock signal, the input buffer outputs the clock signal having jitter relative to the clock signal received from the source. The jitter may be added at least in part by components of the input buffer offsetting different transitions of the clock signal according to the duty cycle. Jitter may be added when the duty cycle changes in response to changes in the duty cycle control signal, such as in response to number generator circuitry of the duty cycle code generator update its output number, in response to a mode change received from a controller, or the like.

A jitter generator may include a duty cycle code generator that generates a duty cycle control signal and an input buffer that outputs a signal based on its duty cycle. The input buffer may be coupled to the duty cycle code generator and to a source of a clock signal. After receiving the clock signal, the input buffer outputs the clock signal having jitter relative to the clock signal received from the source. The jitter may be added at least in part by components of the input buffer offsetting different transitions of the clock signal according to the duty cycle. Jitter may be added when the duty cycle changes in response to changes in the duty cycle control signal, such as in response to number generator circuitry of the duty cycle code generator update its output number, in response to a mode change received from a controller, or the like.

Time-to-digital converter (TDC) using multiple Vernier in a cascaded architecture reduces the timing jitter by decreasing the number of the ring oscillator cycles during the measurement processes. Time-to-digital converter (TDC) measurements using a third oscillator for the second Vernier process has significant advantages compared to changing the period of the second oscillator during the measurement cycle. The Vernier architecture described herein may operate with faster oscillators, reducing the number of intervals before converging and leading to a lower time conversion and a better timing jitter Adding multiple cascaded Vernier interpolation may further improve the TDC measurement resolution while having only a small increment of time required to resolve the time interval calculations.

Time-to-digital converter (TDC) using multiple Vernier in a cascaded architecture reduces the timing jitter by decreasing the number of the ring oscillator cycles during the measurement processes. Time-to-digital converter (TDC) measurements using a third oscillator for the second Vernier process has significant advantages compared to changing the period of the second oscillator during the measurement cycle. The Vernier architecture described herein may operate with faster oscillators, reducing the number of intervals before converging and leading to a lower time conversion and a better timing jitter Adding multiple cascaded Vernier interpolation may further improve the TDC measurement resolution while having only a small increment of time required to resolve the time interval calculations.

A spike generation circuit includes a first CMOS inverter connected between a first power supply and a second power supply, an output node of the first CMOS inverter being coupled to a first node that is an intermediate node coupled to an input terminal to which an input signal is input, a switch connected in series with the first CMOS inverter, between the first power supply and the second power supply, a first inverting circuit that outputs an inversion signal of a signal of the first node to a control terminal of the switch, and a delay circuit that delays the signal of the first node, outputs a delayed signal to an input node of the first CMOS inverter, and outputs an isolated output spike signal to an output terminal.

A spike generation circuit includes a first CMOS inverter connected between a first power supply and a second power supply, an output node of the first CMOS inverter being coupled to a first node that is an intermediate node coupled to an input terminal to which an input signal is input, a switch connected in series with the first CMOS inverter, between the first power supply and the second power supply, a first inverting circuit that outputs an inversion signal of a signal of the first node to a control terminal of the switch, and a delay circuit that delays the signal of the first node, outputs a delayed signal to an input node of the first CMOS inverter, and outputs an isolated output spike signal to an output terminal.