Delay circuit includes: first to fourth transistors; capacitor; constant current source; and resistor. The first transistor has a gate connected to an input terminal, a source connected to the first power supply terminal, and a drain. The second transistor has a gate connected to an input terminal and the gate of the first transistor, a drain connected to the drain of the first transistor and the second terminal of the capacitor, and a source. The third transistor has a gate connected to a node between the drain of the first transistor, the drain of the second transistor, and the second terminal of the capacitor, a source connected to the second power supply terminal, and a drain. The fourth transistor has a gate connected to the node and the gate of the third transistor, a drain connected to the drain of the third transistor and an output terminal, and a source.

Delay circuit includes: first to fourth transistors; capacitor; constant current source; and resistor. The first transistor has a gate connected to an input terminal, a source connected to the first power supply terminal, and a drain. The second transistor has a gate connected to an input terminal and the gate of the first transistor, a drain connected to the drain of the first transistor and the second terminal of the capacitor, and a source. The third transistor has a gate connected to a node between the drain of the first transistor, the drain of the second transistor, and the second terminal of the capacitor, a source connected to the second power supply terminal, and a drain. The fourth transistor has a gate connected to the node and the gate of the third transistor, a drain connected to the drain of the third transistor and an output terminal, and a source.

A voltage pulse generator comprising: circuitry controllable to generate a voltage pulse at an output of the circuitry; and an interruptor that monitors voltage at the output during a transition edge of the voltage pulse and interrupts a voltage change associated with the transition edge if the monitored voltage differs from a predetermined reference voltage by a predetermined amount.

A clock driver circuit for low powered clock driving may include: a multiple phase divider; a buffer supplying at least one of multiple phases to the multiple phase divider at a center frequency that is an integer multiple of an input frequency; and wherein the multiple phase divider and the buffer share a same current from a supply rail.

A clock driver circuit for low powered clock driving may include: a multiple phase divider; a buffer supplying at least one of multiple phases to the multiple phase divider at a center frequency that is an integer multiple of an input frequency; and wherein the multiple phase divider and the buffer share a same current from a supply rail.

There is disclosed herein programmable delay lines and control methods having glitch suppression. In particular, the programmable delay lines may include latches that are triggered based on a trigger event of an input signal (which is often an edge of the input signal). The programmable delay lines may include one or more latches coupled between capacitor and transistor subassemblies and the latches, where the latches cause a delay between the time the trigger event arrives at the capacitor and transistor subassemblies and the latches. The delay can prevent the latches from updating at the same time that the edge of the input signal arrives at the capacitor and transistor subassemblies, which can suppress glitches that can causes errors in operation.

Structural testing of a semiconductor integrated circuit (IC), including scanning test patterns or test conditions into internal circuits of the semiconductor IC, for example from a tester device. A timing margin may be measured during the structural test. The margin is measured based on a characteristic of a comparison between a test signal path of the semiconductor IC and a delayed signal path, the delayed signal path being a signal of the test signal path delayed by a variable delay time. An output of the margin measurement sensor may be scanned out, for instance to the tester device.

A logic circuit includes a timer and a plurality of switch assemblies in signal communication with the timer. Each switch assembly of the plurality of switch assemblies includes a switch including a true input gate, a false input gate, and an output gate, a first delay in signal communication with the output gate, and a second delay in signal communication between the output gate and the false input gate.

A novel delay circuit for quadrature clock generation with insensitivity to process, voltage, temperature (PVT) variations and equal rising/falling edges is disclosed. In one implementation, the delay circuit includes a first N-substage having a sinking current source, configured to receive an input signal and to generate a rising edge of an output signal of the delay circuit, wherein the output signal is a delayed version of the input signal. The delay circuit further includes a first P-substage having a sourcing current source, configured to receive the input signal and to generate a falling edge of the output signal, where the sinking current source and the sourcing current source are variable in response to respective ones of a plurality of bias voltages.

A novel delay circuit for quadrature clock generation with insensitivity to process, voltage, temperature (PVT) variations and equal rising/falling edges is disclosed. In one implementation, the delay circuit includes a first N-substage having a sinking current source, configured to receive an input signal and to generate a rising edge of an output signal of the delay circuit, wherein the output signal is a delayed version of the input signal. The delay circuit further includes a first P-substage having a sourcing current source, configured to receive the input signal and to generate a falling edge of the output signal, where the sinking current source and the sourcing current source are variable in response to respective ones of a plurality of bias voltages.