An over-temperature protection circuit is described. The circuit comprises an input for sensing a voltage across a transistor, a voltage-to-current converter configured to generate a current in dependence upon the voltage, an accumulator storing a value indicative of power dissipated by the transistor and which depends on the current; and a comparator configured to determine whether the value exceeds a threshold value and, in dependence on the value exceeding the threshold value, to generate a signal to cause the transistor to be switched off.

A control circuit for bypassing a diode current and a control method are provided; the control circuit includes a main module, a diode-current sensing module, a driving module; the diode-current sensing module is for sensing a current flowing through a main diode to generate a sensing current; the driving module is for generating a driving current proportional to the sensing current to drive a main switching transistor to be turned on; the main module, the diode-current sensing module, the driving module form a negative feedback loop to reduce the current flowing through the main diode to a preset value. The present disclosure solves problems in the related art, such as heat generation caused by large currents flowing through a body diode or flyback diode when the main switching transistor is in an off cycle, and the control circuit being out of control due to large currents introduced into a substrate.

A semiconductor element drive device is provided to solve a problem that because a case of a change in the temperature of the semiconductor element or a current flowing through the semiconductor element is not take into consideration, switching loss and noise cannot be reduced sufficiently. In accordance with input sensing information (temperature T, current I), a timing control unit 3 outputs a delay signal Q to control timing of driving a current increasing circuit 5 so that a reduction of switching loss of an IGBT 101 is maximized. When the IGBT 101 is in turn-on mode or turn-off mode, the current increasing circuit 5 outputs a drive signal in response to the delay signal Q delayed by a given time from output of the drive instruction signal P. In this way, the current increasing circuit 5 increases the current that causes the gate capacitor of the IGBT 101 to be charged/discharged in response to the delay signal Q, thereby increasing a switching speed to reduce switching loss.

A semiconductor element drive device is provided to solve a problem that because a case of a change in the temperature of the semiconductor element or a current flowing through the semiconductor element is not take into consideration, switching loss and noise cannot be reduced sufficiently. In accordance with input sensing information (temperature T, current I), a timing control unit 3 outputs a delay signal Q to control timing of driving a current increasing circuit 5 so that a reduction of switching loss of an IGBT 101 is maximized. When the IGBT 101 is in turn-on mode or turn-off mode, the current increasing circuit 5 outputs a drive signal in response to the delay signal Q delayed by a given time from output of the drive instruction signal P. In this way, the current increasing circuit 5 increases the current that causes the gate capacitor of the IGBT 101 to be charged/discharged in response to the delay signal Q, thereby increasing a switching speed to reduce switching loss.

A mirror clamp circuit includes a comparator having a first input terminal connectable to a first control terminal of a transistor having the first control terminal connected to the other terminal of a resistor of which one terminal is fed with an output voltage and a first terminal fed with a reference potential and a second input terminal fed with a reference voltage, a transistor switch having a second control terminal fed with a control terminal voltage based on a comparison signal output from the comparator and inserted between the first control terminal and the reference potential, an OR circuit fed with a signal based on the control terminal voltage and the output voltage, and a current feeder configured to change the amount of current fed to the comparator based on the output of the OR circuit.

A mirror clamp circuit includes a comparator having a first input terminal connectable to a first control terminal of a transistor having the first control terminal connected to the other terminal of a resistor of which one terminal is fed with an output voltage and a first terminal fed with a reference potential and a second input terminal fed with a reference voltage, a transistor switch having a second control terminal fed with a control terminal voltage based on a comparison signal output from the comparator and inserted between the first control terminal and the reference potential, an OR circuit fed with a signal based on the control terminal voltage and the output voltage, and a current feeder configured to change the amount of current fed to the comparator based on the output of the OR circuit.

A method for driving a power transistor includes comparing a measurement signal that is representative of a load current to a comparator threshold that corresponds to an overcurrent threshold; generating a first fault signal when the measurement signal exceeds the comparator threshold for a first time interval; generating a second fault signal when the measurement signal exceeds the comparator threshold for a second time interval that is greater than the first time interval; regulating a control voltage provided to the control terminal of the transistor to turn off the transistor in response to the second fault signal; and in response to the first fault signal, adjusting the control voltage to an adjusted voltage level in order to limit the load current to a reduced current level that is preconfigured to be greater than the overcurrent threshold. The adjusted voltage level is sufficient to maintain the power transistor in an on-state.

A method for driving a power transistor includes comparing a measurement signal that is representative of a load current to a comparator threshold that corresponds to an overcurrent threshold; generating a first fault signal when the measurement signal exceeds the comparator threshold for a first time interval; generating a second fault signal when the measurement signal exceeds the comparator threshold for a second time interval that is greater than the first time interval; regulating a control voltage provided to the control terminal of the transistor to turn off the transistor in response to the second fault signal; and in response to the first fault signal, adjusting the control voltage to an adjusted voltage level in order to limit the load current to a reduced current level that is preconfigured to be greater than the overcurrent threshold. The adjusted voltage level is sufficient to maintain the power transistor in an on-state.

A circuit includes a first gate control circuit including a first time delay element and first and second logic gates. The first time delay element and first and second logic gates receive a pulse width modulation (PWM) signal. The first logic gate includes a first output and second logic gate includes a second output. The circuit also includes a second gate control circuit that includes a second time delay element and third and fourth logic gates. The second time delay element includes an input coupled to the output of the first time delay element. The third logic gate includes a third output, and the fourth logic gate includes a fourth output. A first gate driver receives a first signal from one of the first or third outputs. A second gate driver receives a second signal from one of the second or fourth outputs.

A circuit includes a first gate control circuit including a first time delay element and first and second logic gates. The first time delay element and first and second logic gates receive a pulse width modulation (PWM) signal. The first logic gate includes a first output and second logic gate includes a second output. The circuit also includes a second gate control circuit that includes a second time delay element and third and fourth logic gates. The second time delay element includes an input coupled to the output of the first time delay element. The third logic gate includes a third output, and the fourth logic gate includes a fourth output. A first gate driver receives a first signal from one of the first or third outputs. A second gate driver receives a second signal from one of the second or fourth outputs.