A semiconductor device includes a plurality of functional blocks, each being configured to provide at least one predetermined function. The functional blocks at least include a first functional block and a second functional block. The first functional block and the second functional block are coupled in serial with a predetermined current flowing therethrough.

A retention circuit provided in a logic circuit enables power gating. The retention circuit includes a first terminal, a node, a capacitor, and first to third transistors. The first transistor controls electrical connection between the first terminal and an input terminal of the logic circuit. The second transistor controls electrical connection between an output terminal of the logic circuit and the node. The third transistor controls electrical connection between the node and the input terminal of the logic circuit. A gate of the first transistor is electrically connected to a gate of the second transistor. In a data retention period, the node becomes electrically floating. The voltage of the node is held by the capacitor.

Asynchronous circuit elements are described. Asynchronous circuit elements include a consensus element (c-element), completion tree, and validity tree. The c-element is implemented using adjustable threshold based multi-input capacitive circuitries. The completion tree comprises a plurality of c-elements organized in a tree formation. The validity tree comprises OR gates followed by c-elements. The multi-input capacitive circuitries include capacitive structures that may comprise linear dielectric, paraelectric dielectric, or ferroelectric dielectric. The capacitors can be planar or non-planar. The capacitors may be stacked vertically to reduce footprint of the various asynchronous circuitries.

Modern integrated circuits have an increasing need for various levels of both supply voltage (V) and operating frequency (f) available at fine spatial and temporal granularity. This work introduces a solution that provides a number and quality of locally distributed V/f domains through FOPAC. Opportunistically sharing design resources and features between multi-phase voltage regulators (MPVRs) and resonant rotary clocks (ReRoCs) enabling i) the scalability to hundreds of domains, ii) fast switching times for both voltage and frequency, leading to temporal flexibility, and iii) locally distributed designs, leading to spatial flexibility.

A semiconductor integrated circuit device having a control signal system for avoiding failure to check an indefinite signal propagation prevention circuit, for facilitating a check included in an automated tool, and for facilitating a power shutdown control inside a chip. In the semiconductor integrated circuit device, power shutdown priorities are provided by independent power domains (Area A to Area I). A method for preventing a power domain having a lower priority from being turned OFF when a circuit having a high priority is turned ON is also provided.

A skyrmion logic gate is provided. The logic gate comprises a first track configured for propagation of magnetic skyrmions and a second track configured for propagation of magnetic skyrmions. A junction links the first and second tracks. A continuous current flows through the logic gate, wherein skyrmions propagate due to the current.

Circuitry is provided that includes programmable fabric with fine-grain routing wires and a separate programmable coarse-grain routing network that provides enhanced bandwidth, low latency, and deterministic routing behavior. The programmable coarse-grain routing network may be implemented on an active interposer die. The programmable fabric may be implemented on a top die that is stacked on the active interposer die. A protocol-based network on chip (NoC) may be overlaid on the coarse-grain routing network. Although the NoC protocol is nondeterministic, the coarse-grain routing network includes an array of programmable switch boxes linked together using a predetermined number of routing channels to provide deterministic routing. Pipeline registers may be interposed within the routing channels at fixed locations to guarantee timing closure.

A retention circuit provided in a logic circuit enables power gating. The retention circuit includes a first terminal, a node, a capacitor, and first to third transistors. The first transistor controls electrical connection between the first terminal and an input terminal of the logic circuit. The second transistor controls electrical connection between an output terminal of the logic circuit and the node. The third transistor controls electrical connection between the node and the input terminal of the logic circuit. A gate of the first transistor is electrically connected to a gate of the second transistor. In a data retention period, the node becomes electrically floating. The voltage of the node is held by the capacitor.

A semiconductor building block is disclosed which includes a plurality of logic gates, each having at least one P-channel device, at least one N-channel device, and a current controller controlling current for each of the plurality of logic gate having a voltage source input (vdd), a ground input (vss), a first input current (ibias.sub.n) adapted to control current through the at least one N-channel device, a second input current (ibias.sub.p) adapted to control current through the at least one P-channel device, and an analog voltage input (delta) representing i) a predetermined ratio between respective on currents in the at least one P-channel device to ibias.sub.p, and ii) the predetermined ratio between respective on currents in the at least one N-channel device to ibias.sub.n.

An integrated circuit system includes: a storage element which stores in advance a plurality of pieces of circuit information and startup control circuit information used to configure a startup control logic circuit for selecting circuit information that has not failed in configuring a logic circuit; and an integrated circuit which, at the time of startup or when configuration of the logic circuit based on any of the plurality of pieces of circuit information has failed, configures the startup control logic circuit by reading the startup control circuit information from the storage element, causes the configured startup control logic circuit to select the circuit information that has not failed in configuring the logic circuit, reads the circuit information selected by the startup control logic circuit from the storage element, and configures the logic circuit according to the circuit information.