A device includes a failsafe circuit having a supply node configured to couple to a supply voltage source, a pad node configured to couple to an input/output (I/O) pin, and a bulk node configured to couple to a bulk of a transistor coupled to the I/O pin. The failsafe circuit is configured to assert a failsafe indicator signal when the supply node voltage falls below the pad node voltage by a threshold voltage, and couple the higher of the supply node voltage and the pad node voltage to the bulk node. The device also includes a pull-down stack coupled to the failsafe circuit and to a ground node, and a sub-circuit configured to turn off the pull-down stack in response to the supply node discharging to the threshold voltage below the pad node voltage.

A device includes a failsafe circuit having a supply node configured to couple to a supply voltage source, a pad node configured to couple to an input/output (I/O) pin, and a bulk node configured to couple to a bulk of a transistor coupled to the I/O pin. The failsafe circuit is configured to assert a failsafe indicator signal when the supply node voltage falls below the pad node voltage by a threshold voltage, and couple the higher of the supply node voltage and the pad node voltage to the bulk node. The device also includes a pull-down stack coupled to the failsafe circuit and to a ground node, and a sub-circuit configured to turn off the pull-down stack in response to the supply node discharging to the threshold voltage below the pad node voltage.

A device can include programmable logic circuitry, a processor system coupled to the programmable logic circuitry, and a network-on-chip. The network-on-chip is coupled to the programmable logic circuitry and the processor system. The network-on-chip is programmable to establish user specified data paths communicatively linking a circuit block implemented in the programmable logic circuitry and the processor system. The programmable logic circuitry, the network-on-chip, and the processor system are configured using a platform management controller.

A device includes a failsafe circuit having a supply node configured to couple to a supply voltage source, a pad node configured to couple to an input/output (I/O) pin, and a bulk node configured to couple to a bulk of a transistor coupled to the I/O pin. The failsafe circuit is configured to assert a failsafe indicator signal when the supply node voltage falls below the pad node voltage by a threshold voltage, and couple the higher of the supply node voltage and the pad node voltage to the bulk node. The device also includes a pull-down stack coupled to the failsafe circuit and to a ground node, and a sub-circuit configured to turn off the pull-down stack in response to the supply node discharging to the threshold voltage below the pad node voltage.

A device includes a failsafe circuit having a supply node configured to couple to a supply voltage source, a pad node configured to couple to an input/output (I/O) pin, and a bulk node configured to couple to a bulk of a transistor coupled to the I/O pin. The failsafe circuit is configured to assert a failsafe indicator signal when the supply node voltage falls below the pad node voltage by a threshold voltage, and couple the higher of the supply node voltage and the pad node voltage to the bulk node. The device also includes a pull-down stack coupled to the failsafe circuit and to a ground node, and a sub-circuit configured to turn off the pull-down stack in response to the supply node discharging to the threshold voltage below the pad node voltage.

A wide-voltage range, failsafe output interface module including a low-voltage, drain extended MOSFETs has been proposed to prevent the flow of reverse current during a failsafe operation while ensuring the MOSFETs are not subject to voltage over their voltage tolerance levels, improving reliability of an output interface module without resorting to more costly transistors with thicker films.

A wide-voltage range, failsafe output interface module including a low-voltage, drain extended MOSFETs has been proposed to prevent the flow of reverse current during a failsafe operation while ensuring the MOSFETs are not subject to voltage over their voltage tolerance levels, improving reliability of an output interface module without resorting to more costly transistors with thicker films.

A wide-voltage range, failsafe output interface module including a low-voltage, drain extended MOSFETs has been proposed to prevent the flow of reverse current during a failsafe operation while ensuring the MOSFETs are not subject to voltage over their voltage tolerance levels, improving reliability of an output interface module without resorting to more costly transistors with thicker films.

A wide-voltage range, failsafe output interface module including a low-voltage, drain extended MOSFETs has been proposed to prevent the flow of reverse current during a failsafe operation while ensuring the MOSFETs are not subject to voltage over their voltage tolerance levels, improving reliability of an output interface module without resorting to more costly transistors with thicker films.

An input output circuit and a self-biased circuit are provided. The self-biased circuit includes a tracking circuit, a biasing control circuit and first to fourth transistors. The tracking circuit receives a first power voltage, and generates a bias voltage according to variation of the first power voltage. The biasing control circuit generates a first control signal, a second control signal and a third control signal according to the first power voltage and a voltage on a pad. The first transistor is coupled to the pad and controlled by the first control signal. The second transistor is controlled by the second control signal to provide a bias voltage. The third transistor is coupled to the pad and controlled by the third control signal and generates a fourth control signal according to the voltage on the pad. The fourth transistor is controlled by the fourth control signal to generate the bias voltage.