In one implementation, a circuit includes: a comparator; a shift register chain coupled to the comparator; and one or more converters coupled to respective shift registers of the shift register chain, wherein the one or more converters are configured to convert a source of current from a first voltage to a second voltage, and wherein the circuit is configured to selectively transmit an output signal to the one or more converters. In one implementation, the circuit is configured to selectively control modulation for the one or more converters.

A control circuit includes a bias circuit. The bias circuit is configured to provide a bias current for a functional circuit. The bias circuit includes a first bias circuit and a second bias circuit. The first bias circuit is configured to provide a first bias current, and the second bias circuit is configured to provide a second bias current. Herein, the first bias current is smaller than the second bias current, the first bias circuit is configured to be in a normally open state after being powered on, and the second bias circuit is configured to receive a bias enabling signal and provide the second bias current based on the bias enabling signal.

A control circuit includes a bias circuit. The bias circuit is configured to provide a bias current for a functional circuit. The bias circuit includes a first bias circuit and a second bias circuit. The first bias circuit is configured to provide a first bias current, and the second bias circuit is configured to provide a second bias current. Herein, the first bias current is smaller than the second bias current, the first bias circuit is configured to be in a normally open state after being powered on, and the second bias circuit is configured to receive a bias enabling signal and provide the second bias current based on the bias enabling signal.

A serial bus re-driver circuit includes an edge detector circuit and a booster circuit. The edge detector circuit is configured to detect a transition of serial bus signal. The booster circuit is coupled to the edge detector circuit, and is configured to switch current to the serial bus signal. The booster circuit includes a leading edge boost pulse generation circuit and a trailing edge boost pulse generation circuit. The leading edge boost pulse generation circuit is configured to switch a first current pulse to the serial bus signal at the transition of the serial bus signal. The trailing edge boost pulse generation circuit is configured to switch a second current pulse to the serial bus signal. The second current pulse is shorter than the first current pulse.

A serial bus re-driver circuit includes an edge detector circuit and a booster circuit. The edge detector circuit is configured to detect a transition of serial bus signal. The booster circuit is coupled to the edge detector circuit, and is configured to switch current to the serial bus signal. The booster circuit includes a leading edge boost pulse generation circuit and a trailing edge boost pulse generation circuit. The leading edge boost pulse generation circuit is configured to switch a first current pulse to the serial bus signal at the transition of the serial bus signal. The trailing edge boost pulse generation circuit is configured to switch a second current pulse to the serial bus signal. The second current pulse is shorter than the first current pulse.

A command decoder circuit, a memory, and an electronic device are provided. The circuit includes a first decoder unit, configured to perform decoding for a first command signal based on a dynamic clock signal; a second decoder unit, configured to perform decoding for a second command signal based on the dynamic clock signal; and the clock gate, configured to generate the dynamic clock signal after a chip select signal of the first decoder unit indicates that decoding to be started for the first command signal and before the second decoder unit has performed decoding for the second command signal, and cut off the dynamic clock signal before the chip select signal of the first decoder unit indicates that the decoding to be started for the first command signal or after the second decoder unit has performed decoding for the second command signal.

A command decoder circuit, a memory, and an electronic device are provided. The circuit includes a first decoder unit, configured to perform decoding for a first command signal based on a dynamic clock signal; a second decoder unit, configured to perform decoding for a second command signal based on the dynamic clock signal; and the clock gate, configured to generate the dynamic clock signal after a chip select signal of the first decoder unit indicates that decoding to be started for the first command signal and before the second decoder unit has performed decoding for the second command signal, and cut off the dynamic clock signal before the chip select signal of the first decoder unit indicates that the decoding to be started for the first command signal or after the second decoder unit has performed decoding for the second command signal.

A driver circuit for low voltage differential signaling, LVDS, includes a phase alignment circuit including an input configured to receive an input signal, a first output configured to provide an internal signal as a function of the input signal, and a second output configured to provide an inverted internal signal, which is the inverted signal of the internal signal, and an output driver circuit coupled to the phase alignment circuit, the output driver circuit including a first input configured to receive the internal signal, a second input configured to receive the inverted internal signal, a first output configured to provide an output signal as a function of the internal signal and a second output configured to provide an inverted output signal which is the inverted signal of the output signal. Therein the phase alignment circuit is configured to provide the inverted internal signal with its phase being aligned to a phase of the internal signal.

A flexible RAM loader including a shift register that includes a first data section coupled with a serial data input, and a second data section selectively coupled with a first parallel data input. The shift register is configured to load data serially from the serial data input to the first data section and the second data section when the second data section is uncoupled from the first parallel data input, and, when the second data section is coupled with the first parallel data input, configured to load data in parallel from the serial data input into the first data section and from the first parallel data input into the second data section. The flexible RAM loader also including a test register comprising a selection bit to couple the second data section with the first parallel data input.

A flexible RAM loader including a shift register that includes a first data section coupled with a serial data input, and a second data section selectively coupled with a first parallel data input. The shift register is configured to load data serially from the serial data input to the first data section and the second data section when the second data section is uncoupled from the first parallel data input, and, when the second data section is coupled with the first parallel data input, configured to load data in parallel from the serial data input into the first data section and from the first parallel data input into the second data section. The flexible RAM loader also including a test register comprising a selection bit to couple the second data section with the first parallel data input.