Apparatuses for performing combination logic operations with an combination logic circuit are disclosed. According to one embodiment, the apparatus comprises a first-in-first-out stage comprising an combination logic circuit, a input ring counter circuit coupled to the first-in-first-out stage and configured to selectively provide a push signal to the first-in-first-out stage, and a output ring counter circuit coupled to the first-in-first-out stage and configured to selectively provide a pop signal to the first-in-first-out stage, wherein the first-in-first-out stage is configured to perform calculations on input data with the combination logic circuit to generate output data responsive to receiving the push signal and to provide the output data based on the calculations responsive to receiving the pop signal.

Apparatuses for performing combination logic operations with an combination logic circuit are disclosed. According to one embodiment, the apparatus comprises a first-in-first-out stage comprising an combination logic circuit, a input ring counter circuit coupled to the first-in-first-out stage and configured to selectively provide a push signal to the first-in-first-out stage, and a output ring counter circuit coupled to the first-in-first-out stage and configured to selectively provide a pop signal to the first-in-first-out stage, wherein the first-in-first-out stage is configured to perform calculations on input data with the combination logic circuit to generate output data responsive to receiving the push signal and to provide the output data based on the calculations responsive to receiving the pop signal.

A semiconductor device detects an edge of input data input into a data retention circuit to which a clock signal is supplied, resets a first count value obtained by counting an edge detection frequency with a clock signal, resets a second count value obtained by counting the edge detection frequency with an inverted clock signal, and thereby detects an abnormality of the clock signal in accordance with a situation that either of the first count value and the second count value has reached a value indicative of an overflow state.

A semiconductor device detects an edge of input data input into a data retention circuit to which a clock signal is supplied, resets a first count value obtained by counting an edge detection frequency with a clock signal, resets a second count value obtained by counting the edge detection frequency with an inverted clock signal, and thereby detects an abnormality of the clock signal in accordance with a situation that either of the first count value and the second count value has reached a value indicative of an overflow state.

Technology is described for a relative timed clock gated cell. In one example, the relative timed clock gated cell includes a trigger latch and a data clock latch. The trigger latch includes a clock input coupled to a trigger line for transmitting a trigger signal. The trigger latch is configured to generate a data clock signal on an output. The trigger signal is based on a clock signal. The data clock latch includes a clock input coupled to the output of the trigger latch that latches a data input of the data clock latch based on the data clock signal. Various other computing circuitries and methods are also disclosed.

A semiconductor device detects an edge of input data input into a data retention circuit to which a clock signal is supplied, resets a first count value obtained by counting an edge detection frequency with a clock signal, resets a second count value obtained by counting the edge detection frequency with an inverted clock signal, and thereby detects an abnormality of the clock signal in accordance with a situation that either of the first count value and the second count value has reached a value indicative of an overflow state.

A semiconductor device detects an edge of input data input into a data retention circuit to which a clock signal is supplied, resets a first count value obtained by counting an edge detection frequency with a clock signal, resets a second count value obtained by counting the edge detection frequency with an inverted clock signal, and thereby detects an abnormality of the clock signal in accordance with a situation that either of the first count value and the second count value has reached a value indicative of an overflow state.

The present invention provides a fractional frequency divider, wherein the fractional frequency divider includes a plurality of registers, a counter, a control signal generator and a clock gating circuit. Regarding the plurality of registers, at least a portion of the registers are set to have values The counter is configured to sequentially generate a plurality of counter values, wherein the plurality of counter values correspond to the at least a portion of the registers, respectively, and the plurality of counter values are generated repeatedly The control signal generator is configured to generate a control signal based on the received counter value and the value of the corresponding register. The clock gating circuit is configured to refer to the control signal to mask or not mask an input clock signal to generate an output clock signal.

A power switch control circuit is provided for power management in one-wire application. The circuit comprises a controllable switch coupled between an input node and an internal power node. A comparator is utilized for power loss sensing to close the switch when necessary to minimize the power loss while the input is low or floating. A watchdog circuit is incorporated within the control circuit to pull down the input node periodically to detect small leakage current when the input node is floating.

A power switch control circuit is provided for power management in one-wire application. The circuit comprises a controllable switch coupled between an input node and an internal power node. A comparator is utilized for power loss sensing to close the switch when necessary to minimize the power loss while the input is low or floating. A watchdog circuit is incorporated within the control circuit to pull down the input node periodically to detect small leakage current when the input node is floating.