Systems and methods are provided for blended analog-to-digital conversion for digital test and measurement devices. A first-frequency-domain circuit path is configured to generate a first processed digital signal having high fidelity to an analog signal over a first frequency domain. A second-frequency-domain circuit path is configured to generate a second processed digital signal having high fidelity to the analog signal over a second frequency domain. A blended digital signal is generated using the first processed digital signal and the second processed digital signal. The blended digital signal can have high fidelity to the analog signal over multiple frequency domains.

Various embodiments relate to analog-to-digital converter (ADC) controllers. An ADC controller may include a number of contexts configured for coupling to an ADC, wherein each context having at least one register for storing at least one configurable parameter. The ADC controller may also include a sequencer operatively coupled to the number of contexts and configured to perform a programmed conversion sequence based on one or more configurable parameters of one or more contexts of the number of contexts. Methods of performing an analog-to-digital (A/D) conversion sequence, and methods of configuring a number of contexts for an analog-to-digital converter (ADC) controller, are also disclosed.

Multi-Nyquist differentiator circuits and a radio frequency sampling receiver that applies a multi-Nyquist differentiator circuit. A multi-Nyquist differentiator includes a fixed coefficient filter, a scaling circuit, and a summation circuit. The fixed coefficient filter is configured to filter digital samples generated by an ADC. The scaling circuit is coupled to an output of the fixed coefficient filter, and is configured to scale output of the fixed coefficient filter based on a selected Nyquist band. The summation circuit is coupled to the scaling circuit, and is configured to generate a derivative of the digital samples based on output of the scaling circuit.

Various embodiments relate to analog-to-digital converter (ADC) controllers. An ADC controller may include a number of input channels and an ADC selectively coupled to each input channel of the number of input channels. The ADC controller may further include a number of contexts operatively coupled to the ADC, wherein each context of the number of contexts is associated with an input channel of the number of input channels. Further, each context may include at least one register for storing at least one configurable parameter. The ADC controller may also include a sequencer operatively coupled to the number of context and configured to perform a programmed conversion sequence on one or more input channels of the number of input channels based on one or more configurable parameters of one or more contexts of the number of contexts.

A decision-feedback equalizer (DFE) samples an analog input signal against M references during the same symbol time to produce M speculative samples. Select logic in the DFE, then decodes N bits resolved previously for previous symbol times to select one of the M speculative samples as the present resolved bit. The present resolved bit is then stored as the most recent previously resolved bit in preparation for the next symbol time. The select logic can be can be programmable to accommodate process, environmental, and systematic variations.

Digital-to-analog converters (DACs) having a multiple-gate (multi-gate) transistor-like structure are disclosed herein. The DAC structures have a similar structure to a transistor (e.g., a MOSFET) and include source and drain regions. However, instead of employing only one gate between the source and drain regions, multiple distinct gates are employed. Each distinct gate can represent a bit for the DAC and can include different gate lengths to enable providing different current values, and thus, unique outputs. Further, N number of inputs can be applied to N number of gates employed by the DAC. The DAC structure may be configured such that the longest gate controls the LSB of the DAC and the shortest gate controls the MSB, or vice versa. In some cases, the multi-gate DAC employs high-injection velocity materials that enable compact design and routing, such as InGaAs, InP, SiGe, and Ge, to provide some examples.

A digital-to-analog converter (DAC) linearization system can include a DAC configured to generate an analog output signal based on a digital input signal, a detector configured to detect noise on a supply voltage and generate a noise detection signal based on the detected noise, and a compensator that is configured to generate a compensated analog signal based on the analog output signal and the noise detection signal.

Disclosed herein are multi-mode methods and devices for sample generation. An exemplary device for generating an output sample includes an analog-to-digital converter (ADC) for sampling a plurality of input analog signals and producing an ADC output sample. The ADC may include a ADC digital modulator including timing-critical components. A plurality of digital blocks may be coupled to the ADC digital modulator. The exemplary device may include a baseband processor for controlling a plurality of clock inputs. The plurality of clock inputs may drive the ADC digital modulator and the plurality of digital blocks. The baseband processor may be configured to operate in a plurality of modes including a first mode and a second mode. The first mode may include a first mode standby state and a first mode initial operating state. The second mode may include a second mode initial operating state and a second mode standby state.

A method in a transmitter circuit of generating a signal comprising a first sequence of OFDM symbols, which are to be transmitted within a frequency sub band of a second sequence of OFDM symbols is disclosed. A first cyclic prefix (CP) of the second sequence of OFDM symbols has a first duration, and a second CP of the second sequence of OFDM symbols has a second duration. In order to generate both the first and the second cyclic prefix with an integer number of equidistant samples, a first sampling rate is required. The method comprises generating the signal comprising the first sequence of OFDM symbols at a second sampling rate, lower than the first sampling rate, and adjusting a sampling phase during CPs.

A digital converter and a controlling method are disclosed. The digital converter includes a sensing oscillator including a plurality of tri-state buffers configured to generate a sensing clock period signal corresponding to a change value of at least one of a resistive sensor and a capacitive sensor, a reference oscillator configured to generate a predetermined fixed clock period signal, a processor configured to change a connection state of the plurality of tri-state buffers, a frequency divider configured to scale up the generated sensing clock period signal based on a predetermined value; and a counter configured to count the scaled up sensing clock period signal based on the generated fixed clock cycle signal and output a counted digital value.