H03M1/06

A/D conversion circuit
11563438 · 2023-01-24 · ·

An A/D conversion circuit includes a comparison-reference-signal generator section configured to generate a comparison reference signal synchronized with a sampling clock signal, a comparator configured to compare a voltage of an input signal and a voltage of the comparison reference signal to thereby generate a trigger signal, a time to digital converter configured to calculate a first time digital value, and a digital-signal generator section configured to generate, based on the first time digital value and a second time digital value, a digital signal corresponding to the voltage of the input signal. The first time to digital converter includes a state transition section configured to start transition of a state based on the trigger signal and output state information, and a weight operation section configured to, in synchronization with the reference clock signal, perform, on a value based on the state information, weighting corresponding to time elapsing and perform a predetermined arithmetic operation to thereby calculate the first time digital value corresponding to the number of transition times of the state.

Selective time-interleaved analog-to-digital converter for out-of-band blocker mitigation

Technologies directed to a receiver circuit with selective time-interleaved analog-to-digital converters (ADCs) are described. The receiver circuit includes a first ADC, a second ADC, and a digital processing circuit coupled to the first ADC and second ADC that operates in a first mode or a second mode. In the first mode the first ADC receives a first signal and generates first samples at a first sampling frequency. The digital processing circuit processes the first samples. In the second mode, the first ADC and the second ADC both receive a second signal and collectively generate second samples at a second sampling frequency that is greater than the first sampling frequency. The digital processing circuit processes the second samples.

Method of operating analog-to-digital converter and analog-to-digital converter performing the same

In a method of operating an analog-to-digital converter, a gain error and an offset error that are associated with a digital code generated from the analog-to-digital converter are obtained by performing a first analog-to-digital conversion on a first input analog signal. The gain error and the offset error are stored. A calibration digital code is generated by performing a second analog-to-digital conversion on a second input analog signal based on the gain error and the offset error.

HYBRID ADC CIRCUIT AND METHOD
20230017344 · 2023-01-19 ·

There is described a hybrid ADC device for converting an analog input signal (Vin) into a digital output signal (Vout), the device comprising a first ADC circuit configured to receive the analog input signal (Vin) and convert it into a first digital signal (Y0); a DAC circuit configured to receive the first digital signal and convert it into a first analog signal; a delay circuit configured to delay the analog input signal; a first combiner configured to generate an analog residual signal by subtracting the first analog signal from the delayed analog input signal; a second ADC circuit configured to receive the residual analog signal and convert it into a second digital signal (Y1); a filter circuit configured to receive the first digital signal and output a filtered first digital signal (Y0′), the filter circuit having a transfer function corresponding to a combined transfer function of the DAC circuit and the second ADC circuit; and a second combiner configured to generate the digital output signal (Vout) by adding the second digital signal and the filtered first digital signal, wherein the first ADC circuit comprises an anti-aliasing filter. Furthermore, a corresponding method and an automobile radar system are described.

METHOD AND SYSTEM FOR DIGITAL EQUALIZATION OF A LINEAR OR NON-LINEAR SYSTEM
20230015514 · 2023-01-19 ·

A system and method for equalization of a linear or non-linear system. The system includes an adder configured to add an analog reference signal and an input signal, a processing system configured to process a sum of the analog reference signal and the input signal, a non-linear equalizer (NLEQ) configured to process an output of the processing system to remove a distortion incurred by the processing system, a calibration circuitry configured to generate a reconstructed reference signal in digital domain based on measurement of the analog reference signal, and generate coefficients for the NLEQ based on the reconstructed reference signal and the output of the processing system, and a subtractor configured to subtract the reconstructed reference signal from an output of the NLEQ. The analog reference signal may be a sinusoid including single or multiple tones of sinusoids. The non-linear system may be an analog-to-digital converter (ADC).

Single-ended direct interface DAC feedback and current sink photo-diode sensor
20230223951 · 2023-07-13 · ·

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

ANALOG-TO-DIGITAL CONVERTER DEVICE AND METHOD CAPABLE OF ADJUSTING BIT CONVERSION CYCLE OF ANALOG-TO-DIGITAL CONVERSION OPERATION
20230223945 · 2023-07-13 · ·

An ADC device includes a DAC circuit, a comparator circuit, a SAR decision circuit, an oscillator circuit having a delay unit, and a processing circuit. The oscillator circuit is used for generating the clock signal according to a reset signal and a delay of the delay unit. The processing circuit is used for sequentially generating multiple bit conversion signals associated with multiple different bits of the decision signal, for generating at least one guard signal which follows the multiple bit conversion signals, and then for comparing the at least one guard signal with the reset signal to adjust the delay generated by the delay unit of the oscillator circuit.

ANALOG-TO-DIGITAL CONVERTER TO IDENTIFY PROPERTIES OF TRANSMITTED SIGNALS

A transmitter including a digital-to-analog converter (DAC) to generate an analog output corresponding to a transmitted signal. The transmitter further includes an analog-to-digital converter (ADC) coupled to the DAC. The ADC measures the analog output of the DAC to identify a set of digital samples. The ADC identifies, from the set of digital samples, a set of valid samples, wherein each valid sample has a voltage within a voltage range. The ADC extracts one or more signal properties from the set of valid samples.

Analog to digital converter with current mode stage

An analog-to-digital converter (ADC) includes a first ADC stage with a first sub-ADC stage configured to sample the analog input voltage in response to a first phase clock signal and output a first digital value corresponding to an analog input voltage in response to a second phase clock signal. A current mode DAC stage is configured to convert the analog input voltage and the first digital value to respective first and second current signals, determine a residue current signal representing a difference between the first and the second current signal, and convert the residue current signal to an analog residual voltage signal. A second ADC stage is coupled to the first ADC stage to receive the analog residual voltage signal, and convert the analog residue voltage signal to a second digital value. An alignment and digital error correction stage is configured to combine the first and the second digital values.

Sensor arrangement and method for sensor measurement

A sensor arrangement includes a switchable voltage source having a source output for alternatively providing a first and a second excitation voltage, an integrator having an integrator input and an integrator output, a sensor resistor having a first terminal coupled to the source output, a reference resistor having a first terminal coupled to a second terminal of the sensor resistor and a second terminal coupled to the integrator input, and a comparator having a first comparator input coupled to the integrator output.