An auto calibration method used in switching converters with constant on-time control. The auto calibration method includes: generating a periodical clock signal with a predetermined duty cycle; providing a first voltage and a second voltage to an on-time control circuit to generate an on-time control signal based on the first and second voltage; providing the clock signal and on-time control signal to a logic circuit to generate a switch control signal based on the clock signal and on-time control signal; comparing the duty cycle of the switch control signal with the duty cycle of the clock signal to adjust a calibration code signal; and adjusting circuit parameters of the on-time control circuit in accordance with the calibration code signal.

An ADC system comprises a coarse ADC for determining a coarse word representing an input signal, and an incremental ADC for determining a fine word based on a combination of the input signal and a feedback signal. A first combiner generates a first intermediate output word by joining the coarse word and the fine word. A feedback path generates the feedback signal based on the first intermediate output word. A decimation filter generates a second intermediate output word by filtering the first intermediate output word. A correction block determines a correction word based on the coarse word, on the first and the second predetermined number of bits and conversion parameters of the incremental ADC. A second combiner generates an output word by addition of the second intermediate output word and the correction word.

In accordance with the present invention a system and method for calibration of the current steering DAC is elaborated which helps to reduce design complexity and reduce silicon area required in the design. Present invention is utilising a clocked comparator and plurality of switch transistors 405,305 and AUX DAC in conjunction with digital estimator and digital compensator blocks to estimate the errors in the current sources 406 and compensate the errors using same AUX DAC during normal operation mode.

Systems and methods for monitoring a number of operating conditions of a programmable device are disclosed. In some implementations, the system may include a root monitor including circuitry configured to generate a reference voltage, a plurality of sensors and satellite monitors distributed across the programmable device, and a interconnect system coupled to the root monitor and to each of the plurality of satellite monitors. Each of the satellite monitors may be in a vicinity of and coupled to a corresponding one of the plurality of sensors via a local interconnect. The interconnect system may include one or more analog channels configured to distribute the reference voltage to each of the plurality of satellite monitors, and may include one or more digital channels configured to selectively route digital data from each of the plurality of satellite monitors to the root monitor as data packets.

Aspects of the disclosure are directed to compensating for errors in in an analog-to-digital converter circuit (ADC). As may be implemented in accordance with one or more embodiments, an apparatus and/or method involves an ADC that converts an analog signal into a digital signal using an output from a digital-to-analog converter circuit (DAC). A compensation circuit generates a compensation output by, for respective signal portions provided to the DAC, generating a feedback signal based on an incompatibility between the conversion of the signal portions into an analog signal and the value of the signal portions provided to the DAC. A compensation output is generated based on the signal input to the DAC with a gain applied thereto, based on the feedback signal. Hereby, the digital inputs provided to the DACs are non-randomized.

An integrated circuit that includes a generating circuit is described. During operation, the generating circuit may provide an edge clock having a target phase within a clock period of an input clock, where the generating circuit does not include a delay-locked loop (DLL). For example, the generating circuit may include a gated ring oscillator that provides a reference clock having a first fundamental frequency that is larger than a second fundamental frequency of the input clock. Note that the gated ring oscillator may be programmable to adjust the first fundamental frequency within a predefined range of values. Moreover, the generating circuit may include a control circuit that determines a reference count of a number of edges of the reference clock within a reference period of the reference clock.

In a solid-state imaging element equipped with per-column ADCs, noise is reduced. A test signal source generates a test signal of a predetermined level. An analog-to-digital converter increases/decreases an analog signal according to an analog gain selected from among a plurality of analog gains, and converts the increased/decreased analog signal to a digital signal. An input switching section inputs, as the analog signal, either a test signal or a pixel signal to the analog-to-digital converter. A correction value calculation section obtains, on the basis of the test signal and the digital signal, a correction value for correcting an error in the selected analog gain, and outputs the correction value. A correction section corrects the digital signal according to the outputted correction value.

A device includes a first compensation circuit configured to adjust an analog front end (AFE) output to generate a first adjusted AFE output, a first data slicer configured to output a first voltage based on the first adjusted AFE output. The first compensation circuit includes a first path between a voltage source and a ground, including a first transistor, a first adjustable current source, a first input voltage node configured to receive the AFE output, and a first output voltage node coupled to the first data slicer, a second path between the voltage source and the ground, including a second transistor, a second adjustable current source, a second input voltage node configured to receive the AFE output, and a second output voltage node coupled to the second data slicer, and a configurable resistance resistor and a configurable capacitance capacitor coupled in parallel across the first path and the second path.

A system includes a digital-to-analog converter comprising a plurality of unit elements, and a dynamic element matching encoder coupled to the digital-to-analog converter. The dynamic element matching encoder includes a circuit configured to determine a number of unit elements of a digital-to-analog converter to be transitioned (N.sub.tm), determine a first number of unit elements to be turned on, and determine a second number of unit elements to be turned off. The circuit may further generate a first signal identifying individual unit elements of one or more unit elements of the digital-to-analog converter in the off state to be turned on, and a second signal identifying the individual unit elements of one or more unit elements of the digital-to-analog converter in the on state to be turned off.

A system includes a digital-to-analog converter comprising a plurality of unit elements, and a dynamic element matching encoder coupled to the digital-to-analog converter. The dynamic element matching encoder includes a circuit configured to determine a number of unit elements of a digital-to-analog converter to be transitioned (N.sub.tm), determine a first number of unit elements to be turned on, and determine a second number of unit elements to be turned off. The circuit may further generate a first signal identifying individual unit elements of one or more unit elements of the digital-to-analog converter in the off state to be turned on, and a second signal identifying the individual unit elements of one or more unit elements of the digital-to-analog converter in the on state to be turned off.