An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.

Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into a plurality of first digital codes, in which a first converter circuitry in the converter circuitries is configured to perform a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate control signals, and determines whether to set the second digital code to be a second corresponding digital code in predetermined digital codes according to the control signals.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into first digital codes. A first converter circuitry in the converter circuitries performs a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate first and second valid signals, and determines whether to set the second digital code to be a first predetermined digital code or a second predetermined digital code according to the first and the second valid signals. The second valid signal is a delay signal of the first valid signal.

A pipelined analog-to-digital converter and an output calibration method for the same. The pipelined analog-to-digital converter introduces an error calibration mechanism on the basis of traditional pipelined analog-to-digital converters through a control module, an equivalent gain error extraction module, an error storage module and a coding reconstruction module to compensate for gain errors and setup errors caused by operational amplifiers in a pipelined conversion module, so that the analog-to-digital conversion accuracy is improved, and requirements for the gain and bandwidth of the operational amplifier are relaxed, which can effectively reduce the power consumption of the analog-to-digital converter and the complexity of the corresponding analog circuit; a curve fitting method is adopted to obtain an ideal output sequence and then calculate errors; meanwhile, extraction and calibration of equivalent gain errors are all done in digital ways, and therefore accuracy thereof is high.

An estimate of unit current element mismatch error in a digital to analog converter circuit is obtained through a correlation process. Unit current elements of the digital to analog converter circuit are actuated by bits of a thermometer coded signal generated in response to a quantization output signal. A correlation circuit generates the estimates of the unit current element mismatch error from a correlation of a first signal derived from the thermometer coded signal and a second signal derived from the quantization output signal.

A physical quantity detection circuit includes: a detection signal generation circuit generating a detection signal, based on an output signal from a physical quantity detection element; an analog/digital converter circuit converting the detection signal into a first digital signal and converting a test signal into a second digital signal; a test signal generation circuit generating the test signal; and a malfunction diagnosis circuit diagnosing a malfunction of the analog/digital converter circuit, based on the second digital signal. A full-scale voltage of the analog/digital converter circuit is selected from among a plurality of voltages having different magnitudes, according to a power supply voltage. The test signal includes an upper limit value test signal, a lower limit value test signal, and a first intermediate value test signal. The test signal generation circuit performs resistive voltage division of the full-scale voltage and thus generates the first intermediate value test signal.

An example apparatus includes a circuit and calibration circuitry. The circuit has complementary input ports to receive input signals including a monotonously rising and/or falling wave reference signal and a voltage-test signal to test at least one direct current (DC) voltage associated with the circuit by comparing the input signals using a first polarity and second polarity associated with the circuit to produce a first output signal and a second output signal. During operation, the circuit manifests an input voltage offset and a signal delay with each comparison of the input signals. The calibration circuitry processes the first and second output signals and, in response, calibrates or sets an adjustment for at least one signal path associated with the circuit in order to account for the input offset voltage and signal delay during normal operation of the circuit.

A sample-and-hold amplification circuit can include a sampling circuit configured to sample first and second input signals in response to first and second control signals to generate first and second sampled signals, an amplification circuit configured to amplify a voltage difference between the first and second sampled signals to generate first and second output signals, and an offset compensation circuit configured to form a first path between input and output terminals of the amplification circuit in response to the first control signal to store an offset of the input terminal and form a second path between the input and output terminals in response to the second control signal to reflect the offset to the output terminal.