A sampling switch circuit, comprising an input node, connected to receive an input voltage signal, a sampling transistor comprising a gate terminal, a source terminal and a drain terminal, the source terminal connected to the input node, a hold-control node connected to receive a hold-control voltage signal, an output node connected to the drain terminal of the sampling transistor, a buffer circuit having a buffer input connected to the input node and a buffer output connected to a track-control node, the buffer circuit configured to provide a track-control voltage signal at the track-control node dependent on the input voltage signal and switching circuitry configured to connect the gate terminal of the sampling transistor to the track-control node or to the hold-control node in dependence upon a clock signal.

A sample holding circuit includes a signal input terminal, a first sampling unit, a second sampling unit, and a holding unit. The signal input terminal receives a first reference voltage or a second reference voltage, the first sampling unit samples the first reference voltage when a first clock signal is triggered to obtain a first sampling voltage, the second sampling unit samples the second reference voltage when a second clock signal is triggered to obtain a second sampling voltage. The holding unit receives the first sampling voltage and the second sampling voltage when a third clock signal is triggered. The sample holding circuit effectively simplifies circuit structure and reduces the use of amplifiers, also improving the signal to noise ratio.

An analog-to-digital converter of successive approximation register (SAR) type includes a comparator, a SAR logic circuit, and a capacitor digital-to-analog converter. The capacitor digital-to-analog converter includes a plurality of drivers. Each driver includes a capacitor and a split inverter. A first capacitor node of the capacitor is connected to one of comparison input terminals. The split inverter includes a pull-up unit connected to a first reference voltage and a pull-down unit connected to a second reference voltage. The split inverter drives a second capacitor node of the capacitor by selectively turning on one of the pull-up unit and the pull-down unit. A first one of the pull-up unit and the pull-down unit includes a full transistor, and a second one of the pull-up unit and the pull-down unit includes a first split transistor and a second split transistor. A short current is reduced using the split inverter.

An analog-to-digital converting device configured to convert an analog signal into a digital signal, including a meta-stability detection unit configured to output a meta-stability signal based on a comparison result, wherein the comparison result is determined by comparing a comparison voltage of each bit of the digital signal with the analog signal; a counter configured to count a number of times that the comparison voltage of each bit of the digital signal is compared with the analog signal; and a control logic configured to detect a bit at which meta-stability has occurred from among bits of the digital signal based on the meta-stability signal and the counted number.

A successive-approximation analog-to-digital converter includes a sampling circuit for sampling an analog input signal to acquire a sampled voltage, and a regenerative comparator for comparing the sampled voltage with a succession of reference voltages to generate, for each reference voltage, a decision bit indicating the comparison result. The converter also includes a digital-to-analog converter which is adapted to generate the succession of reference voltages, in dependence on successive comparison results in the comparator, to progressively approximate the sampled voltage. The regenerative comparator comprises an integration circuit for generating output signals defining the decision bits, and a plurality of regeneration circuits for receiving these output signals. The regeneration circuits are operable, in response to respective control signals, to store respective decision bits defined by successive output signals from the integration circuit.

An analog-to-digital converter, including a sample/hold circuit; a reference voltage driver; a digital-to-analog converter; a comparator; and a logic circuit, wherein the reference voltage driver includes: a first voltage supplier circuit configured to output an external supply voltage provided from outside of the analog-to-digital converter; a second voltage supplier circuit configured to output a sampled reference voltage that is obtained during a sampling phase based on control signals received from the logic circuit; and a switching driver configured to electrically connect the first voltage supplier circuit to the digital-to-analog converter during a first conversion phase after the sampling phase based on the control signals received from the logic circuit, and to electrically connect the second voltage supplier circuit to the digital-to-analog converter during a second conversion phase based on the control signals received from the logic circuit.

An asynchronous capacitance-to-digital converter (CDC) is described that allows for very low-power operation when during inactive periods (when no conductive object is in contact or proximity to the sensing electrodes). Asynchronous operation of the CDC provides for capacitance-to-digital conversion without the use of system resources and more power intensive circuit elements.

An asynchronous capacitance-to-digital converter (CDC) is described that allows for very low-power operation when during inactive periods (when no conductive object is in contact or proximity to the sensing electrodes). Asynchronous operation of the CDC provides for capacitance-to-digital conversion without the use of system resources and more power intensive circuit elements.

Implementations disclosed describe a programmable analog subsystem (PASS) having a plurality of reconfigurable analog circuits. The PASS may be coupled to an input/output device to receive an input signal and to an interface to communicate data with a central processing unit. In a first PASS configuration, with the plurality of reconfigurable analog circuits having a first configuration setting, the PASS may process the input signal through the plurality of reconfigurable analog circuits to generate a first output value based on the input signal. Responsive to the first output value, the PASS may reconfigure the plurality of reconfigurable analog circuits into a second PASS configuration having a second configuration setting, such that the second configuration setting is different than the first configuration setting.

An input device includes transmitter electrodes disposed in a sensing region of the input device, a receiver electrode in the sensing region, and a processing system. The processing system includes demodulators, and is configured to simultaneously drive at least a subset of the transmitter electrodes using a multitude of transmitter signals with unique frequencies. The processing system is also configured to receive, on the receiver electrode, a resulting signal, and demodulate, using the plurality of demodulators, the resulting signal to generate a multitude, of sensing signals. Each of the of the demodulators operates on a different frequency of the unique frequencies.