An input device includes transmitter electrodes disposed in a sensing region of the input device, a receiver electrode in the sensing region, and a processing system. The processing system includes demodulators, and is configured to simultaneously drive at least a subset of the transmitter electrodes using a multitude of transmitter signals with unique frequencies. The processing system is also configured to receive, on the receiver electrode, a resulting signal, and demodulate, using the plurality of demodulators, the resulting signal to generate a multitude, of sensing signals. Each of the of the demodulators operates on a different frequency of the unique frequencies.

A non-uniform sampling pADC is disclosed. The pADC may include an optical pulse source configured to generate uniform optic pulses. The pADC may include a non-uniform sampling system. The non-uniform sampling system may include an inter-pulse timing modulation sub-system configured to convert the uniform optic pulses into non-uniform optic pulses. The non-uniform sampling system may include a timing control sub-system configured to control the timing of the optical pulse source. The pADC may include an optical modulator configured to modulate the non-uniform optical pulses. The pADC may include a photodetector configured to convert the modulated non-uniform optic pulses into electronic pulses. The pADC may include a pulse capture assembly configured to capture a pulse amplitude of the electronic pulses and generate sampled radio frequency output pulses. The pADC may include a quantizer configured to quantize the sampled radio frequency output pulses and generate digital radio frequency output signals.

A non-uniform sampling pADC is disclosed. The pADC may include an optical pulse source configured to generate uniform optic pulses. The pADC may include a non-uniform sampling system. The non-uniform sampling system may include an inter-pulse timing modulation sub-system configured to convert the uniform optic pulses into non-uniform optic pulses. The non-uniform sampling system may include a timing control sub-system configured to control the timing of the optical pulse source. The pADC may include an optical modulator configured to modulate the non-uniform optical pulses. The pADC may include a photodetector configured to convert the modulated non-uniform optic pulses into electronic pulses. The pADC may include a pulse capture assembly configured to capture a pulse amplitude of the electronic pulses and generate sampled radio frequency output pulses. The pADC may include a quantizer configured to quantize the sampled radio frequency output pulses and generate digital radio frequency output signals.

A successive approximation register analog to digital converter includes a sampling circuitry, a comparator circuit, and a controller circuitry. The sampling circuitry generates first and second signals according to a sampled signal. The comparator circuit compares the first signal with the second signal to generate first decision signals. The controller circuitry generates digital codes according to the first decision signals, and controls the comparator circuit to perform comparisons repeatedly to generate second decision signals, in order to generate a digital output according to the digital codes, a statistical noise value, and the second decision signals. The controller circuitry further controls the sampling circuitry and the comparator circuit to perform comparisons repeatedly according to the sampled signal having an initial level during an initial phase, in order to generate third decision signals, and performs a statistical calculation to obtain the statistical noise value according to the third decision signals.

In accordance with an embodiment, a circuit includes: a pass transistor drive circuit including an digital input, and at least one output configured to be coupled to at least one pass transistor; a digital feedback circuit having a first analog input configured to be coupled to the at least one pass transistor, and a digital output coupled to the digital input of the pass transistor drive circuit; and an analog feedback circuit including a second analog input configured to be coupled to the at least one pass transistor, and an analog output coupled to an over voltage node of the pass transistor drive circuit, where the analog feedback circuit has a DC gain greater than zero.

In accordance with an embodiment, a circuit includes: a pass transistor drive circuit including an digital input, and at least one output configured to be coupled to at least one pass transistor; a digital feedback circuit having a first analog input configured to be coupled to the at least one pass transistor, and a digital output coupled to the digital input of the pass transistor drive circuit; and an analog feedback circuit including a second analog input configured to be coupled to the at least one pass transistor, and an analog output coupled to an over voltage node of the pass transistor drive circuit, where the analog feedback circuit has a DC gain greater than zero.

A voltage monitoring circuit is disclosed. An apparatus includes a first physical interface circuit and a real-time oscilloscope circuit configured to monitor a first voltage provided to the first physical interface circuit. The real-time oscilloscope is configured to receive an indication that an error was detected in data transmitted from the first physical interface to a second physical interface circuit. The real-time oscilloscope is further configured to provide for debug, to a host computer external to the first interface, information indicating a state of the first voltage at a time at which the error was detected.

A voltage monitoring circuit is disclosed. An apparatus includes a first physical interface circuit and a real-time oscilloscope circuit configured to monitor a first voltage provided to the first physical interface circuit. The real-time oscilloscope is configured to receive an indication that an error was detected in data transmitted from the first physical interface to a second physical interface circuit. The real-time oscilloscope is further configured to provide for debug, to a host computer external to the first interface, information indicating a state of the first voltage at a time at which the error was detected.

An application specific integrated circuit (ASIC) can drive semiconductor devices, such as, radio frequency amplifiers, switches, etc. The ASIC can include a supply and reference voltage generation circuit, a digital core, a clock generator, a plurality of analog-to-digital converters, low and high-speed communications interfaces, drain and gate sensing circuits (that can include one or more current sense amplifiers), and a gate driver circuit. The ASIC can be a low voltage semiconductor integrated circuit.

This application relates to ADC circuitry. An ADC circuit (200) has first and second conversion paths (201a, 201b) for converting analogue signals to digital and is operable in first and second modes. In the first mode, the first and second conversion paths are connected to respective first and second input nodes (202a, 202b) to receive and convert full scale first and second analogue input signals (Ain1, Ain2) to separate digital outputs (Dout1, Dout2). In the second mode, the first and second conversion paths are both connected to the first input node (202a), to convert the first analogue input signal (Ain1) to respective first and second digital signals, and the first and second conversion paths are configured for processing different signal levels of the first analogue input signal. A selector (207) select the first digital signal or the second digital to be output as an output signal based on an indication of amplitude of the first analogue input signal.