The present disclosure relates to a read-out circuit comprising N inputs configured to be connected to N respective outputs of a pixel array of an image sensor, with N being an integer strictly greater than 1; and N analog-to-digital converters organized in K groups, with K being an integer strictly greater than 1 and strictly less than N, and each having a first input coupled to a respective one of the N inputs and a second input. In each group, the second inputs of the analog-to-digital converters of the group are connected together, electrically decoupled from the second inputs of the analog-to-digital converters of the other groups, and configured to receive a first reference signal that is identical for all the analog-to-digital converters of the group.

An apparatus is disclosed for gain stabilization. In an example aspect, the apparatus includes an amplifier and a gain-stabilization circuit. The amplifier has a gain that is based on a bias voltage and an amplification control signal. The gain- stabilization circuit is coupled to the amplifier and includes a replica amplifier. The replica amplifier has a replica gain that is based on the bias voltage and the amplification control signal. The gain-stabilization circuit is configured to adjust at least one of the bias voltage or the amplification control signal based on a gain error associated with the replica amplifier.

Some embodiments include a thermal management system for a nanosecond pulser. In some embodiments, the thermal management system may include a switch cold plates coupled with switches, a core cold plate coupled with one or more transformers, resistor cold plates coupled with resistors, or tubing coupled with the switch cold plates, the core cold plates, and the resistor cold plates. The thermal management system may include a heat exchanger coupled with the resistor cold plates, the core cold plate, the switch cold plate, and the tubing. The heat exchanger may also be coupled with a facility fluid supply.

Some embodiments include a thermal management system for a nanosecond pulser. In some embodiments, the thermal management system may include a switch cold plates coupled with switches, a core cold plate coupled with one or more transformers, resistor cold plates coupled with resistors, or tubing coupled with the switch cold plates, the core cold plates, and the resistor cold plates. The thermal management system may include a heat exchanger coupled with the resistor cold plates, the core cold plate, the switch cold plate, and the tubing. The heat exchanger may also be coupled with a facility fluid supply.

A physical quantity detection circuit includes: a detection signal generation circuit generating a detection signal, based on an output signal from a physical quantity detection element; an analog/digital converter circuit converting the detection signal into a first digital signal and converting a test signal into a second digital signal; a test signal generation circuit generating the test signal; and a malfunction diagnosis circuit diagnosing a malfunction of the analog/digital converter circuit, based on the second digital signal. A full-scale voltage of the analog/digital converter circuit is selected from among a plurality of voltages having different magnitudes, according to a power supply voltage. The test signal includes an upper limit value test signal, a lower limit value test signal, and a first intermediate value test signal. The test signal generation circuit performs resistive voltage division of the full-scale voltage and thus generates the first intermediate value test signal.

A physical quantity detection circuit includes: a detection signal generation circuit generating a detection signal, based on an output signal from a physical quantity detection element; an analog/digital converter circuit converting the detection signal into a first digital signal and converting a test signal into a second digital signal; a test signal generation circuit generating the test signal; and a malfunction diagnosis circuit diagnosing a malfunction of the analog/digital converter circuit, based on the second digital signal. A full-scale voltage of the analog/digital converter circuit is selected from among a plurality of voltages having different magnitudes, according to a power supply voltage. The test signal includes an upper limit value test signal, a lower limit value test signal, and a first intermediate value test signal. The test signal generation circuit performs resistive voltage division of the full-scale voltage and thus generates the first intermediate value test signal.

Analog signal measurement and related circuitry, systems, and methods are disclosed. Circuitry includes timing circuitry configured to assert a first enable signal at a first time and a second enable signal at a second time. The circuitry also includes an operational amplifier circuit configured to enable responsive to the assertion of the first enable signal. The operational amplifier circuit is configured to receive an analog input signal and, if enabled, generate an amplified analog input signal responsive to the analog input signal. The circuitry further includes signal analyzing circuitry configured to enable responsive to the assertion of the first enable signal, compare the amplified analog input signal to one or more threshold values responsive to the assertion of the second enable signal, and generate an alert signal responsive to a determination that the amplified analog input signal falls outside of the one or more threshold values.

A method and circuit for protecting circuit elements in a traffic control system from an overcurrent condition. In accordance with an embodiment, the circuit includes a current sensing element, a switching element, and a microcontroller. The circuit monitors first and second operating parameters and compares the first operating parameter with a first reference parameter and the second operating parameter with a second reference parameter. In response to the first operating parameter exceeding the first reference parameter and the second operating parameter exceeding the second reference parameter, the microcontroller generates a control signal to open the switching element.

A method and circuit for protecting circuit elements in a traffic control system from an overcurrent condition. In accordance with an embodiment, the circuit includes a current sensing element, a switching element, and a microcontroller. The circuit monitors first and second operating parameters and compares the first operating parameter with a first reference parameter and the second operating parameter with a second reference parameter. In response to the first operating parameter exceeding the first reference parameter and the second operating parameter exceeding the second reference parameter, the microcontroller generates a control signal to open the switching element.

A sample-and-hold amplification circuit can include a sampling circuit configured to sample first and second input signals in response to first and second control signals to generate first and second sampled signals, an amplification circuit configured to amplify a voltage difference between the first and second sampled signals to generate first and second output signals, and an offset compensation circuit configured to form a first path between input and output terminals of the amplification circuit in response to the first control signal to store an offset of the input terminal and form a second path between the input and output terminals in response to the second control signal to reflect the offset to the output terminal.