H03M1/66

High speed illumination driver for TOF applications

The disclosure provides a circuit. The circuit includes an amplifier and a digital to analog converter (DAC). The amplifier receives a reference voltage at an input node of the amplifier. The DAC is coupled to the amplifier through a refresh switch. The DAC includes one or more current elements. Each current element of the one or more current elements receives a clock. The DAC includes one or more switches corresponding to the one or more current elements. A feedback switch is coupled between the one or more switches and a feedback node of the amplifier. The DAC provides a feedback voltage at the feedback node of the amplifier.

Semiconductor controlled quantum annealing interaction gate

Novel and useful quantum structures that provide various control functions. Particles are brought into close proximity to interact with one another and exchange information. After entanglement, the particles are moved away from each other but they still carry the information contained initially. Measurement and detection are performed on the particles from the entangled ensemble to determine whether the particle is present or not in a given qdot. A quantum interaction gate is a circuit or structure operating on a relatively small number of qubits. Quantum interaction gates implement several quantum functions including a controlled NOT gate, quantum annealing gate, controlled SWAP gate, a controlled Pauli rotation gate, and ancillary gate. These quantum interaction gates can have numerous shapes including double V shape, H shape, X shape, L shape, I shape, etc.

Signal processing device and transceiver
10797717 · 2020-10-06 · ·

A signal processing device includes an A-D converter and a controller. The A-D converter converts an analog signal to a digital signal in which portions where the amplitude exceeds a predetermined range are clipped. A counter of the controller calculates, for the digital signal, a number of clipped samples for each predetermined number of period samples. A frequency converter performs frequency conversion of the digital signal. An LPF removes high frequency components of the digital signal. A rate converter converts a sampling rate of the A-D converter. A digital amplifier amplifies and outputs the digital signal. An amplification factor adjuster multiplies a preset amplification factor of the digital amplifier by an amplification factor adjustment coefficient based on a ratio of the number of regular samples to the number of period samples, to adjust the amplification factor.

Signal processing device and transceiver
10797717 · 2020-10-06 · ·

A signal processing device includes an A-D converter and a controller. The A-D converter converts an analog signal to a digital signal in which portions where the amplitude exceeds a predetermined range are clipped. A counter of the controller calculates, for the digital signal, a number of clipped samples for each predetermined number of period samples. A frequency converter performs frequency conversion of the digital signal. An LPF removes high frequency components of the digital signal. A rate converter converts a sampling rate of the A-D converter. A digital amplifier amplifies and outputs the digital signal. An amplification factor adjuster multiplies a preset amplification factor of the digital amplifier by an amplification factor adjustment coefficient based on a ratio of the number of regular samples to the number of period samples, to adjust the amplification factor.

Imaging systems having successive approximation register (SAR) analog-to-digital converters with reduced non-linearity

An image sensor may contain an array of imaging pixels arranged in rows and columns. Each column of imaging pixels may be coupled to an analog-to-digital converter for converting analog imaging signals from the pixels to digital signals. The analog-to-digital converter may be implemented as a split successive approximation register (SAR) analog-to-digital converter (ADC). The split SAR ADC may include a coarse section and a fine section. During a reset sampling phase, a reset level is sampled with a predetermined pedestal value is applied to the coarse and fine sections. During reset conversion, a reset code is obtained. During a signal sampling phase, a signal level is sampled using inverted bits of the reset code for only the fine section. During signal conversion, a signal code is obtained. Operated in this way, differential non-linearity of the ADC is minimized.

Imaging systems having successive approximation register (SAR) analog-to-digital converters with reduced non-linearity

An image sensor may contain an array of imaging pixels arranged in rows and columns. Each column of imaging pixels may be coupled to an analog-to-digital converter for converting analog imaging signals from the pixels to digital signals. The analog-to-digital converter may be implemented as a split successive approximation register (SAR) analog-to-digital converter (ADC). The split SAR ADC may include a coarse section and a fine section. During a reset sampling phase, a reset level is sampled with a predetermined pedestal value is applied to the coarse and fine sections. During reset conversion, a reset code is obtained. During a signal sampling phase, a signal level is sampled using inverted bits of the reset code for only the fine section. During signal conversion, a signal code is obtained. Operated in this way, differential non-linearity of the ADC is minimized.

Mapping circuit and method for selecting cells of a multi core hybrid I/Q digital to analog converter
10797719 · 2020-10-06 · ·

A mapping circuit (300) for selecting cells of a multi core hybrid I/Q digital to analog converter includes a first sub-mapping circuit (310a) configured to define a first group of cores for each data symbol to be transmitted and to select cells of the first group of cores for an I-code of the data symbol to be transmitted. The mapping circuit (310b) further includes a second sub-mapping circuit configured to define a second group of cores for each data symbol and to select cells of the second group of cores for a Q-code of the data symbol.

Capacitive MEMS microphone with built-in self-test

A digital microphone includes built-in self-test features. The features may include capability to apply different bias voltages to a MEMS capacitor sensor of the digital microphone, simulating application of different sound pressures to the digital microphone. The features may also include a digital oscillator, for applying a test signal to an analog front end of the microphone.

Capacitive MEMS microphone with built-in self-test

A digital microphone includes built-in self-test features. The features may include capability to apply different bias voltages to a MEMS capacitor sensor of the digital microphone, simulating application of different sound pressures to the digital microphone. The features may also include a digital oscillator, for applying a test signal to an analog front end of the microphone.

Segmented resistive digital to analog converter

A digital to analog converter (DAC) that receives a binary coded signal and generates an analog output signal includes a binary-to-thermometer decoder and a resistive network. The decoder receives the binary coded signal, and decodes it into thermometer signals. The resistive network has branches that are coupled to an output terminal of the DAC in response to the thermometer signals. Each of the branches includes first and second resistors, and a switch. The first resistor is coupled between a first reference voltage and the switch, and the second resistor is coupled between a second reference voltage and the switch. The switch couples either the first resistor or the second resistor to the output terminal in response to a corresponding thermometer signal.