A digital-to-analog converter (DAC) and a high-voltage tolerance circuit are provided. The DAC includes a high-voltage tolerance circuit. The high-voltage tolerance circuit is configured to generate a reference voltage, and select the reference voltage or a first power-source voltage to control the node voltage of each branch of an operational amplifier circuit of the high-voltage tolerance circuit according the logical signal level of an input signal.

A digital-to-analog converter (DAC) and a high-voltage tolerance circuit are provided. The DAC includes a high-voltage tolerance circuit. The high-voltage tolerance circuit is configured to generate a reference voltage, and select the reference voltage or a first power-source voltage to control the node voltage of each branch of an operational amplifier circuit of the high-voltage tolerance circuit according the logical signal level of an input signal.

An amplifier circuit has a sample-and-hold circuit to sample and hold an input signal, an amplifier which comprises an input terminal inputted with the input signal held by the sample-and-hold circuit and an output terminal outputting an amplification signal obtained by amplifying the input signal inputted, a feedback capacitor to be connected between the input terminal and output terminal of the amplifier, a successive approximation circuit to perform successive approximation operation to correct the amplification signal based on a voltage of the input terminal of the amplifier, the successive approximation operation being performed a predetermined number of cycles, and a control circuit to control the successive approximation circuit based on an amplification error included in the amplification signal.

A signal processing chain, such as an audio chain, produces an analog output signal from a digital input signal. The signal processing chain is operated by generating a first flag signal for the analog output signal and one or more second flag signals for the digital input signal. Each flag signal assumes a first level or a second level and is set to the first level when a signal from which the flag is generated has a value within an amplitude window. An amount the first flag signal for the analog output signal and the second flag signal for the digital input signal match each other may be calculated for issuing an alert flag which indicates an impaired operation of the signal processing chain.

A digital-to-analog converter (DAC) and a high-voltage tolerance circuit are provided. The DAC includes a high-voltage tolerance circuit. The high-voltage tolerance circuit is configured to generate a reference voltage, and select the reference voltage or a first power-source voltage to control the node voltage of each branch of an operational amplifier circuit of the high-voltage tolerance circuit according the logical signal level of an input signal.

A digital-to-analog converter (DAC) and a high-voltage tolerance circuit are provided. The DAC includes a high-voltage tolerance circuit. The high-voltage tolerance circuit is configured to generate a reference voltage, and select the reference voltage or a first power-source voltage to control the node voltage of each branch of an operational amplifier circuit of the high-voltage tolerance circuit according the logical signal level of an input signal.

A circuit device includes an A/D converter that converts a temperature detection voltage from a temperature sensor unit to temperature detection data, and a digital signal processing circuit that executes a temperature compensation process based on the temperature detection data. The A/D converter, in an activation period, may execute a first A/D conversion process to obtain an initial value of the temperature detection data, and in a normal operation period, may execute a second A/D conversion process based on the initial value to obtain the temperature detection data.

A circuit device includes an A/D converter that converts a temperature detection voltage from a temperature sensor unit to temperature detection data, and a digital signal processing circuit that executes a temperature compensation process based on the temperature detection data. The A/D converter, in an activation period, may execute a first A/D conversion process to obtain an initial value of the temperature detection data, and in a normal operation period, may execute a second A/D conversion process based on the initial value to obtain the temperature detection data.

A circuit device includes a register that stores result data, a D/A converter that executes D/A conversion on the result data so as to output a D/A conversion voltage, a comparator that compares an input voltage with the D/A conversion voltage, and a processing circuit that executes an update process on the result data through a determination process based on a comparison result from the comparison portion, so as to obtain A/D conversion result data of the input voltage, in which the processing circuit executes the determination process on an MSB side of the A/D conversion result data in a first determination period, and executes the determination process on an LSB side of the A/D conversion result data in a second determination period longer than the first determination period.

A circuit device includes a register that stores result data, a D/A converter that executes D/A conversion on the result data so as to output a D/A conversion voltage, a comparator that compares an input voltage with the D/A conversion voltage, and a processing circuit that executes an update process on the result data through a determination process based on a comparison result from the comparison portion, so as to obtain A/D conversion result data of the input voltage, in which the processing circuit executes the determination process on an MSB side of the A/D conversion result data in a first determination period, and executes the determination process on an LSB side of the A/D conversion result data in a second determination period longer than the first determination period.