A multiplying digital-to-analog converter (MDAC) includes an operational amplifier, a sampling capacitor circuit, a pre-sampling capacitor circuit, and a switch circuit. During a sampling cycle, the switch circuit connects a pre-defined voltage and reference voltages to the pre-sampling capacitor circuit, disconnects the pre-sampling capacitor circuit from an input port of the operational amplifier and the sampling capacitor circuit, disconnects an output port of the operational amplifier from the sampling capacitor circuit, and connects a voltage input to the sampling capacitor circuit. During a conversion cycle, the switch circuit connects the pre-sampling capacitor circuit to the sampling capacitor circuit, disconnects the pre-defined voltage and the reference voltages from the pre-sampling capacitor circuit, connects the pre-sampling capacitor circuit to the input port of the operational amplifier, connects the output port of the operational amplifier to the sampling capacitor circuit, and disconnects the voltage input from the sampling capacitor circuit.

A multiplying digital-to-analog converter (MDAC) includes an operational amplifier, a sampling capacitor circuit, a pre-sampling capacitor circuit, and a switch circuit. During a sampling cycle, the switch circuit connects a pre-defined voltage and reference voltages to the pre-sampling capacitor circuit, disconnects the pre-sampling capacitor circuit from an input port of the operational amplifier and the sampling capacitor circuit, disconnects an output port of the operational amplifier from the sampling capacitor circuit, and connects a voltage input to the sampling capacitor circuit. During a conversion cycle, the switch circuit connects the pre-sampling capacitor circuit to the sampling capacitor circuit, disconnects the pre-defined voltage and the reference voltages from the pre-sampling capacitor circuit, connects the pre-sampling capacitor circuit to the input port of the operational amplifier, connects the output port of the operational amplifier to the sampling capacitor circuit, and disconnects the voltage input from the sampling capacitor circuit.

The present application discloses a display panel driving method and a display panel thereof. The display panel driving method includes: a timing control chip performs initial configurations; the timing control chip generates a control signal; and an output enable circuit receives the control signal to control picture display of a display panel.

The present application discloses a display panel driving method and a display panel thereof. The display panel driving method includes: a timing control chip performs initial configurations; the timing control chip generates a control signal; and an output enable circuit receives the control signal to control picture display of a display panel.

A physically unclonable function (PUF) includes a bit cell that includes a latch and a switch to selectively couple the latch to a supply voltage node. A first transmission gate couples a first bit line to a first internal node of the latch and a second transmission gate couples a second bit line to a second internal node of the latch. A digital to analog converter (DAC) circuit is selectively coupled to the first internal node through the first bit line and the first transmission gate and to the second internal node through the second bit line and the second transmission gate, to thereby precharge the latch before the first bit cell is read. The latch regenerates responsive to the switch being closed to connect the latch to the supply voltage node. The first and second bit lines are used to read the regenerated value of the latch.

A physically unclonable function (PUF) includes a bit cell that includes a latch and a switch to selectively couple the latch to a supply voltage node. A first transmission gate couples a first bit line to a first internal node of the latch and a second transmission gate couples a second bit line to a second internal node of the latch. A digital to analog converter (DAC) circuit is selectively coupled to the first internal node through the first bit line and the first transmission gate and to the second internal node through the second bit line and the second transmission gate, to thereby precharge the latch before the first bit cell is read. The latch regenerates responsive to the switch being closed to connect the latch to the supply voltage node. The first and second bit lines are used to read the regenerated value of the latch.

A method and a system of calibrating a DC offset voltage on a resistor load are provided. The system may include a first operational amplifier, a second operational amplifier, a comparator, a digital signal processor, and a digital to analog convertor. At a calibration mode, under control of the digital signal processor, the system may utilize open-loop high gain characteristics of the first operational amplifier and the comparator to automatically detect and calibrate the DC offset voltage. At an operation mode, the system may automatically compensate the DC offset voltage based on the calibration of the DC offset voltage. In this way, the system and the method can automatically detect, calibrate, and compensate the DC offset voltage with reduced cost and technical complexity.

A method and a system of calibrating a DC offset voltage on a resistor load are provided. The system may include a first operational amplifier, a second operational amplifier, a comparator, a digital signal processor, and a digital to analog convertor. At a calibration mode, under control of the digital signal processor, the system may utilize open-loop high gain characteristics of the first operational amplifier and the comparator to automatically detect and calibrate the DC offset voltage. At an operation mode, the system may automatically compensate the DC offset voltage based on the calibration of the DC offset voltage. In this way, the system and the method can automatically detect, calibrate, and compensate the DC offset voltage with reduced cost and technical complexity.

A quad signal generator circuit generates four 2.sup.N−1 bit control signals in response to a sampling clock and a 2.sup.N−1 bit thermometer coded signal. A digital-to-analog converter (DAC) circuit has 2.sup.N−1 unit resistor elements, with each unit resistor element including four switching circuits controlled by corresponding bits of the four 2.sup.N−1 bit control signals. Outputs of the 2.sup.N−1 unit resistor elements are summed to generate an analog output signal. The quad signal generator circuit controls generation of the four 2.sup.N−1 bit control signals such that all logic states of bits of the four 2.sup.N−1 bit control signals remain constant for at least a duration of one cycle of the sampling clock. The analog output signal may be a feedback signal in a sigma-delta analog-to-digital converter (ADC) circuit that includes a multi-bit quantization circuit operating to quantize a filtered loop signal to generate the 2.sup.N−1 bit thermometer coded signal.

In an example, a circuit includes a first comparator, a second comparator, a pulse counter, a processor, a first ADC, and a second ADC. The first comparator has a first input coupled to a first node, a second input, and an output. The second comparator has a first input coupled to a second node, a second input, and an output. A first DAC is coupled to the second input of the first comparator. A second DAC is coupled to the second input of the second comparator. The pulse counter has a first input coupled to the output of the first comparator and a second input coupled to the output of the second comparator. The first ADC has an input coupled to the first node and an output coupled to the processor. The second ADC has an input coupled to the second node and an output coupled to the processor.