In an example, a phase-locked loop (PLL) circuit includes an error detector operable to generate an error signal; an oscillator operable to provide an output signal having an output frequency based on the error signal and a frequency band select signal, the output frequency being a frequency multiplier times a reference frequency; a frequency divider operable to divide the output frequency of the output signal to generate a feedback signal based on a divider control signal; a sigma-delta modulator (SDM) operable to generate the divider control signal based on inputs indicative of an integer value and a fractional value of the frequency multiplier, the SDM responsive to an order select signal operable to select an order of the SDM; and a state machine operable to, in an acquisition state, generate the frequency band select signal and set the order of the SDM.

A D/A conversion circuit includes: an output terminal connected to an operational amplifier connected to a quantization circuit; a DAC capacitor; a selection switch switching among reference, first and second voltages to apply to the DAC capacitor as an analog potential; a ground switch connecting the DAC capacitor to a ground; and an output switch connecting the DAC capacitor to the output terminal. In a first period, the selection switch selects one of the reference, first and second voltages according to a quantization result value from the quantization circuit, and connects the one to the DAC capacitor, and the ground switch turns on to charge the DAC capacitor. In a second period, the selection switch selects another one of the first and second voltages, and connects the another one to the DAC capacitor, and the output switch turns on to output the analog potential to the output terminal.

A method includes receiving samples of digital to analog converter (DAC), partitioning the samples to unit-DACs based upon previous partitions of inputs to the unit-DACs to cancel out integrated non-linearities of outputs of the DAC caused by the gain mismatches of the unit-DACs, including partitioning samples of DAC input to the unit-DACs through a recursive nth order partitioning algorithm. The algorithm includes, for each DAC input, determining a first partition of the DAC input that would cancel an (n1)th order previously integrated non-linearity, adding an equivalent DAC input of the first partition to the DAC input to obtain a total DAC input, using a first order application of the total DAC input to the inputs of the unit-DACs to yield a second partition of DAC input, summing the first and second partitions generate a final partition, and, based on the final partition, computing non-linearity remainders at each order of integration.

A correction method and a correction circuit for a sigma-delta modulator (SDM) are provided. The SDM includes a loop filter, a quantizer, and a digital-to-analog converter (DAC). The correction method includes the following steps: controlling the DAC not to receive the output of the quantizer; controlling the SDM to stop receiving signals; inputting a test signal to the DAC; converting the output of the loop filter to a digital signal; comparing the digital signal with a preset value; and adjusting the loop filter according to the result of comparing the digital signal and the preset value.

An apparatus is provided which substantially removes a perturbation signal from a pulse density modulated signal representing a combination of a signal to be measured and a perturbation applied to the signal to be measured. The removal of the perturbation is done by subtracting a correcting signal from the pulse density modulated signal. This approach introduces very little delay as it can be implemented by simple logic gates. It also provided enhanced immunity from the effects of bit errors.

The invention concerns a device including: first and second detectors of the phase and/or of the frequency of an input signal with respect to first and second reference signals; and a Sigma/Delta converter interpreting outputs of the first or of the second phase and/or frequency detector to determine a propagation time of the input signal.

An method comprising activating an internal switch within a packaged electronic device to connect to a reference ground of an internal voltage source to a first input of an analog front end, receiving an external ground potential voltage at a first package pin of the packaged electronic device, generating a zero detector output signal for the packaged electronic device at a second package pin, activating the internal switch to connect the first input of the analog front end to the internal voltage source, receiving a second voltage level at the first package pin that generates a second output signal that matches the zero detector output signal, and receiving trim instructions to trim an internal voltage generated by the internal voltage source to a voltage level that is closer to a target voltage level.

Circuits and methods for converting digital input signals into the analog domain are described. Such circuits may perform the conversion in a segmented fashion. For example, a circuit may include a most significant bit (MSB) path and a least significant bit (LSB) path. The MSB path may include a first delta-sigma modulator having first and second outputs and a first digital-to-analog converter coupled to the first output of the first delta-sigma modulator. The LSB path comprises a second delta-sigma modulator comprising a loop filter and a quantizer. The quantizer may have an input coupled to the loop filter and to the digital filter. The LSB path may further include a second digital-to-analog converter coupled to an output of the quantizer. The circuit may further include a digital filter and/or a gain stage interposed between the MSB path and the LSB path.

Described is an apparatus which comprises: a digital-to-analog converter (DAC) having a DAC cell with p-type and n-type current sources and an adjustable strength current source which is operable to correct non-linearity of the DAC cell caused by both the p-type and n-type current sources; and measurement logic, coupled to the DAC, having a reference DAC cell with p-type and n-type current sources, wherein the measurement logic is to monitor an integrated error contributed by both the p-type and n-type current sources of the DAC cell, and wherein the measurement logic is to adjust the strength of the adjustable strength current source according to the integrated error and currents of the p-type and n-type current sources of the reference DAC cell.

The disclosure provides a receiver with high dynamic range. The receiver includes a photodiode that generates a current signal. A coupling capacitor is coupled to the photodiode, and generates a modulation signal in response to the current signal received from the photodiode. A sigma delta analog to digital converter (ADC) is coupled to the coupling capacitor, and generates a digital data in response to the modulation signal. A digital mixer is coupled to the sigma delta ADC, and generates an in-phase component and a quadrature component corresponding to the digital data. A processor is coupled to the digital mixer, and processes the in-phase component and the quadrature component corresponding to the digital data.