A light-emitting element includes: pixel electrodes provided for individual subpixels of at least three colors; a common electrode provided facing each of the pixel electrodes; and light-emitting layers of each color provided between the common electrode and, respectively, each of the pixel electrodes, wherein one of each of the pixel electrodes and the common electrode is a cathode electrode and the other is an anode electrode and among the light-emitting layers of the at least three colors, a light-emitting layer of a color having a largest electron affinity extends in a state of being layered between the cathode electrode and each light-emitting layer of the other colors as well.

A bank has an opening including a first opening and a second opening. The second opening extends from the first opening in such a direction that the second opening overlaps the first electrode. The second opening at least partially overlaps the first electrode. The first electrode has an end close to the first opening and overlapping the second opening. The second opening has a maximum width smaller than a maximum width of the first opening. The widths are measured perpendicular to the direction in which the second opening extends from the first opening.

A display device includes a display area, a frame area around the display area, and a contact area between the display area and the frame area. In the display area is there provided a light-emitting element layer including an anode, a functional layer, a cathode, and a pixel bank covering an edge of the anode. The cathode is electrically connected to a metal film in the contact area. An insular TEG pattern is provided in the contact area.

According to a flexible light-emitting device production method of the present disclosure, after an intermediate region (30i) and flexible substrate regions (30d) of a plastic film (30) of a multilayer stack (100) are divided from one another, the interface between the flexible substrate regions (30d) and a glass base (10) is irradiated with lift-off light. The multilayer stack (100) is separated into a first portion (110) and a second portion (120) while the multilayer stack (100) is in contact with a stage (212). The first portion (110) includes a plurality of light-emitting devices (1000) which are in contact with the stage (212). The light-emitting devices (1000) include a plurality of functional layer regions (20) and the flexible substrate regions (30d). The second portion (120) includes the glass base (10) and the intermediate region (30i).

A light-emitting device includes: an anode; a cathode; a light-emitting layer between the anode and the cathode; and a hole transport layer between the anode and the light-emitting layer, the hole transport layer containing carbon and a metal oxide in a prescribed, adjusted ratio.

In an organic EL display device in which an outer peripheral shape of a display region is a variant shape different from a rectangular shape and having rounded corner portions and a notch portion, a protruding portion having a height equal to or greater than heights of a first dam wall and a second dam wall is provided at positions facing the rounded corner portions and the notch portion in the display region through the second dam wall and the first dam wall positioned inside the second dam wall, on the outer side of the second dam wall in a frame region.

Provided is a display device in which pixels each configured by layering a first electrode, an organic layer, and a second electrode are formed in a two-dimensional matrix arrangement on a substrate; the first electrode is arranged for each pixel and includes a conductive light reflecting film formed on an insulating layer provided on the substrate, and a transparent electrode formed on the light reflecting film; vias conductive with the light reflecting films are formed in portions of the insulating layer positioned under the light reflecting films; and a voltage is applied to the first electrodes through the vias.

The manufacturing yield of a display device is improved. The resistance of a display device to ESD is increased. The display device includes a substrate, a display portion, a connection terminal, a first wiring, and a second wiring. The first wiring is electrically connected to the connection terminal and includes a portion positioned between the connection terminal and the display portion. The second wiring is electrically connected to the connection terminal, is positioned between the connection terminal and an end portion of the substrate, and includes a portion in which a side surface is exposed at an end portion of the substrate. The display portion includes a transistor. The transistor includes a semiconductor layer, a gate insulating layer, and a gate electrode. The semiconductor layer and the second wiring include a metal oxide.

A method of inspecting an elongated metal plate is provided, including measuring longitudinal direction metal plate thicknesses, measuring width direction metal plate thicknesses, and selecting the metal plate that satisfies condition (1), (B/A)×100 (%) is 5% or less, A being an average value of the longitudinal direction metal plate thicknesses, and B being obtained by multiplying a standard deviation of the longitudinal direction metal plate thicknesses by 3, and that satisfies condition (2), (C/X)×100 (%) is 3% or less, C being a value obtained by multiplying a standard deviation of the width direction metal plate thicknesses by 3, and X being a central portion width direction metal plate thickness obtained when the width direction metal plate thicknesses are measured to calculate the standard deviation of the metal plate thicknesses in the width direction.

A method of inspecting an elongated metal plate is provided, including measuring longitudinal direction metal plate thicknesses, measuring width direction metal plate thicknesses, and selecting the metal plate that satisfies condition (1), (B/A)×100 (%) is 5% or less, A being an average value of the longitudinal direction metal plate thicknesses, and B being obtained by multiplying a standard deviation of the longitudinal direction metal plate thicknesses by 3, and that satisfies condition (2), (C/X)×100 (%) is 3% or less, C being a value obtained by multiplying a standard deviation of the width direction metal plate thicknesses by 3, and X being a central portion width direction metal plate thickness obtained when the width direction metal plate thicknesses are measured to calculate the standard deviation of the metal plate thicknesses in the width direction.