Patent classifications
H05H2277/13
Systems for Controlling a Beam of Charged Particles
Various embodiments include a charged particle beam management and control system for manipulating and controlling a beam of charged particles output from an accelerator to roughly match the size and shape of an irradiation target. Various embodiments achieve dynamic and flexible control of the beam shape at the target by using two octupole magnets in combination with a system of quadrupole magnets that shape the beam before entering each of the two octupole magnets. The magnetic fields of the quadrupole magnets are dynamically controlled by a computer processing system that receives information from beam sensors at or near the target to maintain beam shape and spread at the target. The system allows for the creation and maintenance of a uniform and square or rectangular beam profile at the target, suitable for applications such as isotope production and irradiation. The system is adaptable to different beam types, sizes, and shapes.
Compact neutron generator based on an all-glass helicon wave ion source
The present application discloses a compact neutron generator based on an all-glass helicon wave ion source, which belongs to the field of accelerator neutron sources. The neutron generator includes a helicon wave ion source part, a cavity part, and a target part. First, deuterium gas is introduced into the ion source chamber. Then, the deuterium gas is excited by an antenna, thereby generating a helicon wave plasma. Under the constraint of a magnetic field, deuterium ions are first extracted in the form of a beam by the potential difference between an extraction electrode and an ion source cover plate, and then accelerated by the electric field between the extraction electrode and a titanium target. Finally, the deuterium ion beam bombards the titanium target, and a deuterium-deuterium fusion reaction occurs to generate neutrons. At the same time, an arc magnet and a resistor are used to suppress the secondary electrons generated by the target, so as to prevent the secondary electrons from being reversely accelerated and entering the ion source chamber. The present application has the advantages of low energy consumption, a compact structure, high plasma density, autonomous cooling, a good secondary electron suppression effect, high extraction beam intensity, and a high neutron yield.