A component supply device, including a stage on which components are scattered; an imaging device configured to image components scattered on the stage; a storage device configured to store first identification information capable of identifying a first component which is a component scheduled to be supplied from the stage and second identification information capable of identifying a second component which is a component not scheduled to be supplied from the stage; and a determination device configured to determine whether the first component is present on the stage based on the first identification information and imaging data from the imaging device, and to determine whether the second component is present on the stage based on the second identification information and imaging data from the imaging device.

A mounting accuracy measurement chip includes a chip main body; and one or more protrusions provided on a mounting face of the chip main body, which serve as a contact surface with a mounting target at a position shifted from the mounting face of the chip main body. The one or more protrusions are disposed only within a range defined by a circle whose center is center of gravity of the mounting face and whose radius is half the length of the longest distance from center of gravity to the outer edge of chip main body. Further, a mounting accuracy measurement kit includes the above-mentioned mounting accuracy measurement chip and placement portion, having a degree of adhesiveness, to which the contact surface of mounting accuracy measurement chip, which can be placed, adheres.

A mounting accuracy measurement chip includes a chip main body; and one or more protrusions provided on a mounting face of the chip main body, which serve as a contact surface with a mounting target at a position shifted from the mounting face of the chip main body. The one or more protrusions are disposed only within a range defined by a circle whose center is center of gravity of the mounting face and whose radius is half the length of the longest distance from center of gravity to the outer edge of chip main body. Further, a mounting accuracy measurement kit includes the above-mentioned mounting accuracy measurement chip and placement portion, having a degree of adhesiveness, to which the contact surface of mounting accuracy measurement chip, which can be placed, adheres.

The disclosure discloses an array substrate, a display panel, and a display device. A first power signal line is configured to be formed by electrically connecting a first signal line located in a first source-drain metal layer and a second signal line located in a second source-drain metal layer through a via hole, which is equivalent to that the first power signal line is composed of the first signal line and the second signal line connected in parallel, and the equivalent resistance of the parallel-connected first signal line and second signal line included in the first power signal line is smaller than the resistance of any of the signal lines. Thus, the resistance of the first power signal line may be effectively reduced, so that an IR drop of a display panel with an array substrate may be reduced, and the display uniformity of the display panel is improved.

A lead wire straightening device including a control device that disposes a lead wire of a lead component that is held by a holding section between a first claw section and a second claw section. The control device causes an opening/closing driving section of a straightening unit to clamp and straighten the lead wire by the first and second claw sections. After the lead wire is clamped, the control device causes a driving section to rotate at least one of the holding section and the straightening unit to thereby change positions of the first and second claw sections relative to the lead wire. Then, after changing the positions of the first and second claw sections relative to the lead wire, the control device causes the first and second claw sections to clamp the lead wire again to straighten the lead wire.

A production management device, such as a production management computer, determines a production sequence of plural types of substrates in order to produce the substrates consecutively on a product type-by-type basis by using a component mounter including component supply devices. The production management device includes a main control unit for determining a production sequence of substrates such that, where a time from start to completion of off-line setup of all the component supply devices to be used for a single product type of substrate is defined as an off-line setup time, a sum of the off-line setup times for two product types of substrates to be consecutively produced is balanced over an entire period of consecutive production.

An electronic component set includes a plurality of electronic components and a holding member that holds the plurality of electronic components. Each of the plurality of electronic components includes an identification unit. The plurality of electronic components are held by the holding member to allow an optical reader to read the identification unit of the each of the plurality of electronic components.

Component mounting machine includes head, a device for moving head, transfer unit, and a mounting controller. Circular plate is an example of a container in which paste is placed. The bottom face of circular plate and the upper surface of the side wall have a predetermined height relationship. Height sensor is disposed on the lower face of head. Height sensor measures the height of the upper surface of the side wall of circular plate, which is a measurement point. The mounting controller recognizes the height of the bottom face of circular plate or the height of the surface of coating film disposed on circular plate from the height of the top surface of the side wall of circular plate measured by height sensor.

The substrate processing management system for a substrate processing line including a defect tallying section to calculate a defect rate representing a rate of occurrence of substrates or electronic components determined to be defective with the substrate inspection machine, or obtain a number of defective products having substrates or electronic components determined to be defective; an attribute change recognition section to recognize when an attribute, among the attributes of the electronic component, having a possibility of affecting the inspection, has changed in the component mounting machine; a fault point estimation section to estimate, when the defect rate or the number of defective products exceeds a predetermined value, which of the component mounting machine or the substrate inspection machine is a fault point depending on whether an attribute has changed; and a countermeasure calling section configured to call for a defect countermeasure to the estimated fault point.

The substrate processing management system for a substrate processing line including a defect tallying section to calculate a defect rate representing a rate of occurrence of substrates or electronic components determined to be defective with the substrate inspection machine, or obtain a number of defective products having substrates or electronic components determined to be defective; an attribute change recognition section to recognize when an attribute, among the attributes of the electronic component, having a possibility of affecting the inspection, has changed in the component mounting machine; a fault point estimation section to estimate, when the defect rate or the number of defective products exceeds a predetermined value, which of the component mounting machine or the substrate inspection machine is a fault point depending on whether an attribute has changed; and a countermeasure calling section configured to call for a defect countermeasure to the estimated fault point.