A display device includes a substrate, a display area disposed on the substrate and including a plurality of pixels and data lines, a peripheral area disposed outside the display area of the substrate, a pad portion disposed in the peripheral area, an encapsulation layer disposed in the peripheral area and the display area, and disposed on the plurality of pixels of the display area, a crack detection circuit disposed in the peripheral area, and a first crack detection line connected with the pad portion and the crack detection circuit. The first crack detection line is disposed on the encapsulation layer.

A method of analyzing film on a substrate comprises receiving surface profile data obtained from measurements of a plurality of discrete regions on a substrate, the plurality of discrete regions comprising one or more film layers; extracting a plurality of parameters from the received surface profile data, the plurality of parameters comprising one or more parameters of the one or more film layers of each of the plurality of discrete regions, wherein the extracting is based on a predetermined pattern for the plurality of the discrete regions on the substrate; and displaying a user interface. The user interface may comprise a plurality of individual graphs each illustrating the one or more parameters of the one or more film layers for a corresponding subset of the plurality of discrete regions, and a composite graph illustrating the one or more parameters of the one or more film layers for each discrete region of the plurality of discrete regions, wherein the composite graph corresponds to the plurality of individual graphs being overlaid together.

A display panel includes: a silicon-based substrate, a driving layer, a first electrode layer, an organic light emitting layer, a second electrode layer and a plurality of pads. Where, the display signal access pad is configured to access the display signal during a display phase, the test signal access pad at least includes a first group of test phase access pads, and the first group of test phase access pads includes a first pad and a second pad, the first pad is electrically connected with the electrode ring, and the second pad is electrically connected with the silicon-based substrate.

A display device includes a display area and a non-display area adjacent to the display area; a first scan line that extends in a row direction and transmits a first scan signal; a first pixel part electrically connected to the first scan line; a second pixel part electrically connected to the first scan line and spaced apart from the first pixel part in the row direction; and a first inspection pad disposed between the first pixel part and the second pixel part and electrically connected to the first scan line.

A display device includes a pixel array including touch blocks; a plurality of test pads in a bezel area outside the pixel array for performing a pixel test and a touch block test; a plurality of pixel test lines and a plurality of touch block test lines connected to the test pads within the pixel array; a switching unit between the test pads and the pixel test lines and the touch block test lines and applying a test signal to any one of the pixel test lines and the touch block test lines; a pixel test switching pad in the bezel area and providing a control signal for testing pixel operation in the pixel array to the switching unit; and a touch block test switching pad in the bezel area and providing a control signal for testing the touch blocks within the pixel array to the switching unit.

A display device includes a display panel including a display area displaying an image, a non-display area adjacent to the display area, and a plurality of signal lines, and a driving circuit disposed in the non-display area, wherein the driving circuit includes a plurality of bumps arranged in a plurality of rows. The plurality of bumps include a crack detection bump arranged in at least one row among the plurality of rows, the plurality of signal lines include a crack detection line electrically connected to the crack detection bump, and at least a portion of the crack detection line is disposed adjacent to an edge of the driving circuit.

A display substrate, a display method and a display device are disclosed. The display substrate includes a display region and an offset region surrounding the display region. The display substrate includes a silicon-based substrate, an emitting structure layer arranged on the silicon-based substrate. The first pixel driving circuits are connected with the emitting structure layer of the display region, and at least part of the first pixel driving circuits are configured to provide driving signals for the emitting structure layer electrically connected with the first pixel driving circuits during normal display. The second pixel driving circuits are connected with the emitting structure layer of the offset region, and at least part of the second pixel driving circuits are configured to provide no driving signals for the emitting structure layer electrically connected with the second pixel driving circuits during normal display.

A sensor device for detecting a target species in an aqueous media and/or measuring the concentration of a target species in an aqueous media, the sensor device comprising: (a) an active semiconductor comprising an organic semiconductor material that exhibit substantially the same transfer curve for a period of at least 24 hours when first exposed to air; and (b) a structure for directing an aqueous media into contact with the sensor device.

An array substrate and a detection method thereof, and a display panel are disclosed. The array substrate includes a plurality of subpixels and a plurality of signal line structures. The plurality of subpixels are arranged in an array of a plurality of rows and a plurality of columns along a first direction and a second direction. Each signal line structure of the plurality of signal line structures includes at least one first detection line extending along the first direction; adjacent (n)th row and (n+1)th row of subpixels in the array form a subpixel row group, and the signal line structure is configured to be connected to the (n)th row and (n+1)th row of subpixels and detect electrical characteristics of first transistors or light-emitting elements in the subpixels.

The present application discloses a testing device of array substrates and a testing method. The testing device of array substrates includes: a machine and testing interfaces, the testing interfaces being disposed on the machine; and testers disposed above the machine. There are at least two sets of testers, and the testers synchronously operate according to a preset scheme.