A display device includes a pixel array including touch blocks; a plurality of test pads in a bezel area outside the pixel array for performing a pixel test and a touch block test; a plurality of pixel test lines and a plurality of touch block test lines connected to the test pads within the pixel array; a switching unit between the test pads and the pixel test lines and the touch block test lines and applying a test signal to any one of the pixel test lines and the touch block test lines; a pixel test switching pad in the bezel area and providing a control signal for testing pixel operation in the pixel array to the switching unit; and a touch block test switching pad in the bezel area and providing a control signal for testing the touch blocks within the pixel array to the switching unit.

A method of manufacturing a display apparatus is provided. The method includes forming a test area on a display substrate, irradiating a first laser to the test area and determining relative positions of the test area and a first irradiation area formed by irradiating the first laser to the test area, and correcting a position of a second laser irradiated to the display substrate based on the relative positions of the test area and the first irradiation area.

A method for manufacturing a display device is provided. A process of forming an inspection pattern, in which a protective film unit is partially removed in a thickness direction, in a pad area portion of the protective film unit, which corresponds to a pad area of a display unit, may be performed, and then, a process of delaminating the pad area portion of the protective film unit may be performed. A process of checking whether the inspection pattern exists may be performed to check whether the delamination has succeeded, and, at the same time, a process of measuring distances from an alignment mark to each of a long side and a short side of the display unit may be performed.

A method of analyzing film on a substrate comprises receiving surface profile data obtained from measurements of a plurality of discrete regions on a substrate, the plurality of discrete regions comprising one or more film layers; extracting a plurality of parameters from the received surface profile data, the plurality of parameters comprising one or more parameters of the one or more film layers of each of the plurality of discrete regions, wherein the extracting is based on a predetermined pattern for the plurality of the discrete regions on the substrate; and displaying a user interface. The user interface may comprise a plurality of individual graphs each illustrating the one or more parameters of the one or more film layers for a corresponding subset of the plurality of discrete regions, and a composite graph illustrating the one or more parameters of the one or more film layers for each discrete region of the plurality of discrete regions, wherein the composite graph corresponds to the plurality of individual graphs being overlaid together.

The present application discloses embodiments of a display panel, a preparation method thereof, a detection method thereof, and a display device for improving an accuracy of detecting electrical properties of transistors. In one embodiment, a display panel may include a display area including a plurality of pixels and a non-display area surrounding the display area, wherein each of the plurality of pixels may include a display pixel circuit, and the non-display area may include one or more test pixel circuits, each of the one or more test pixel circuits having an equivalent circuit structure to the display pixel circuit, where the one or more test pixel circuits may include a plurality of transistors, and electrodes of at least one of the plurality of transistors may be respectively conductively coupled to different test pads.

Embodiments of the present disclosure provides a display panel, a display device and a display method. The display panel includes a display substrate and a package substrate, the display substrate includes a pixel region, the package substrate includes frames and a light transmission region surrounded by the frames, wherein a plurality of pixel units are disposed in the pixel region of the display substrate; a length L of the pixel region of the display substrate is greater than a distance D between the frames of the package substrate at least in a first direction; and an orthographic projection of the pixel region on the display substrate at least partially covers an orthographic projection of the light transmission region on the display substrate.

A display apparatus includes: a plurality of pixel circuits at a display area, the display area having a non-quadrangular shape; a first signal line extending on the display area in a first direction, and electrically connected to a first pixel circuit from among the plurality of pixel circuits; a first voltage line extending on the display area in the first direction; a first load compensation capacitor adjacent to an end portion of the first signal line and an end portion of the first voltage line; a test circuit outside the display area; an output line electrically connected to the test circuit; and a connection portion configured to electrically connect the output line, the first signal line, and an electrode of the first load compensation capacitor to each other.

A display device includes a display panel including an opening and a plurality of pixels that display an image, a crack detection line disposed along a periphery of the opening, and a plurality of data lines connected to the plurality of pixels. The crack detection line is connected to one of the plurality of data lines, and detects a crack at the periphery of the opening through a single pixel array connected to the one of the plurality of data lines.

A display device includes: a display element provided to a display region; an analysis element provided to a frame region disposed around the display region; and a sealing layer sealing the display element and the analysis element. The display element includes: a TFT layer including a resin film; and a light-emitting element layer including a first electrode, a functional layer, and a second electrode. The analysis element includes: a first metal film formed on the resin film; an analysis layer formed on the first metal film; a second metal film formed to cover at least a portion of an edge of the analysis layer, and electrically connected to the first metal film; and a ground wire electrically connected through the first metal film to the second metal film.

Provided are a detection method and a detection device, the detection method includes: in a first writing stage, providing an active voltage to each data line, each power supply terminal, both ends of a first gate line to-be-detected, an absolute value of the active voltage of each data line is smaller than that of the active voltage of the power supply terminal, an absolute value of the active voltage of the first gate line to-be-detected is smaller than that of the active voltage of each data line; in a first detection stage, maintaining the active voltage of the power supply terminal, providing an inactive voltage to the first gate line to-be-detected and providing an active voltage to the data line, detecting voltages at second electrodes of storage capacitors corresponding to the first gate line to-be-detected, determining whether the first gate line to-be-detected has breakpoint according to the detected voltages.