Provided is a charged particle generation device. The charged particle generation device includes a light source unit configured to emit a laser, a target layer that receives the laser and emits charged particles, and a focusing structure disposed on the target layer to focus the laser. The focusing structure includes solid films extending on an upper surface of the target layer in a direction away from the target layer, and a pore section disposed between the solid films and having a porous structure. The focusing structure includes a material having a higher atomic number than carbon.

Provided is a charged particle generation device. The charged particle generation device includes a light source unit configured to emit a laser, a target layer that receives the laser and emits charged particles, and a focusing structure disposed on the target layer to focus the laser. The focusing structure includes solid films extending on an upper surface of the target layer in a direction away from the target layer, and a pore section disposed between the solid films and having a porous structure. The focusing structure includes a material having a higher atomic number than carbon.

Systems for generating a proton beam include an electromagnetic radiation beam (e.g., a laser) that is directed onto an ion-generating target by optics to form the proton beam. A detector is configured to measure a laser-target interaction property, which a processor uses to produce a feedback signal that can be used to alter the proton beam by adjusting the source of the electromagnetic radiation beam, the optics, or a relative position or orientation of the electromagnetic radiation beam to the ion-generating target. By adjusting the laser-target interaction, the feedback can be used to control properties of the proton beam, such as the proton beam energy or flux. Such systems have certain advantages, including reducing the size, complexity, and cost of machines used to generate proton beams, while also improving their speed, precision, and configurability.

Systems for generating a proton beam include an electromagnetic radiation beam (e.g., a laser) that is directed onto an ion-generating target by optics to form the proton beam. A detector is configured to measure a laser-target interaction property, which a processor uses to produce a feedback signal that can be used to alter the proton beam by adjusting the source of the electromagnetic radiation beam, the optics, or a relative position or orientation of the electromagnetic radiation beam to the ion-generating target. By adjusting the laser-target interaction, the feedback can be used to control properties of the proton beam, such as the proton beam energy or flux. Such systems have certain advantages, including reducing the size, complexity, and cost of machines used to generate proton beams, while also improving their speed, precision, and configurability.

A surface ionizer for a trace detection system includes an extreme ultraviolet light source and an ion transfer line. Activation of the extreme ultraviolet light disrupts a surface of a sample along with residue and ionizes the resulting vapor. The ionized vapor is collected in the ion transfer line and passed into an analysis device for detection of components in the vapor.

Provided is a sample plate for mass spectrometric analysis, which comprises a substrate and a metal thin film formed on the substrate. The metal thin film contains Ag, Al or Cu as the main component and further contains a specific additive element M.sub.Ag, M.sub.Al or M.sub.Cu depending on the element as the main component, in a ratio (M.sub.Ag/Ag) of the total number of atoms of the additive element M.sub.Ag to the number of atoms of Ag of from 0.001 to 0.5, a ratio (M.sub.Al/Al) of the total number of atoms of the additive element M.sub.Al to the number of atoms of Al of from 0.001 to 0.5, or a ratio (M.sub.Cu/Cu) of the total number of atoms of the additive element M.sub.Cu to the number of atoms of Cu of from 0.001 to 0.5.

A photoionization detector is disclosed. The photoionization detector comprises a detector electrode that outputs a signal, an ultraviolet lamp, a lamp driver communicatively coupled to the ultraviolet lamp and configured to turn the ultraviolet lamp on and off in response to a control input, and a controller that is communicatively coupled to the output signal of the detector electrode and to the control input of the lamp driver, that outputs an indication of gas detection based on the output signal of the detector electrode, and that turns the lamp driver on and off with an on duty cycle of less than 10%.

A photoionization detector is disclosed. The photoionization detector comprises a detector electrode that outputs a signal, an ultraviolet lamp, a lamp driver communicatively coupled to the ultraviolet lamp and configured to turn the ultraviolet lamp on and off in response to a control input, and a controller that is communicatively coupled to the output signal of the detector electrode and to the control input of the lamp driver, that outputs an indication of gas detection based on the output signal of the detector electrode, and that turns the lamp driver on and off with an on duty cycle of less than 10%.

Systems for directing a pulsed beam of charged particles include an ion source configured to produce a pulsed ion beam that includes at least one ion bunch. Such systems include an electromagnet for producing an electromagnetic field through which the pulsed ion beam travels, and an automated switch that selectively activates the electromagnet. A source of radiation triggers the automated switch, and at least one processor is configured to activate the electromagnet as the ion bunch traverses the electromagnetic field. Such systems may be useful, for example, for filtering a pulsed ion beam to select ions falling within a desired energy range and/or for providing pulsed ion radiation at desired times.

Systems for generating a proton beam include an electromagnetic radiation beam (e.g., a laser) that is directed onto an ion-generating target by optics to form the proton beam. A detector is configured to measure a laser-target interaction property, which a processor uses to produce a feedback signal that can be used to alter the proton beam by adjusting the source of the electromagnetic radiation beam, the optics, or a relative position or orientation of the electromagnetic radiation beam to the ion-generating target. By adjusting the laser-target interaction, the feedback can be used to control properties of the proton beam, such as the proton beam energy or flux. Such systems have certain advantages, including reducing the size, complexity, and cost of machines used to generate proton beams, while also improving their speed, precision, and configurability.