A method for operating a particle beam generator for a particle beam device, and a particle beam device for carrying out this method, are provided. An extractor voltage may be set to an extractor value using a first variable voltage supply unit. An emission current of the particle beam generator may be measured. When the emission current of the particle beam generator decreases, a suppressor voltage applied to a suppressor electrode may be adjusted using a second variable voltage supply unit such that a specific emission current of the particle beam generator is reached or maintained. When the emission current of the particle beam generator increases, the extractor voltage applied to the extractor electrode may be adjusted using the first variable voltage supply unit such that the specific emission current of the particle beam generator is reached or maintained.

A method for operating a particle beam generator for a particle beam device, and a particle beam device for carrying out this method, are provided. An extractor voltage may be set to an extractor value using a first variable voltage supply unit. An emission current of the particle beam generator may be measured. When the emission current of the particle beam generator decreases, a suppressor voltage applied to a suppressor electrode may be adjusted using a second variable voltage supply unit such that a specific emission current of the particle beam generator is reached or maintained. When the emission current of the particle beam generator increases, the extractor voltage applied to the extractor electrode may be adjusted using the first variable voltage supply unit such that the specific emission current of the particle beam generator is reached or maintained.

An ion beam generator includes an emission electrode, an extraction electrode, and an electricity generator. The emission electrode includes a substrate and a plurality of nanowires extending away from the substrate, substantially towards the extraction electrode, the nanowires having a length of 50 nm to 50 m. The emission electrode has a source of ions including a sheet of ionic liquid formed on the substrate and at least partially immersing the nanowires. The nanowires and the substrate are electrically insulating or semiconducting, and the electricity generator is connected to the sheet of ionic liquid. The emission electrode is thus capable of sending ion beams from the ionic liquid to the extraction electrode.

The present invention has an object to reduce a risk of performance degradation caused to an ion generating device that is being manufactured. An ion generating device (1) includes: a discharge electrode (21) for generating ions by electric discharge, the discharge electrode having (i) a mounting part (33a) for mounting the discharge electrode on the ion generating device and (ii) a brush part including a plurality of linear electrically conductive members, and the mounting part (33a) binding a base end part of the brush part so as to hold the base end part, the ion generating device further including: an insulating sealing member (41) with which to seal the base end part of the mounting part (33a); and a protective resin (29) with which to cover at least a brush base end surface (25t).

The present invention has an object to reduce a risk of performance degradation caused to an ion generating device that is being manufactured. An ion generating device (1) includes: a discharge electrode (21) for generating ions by electric discharge, the discharge electrode having (i) a mounting part (33a) for mounting the discharge electrode on the ion generating device and (ii) a brush part including a plurality of linear electrically conductive members, and the mounting part (33a) binding a base end part of the brush part so as to hold the base end part, the ion generating device further including: an insulating sealing member (41) with which to seal the base end part of the mounting part (33a); and a protective resin (29) with which to cover at least a brush base end surface (25t).

A field emission propulsion system for a spacecraft includes a control unit, a propulsion assembly, and a plurality of extractor electrode voltage sources. The propulsion assembly comprises a plurality of field emission propulsion units having an ion source with a plurality of ion emitters and extractor electrodes associated with the ion emitters and disposed in a field arrangement. The plurality of extractor electrode voltage sources, each associated with the extractor electrodes to control the same, are controlled by the control unit using an individual extractor electrode voltage.

A field emission propulsion system for a spacecraft includes a control unit, a propulsion assembly, and a plurality of extractor electrode voltage sources. The propulsion assembly comprises a plurality of field emission propulsion units having an ion source with a plurality of ion emitters and extractor electrodes associated with the ion emitters and disposed in a field arrangement. The plurality of extractor electrode voltage sources, each associated with the extractor electrodes to control the same, are controlled by the control unit using an individual extractor electrode voltage.

A method and device for destroying and inhibiting exposure to microbes and infection includes a first element and a second element, and a power source. At least one of the elements includes antimicrobial metal, which, when energized by the power source, produces ions that are lethal to microbes. The device can be incorporated into virtually any useful object. During normal use of the object, electrical communication is established between the two elements, causing current supplied from the power source to flow through the antimicrobial metal. The two elements are configured and arranged to ensure that ions flowing from the antimicrobial metal flow through the region in which it is desired to kill microbes. The antimicrobial metal can be on the surface of the element, incorporated into the material making up the element, or provided in any other way that allows the antimicrobial effect to be achieved.

A method and device for destroying and inhibiting exposure to microbes and infection includes a first element and a second element, and a power source. At least one of the elements includes antimicrobial metal, which, when energized by the power source, produces ions that are lethal to microbes. The device can be incorporated into virtually any useful object. During normal use of the object, electrical communication is established between the two elements, causing current supplied from the power source to flow through the antimicrobial metal. The two elements are configured and arranged to ensure that ions flowing from the antimicrobial metal flow through the region in which it is desired to kill microbes. The antimicrobial metal can be on the surface of the element, incorporated into the material making up the element, or provided in any other way that allows the antimicrobial effect to be achieved.

A primary ion source subassembly for use with a secondary ion mass spectrometer may include a unitary graphite ionizer tube and reservoir base. A primary ion source may include a capillary insert defining an ionizer aperture. An ionizer aperture may be centrally arranged in an outwardly protruding conical or frustoconical surface, and may be overlaid with a refractory metal coating or sheath. Parameters including ionizer surface shape, ionizer materials, ionizer temperature, and beam stop plate orifice geometry may be manipulated to eliminate ghost images. A graphite tube gasket with a dual tapered surface, or an externally threaded graphite tubular connecting body, may promote sealing of a source material cavity.