Patent classifications
H01J29/48
ELECTRON PHOTOINJECTOR
A photoinjector system containing modularly-structured waveguide-mode launcher, which is reversibly connected to the RF gun (containing a tubular construction formed with disattachably-affixed to one another structurally-complementary halves); and a solenoid magnet in operation enclosing such tubular structure in a central hollow. The resulting quality, power, and frequency rate of operation as well as cost of manufacturing and operation of the system are superior as compared with those of a related art system.
Multi-grid electron gun with single grid supply
Some embodiments include a system, comprising: a high voltage enclosure; a cathode disposed in the high voltage enclosure; an anode disposed in the high voltage enclosure; a plurality of grids disposed in the high voltage enclosure between the cathode and the anode; a voltage source configured to generate a common grid voltage; and a voltage divider disposed in the high voltage enclosure, configured to generate a plurality of grid voltages based on the common grid voltage, and configured to apply at least two of the grid voltages to the grids.
Multi-grid electron gun with single grid supply
Some embodiments include a system, comprising: a high voltage enclosure; a cathode disposed in the high voltage enclosure; an anode disposed in the high voltage enclosure; a plurality of grids disposed in the high voltage enclosure between the cathode and the anode; a voltage source configured to generate a common grid voltage; and a voltage divider disposed in the high voltage enclosure, configured to generate a plurality of grid voltages based on the common grid voltage, and configured to apply at least two of the grid voltages to the grids.
Electromagnetic interference containment for accelerator systems
An apparatus for coupling to an input connection of an electron gun, the input connection having a heater terminal and a cathode terminal, includes: a connector having a first end and a second end; wherein the first end of the connector is configured to attach to a cable; wherein the second end of the connector is configured to connect to the input connection of the electron gun; and wherein the connector comprises an opening configured to receive the heater terminal of the input connection of the electron gun.
Regulated charged particle beam emitter systems and methods
A beam injector may include a cathode emitter to emit electrons and an electrode to bias at least a portion of the electrons to remain on the cathode emitter and focus the emitted electrons into an electron beam. The beam injector may also include a resistor coupled between the cathode emitter and the electrode and configured to allow self-regulation of a voltage potential on the electrode based at least in part on a current of the electron beam.
ELECTROMAGNETIC INTERFERENCE CONTAINMENT FOR ACCELERATOR SYSTEMS
An apparatus for coupling to an input connection of an electron gun, the input connection having a heater terminal and a cathode terminal, includes: a connector having a first end and a second end; wherein the first end of the connector is configured to attach to a cable; wherein the second end of the connector is configured to connect to the input connection of the electron gun; and wherein the connector comprises an opening configured to receive the heater terminal of the input connection of the electron gun.
Electron gun capable of suppressing the influence of electron emission from the cathode side surface
To suppress both influence of electron emission from a cathode side surface and consumption of energy to be supplied to a heater, while being provided with a grid, an electron gun of the present invention includes: a cathode capable of emitting electrons by heating; a grid capable of controlling the electron emission; and a cathode shield which is an conductor including a material portion located in the vicinity of a side surface of the cathode and facing at least a portion of the side surface via a gap or a heat insulating material, and not being made in direct physical coupling nor in direct physical contact with the cathode.
OPTICALLY ADDRESSED, THERMIONIC ELECTRON BEAM DEVICE
An electron beam source is provided that includes a vessel forming a chamber, a cathode disposed within the chamber, the cathode comprising a low dimensional electrically conductive material having an anisotropic restricted thermal conductivity, an electrode disposed in the chamber, the electrode being connectable to a power source for applying a positive voltage to the electrode relative to the cathode for accelerating free electrons away from the cathode to form an electron beam when the cathode is illuminated by electromagnetic (EM) radiation such that the cathode thermionically emits free electrons, and an electron emission window in the chamber for passing a generated electron beam out of the chamber. An electron microscope that incorporates the electron beam source is also provided.
OPTICALLY ADDRESSED, THERMIONIC ELECTRON BEAM DEVICE
An electron beam source is provided that includes a vessel forming a chamber, a cathode disposed within the chamber, the cathode comprising a low dimensional electrically conductive material having an anisotropic restricted thermal conductivity, an electrode disposed in the chamber, the electrode being connectable to a power source for applying a positive voltage to the electrode relative to the cathode for accelerating free electrons away from the cathode to form an electron beam when the cathode is illuminated by electromagnetic (EM) radiation such that the cathode thermionically emits free electrons, and an electron emission window in the chamber for passing a generated electron beam out of the chamber. An electron microscope that incorporates the electron beam source is also provided.
Electron emission methods to generate electron beams with a narrow energy distribution
This disclosure provides systems, methods, and apparatus related to electron emission. A method includes providing a nanotip field emitter. The nanotip field emitter includes a nanoprotrusion at a tip of the nanotip field emitter. The nanotip field emitter is cooled to a temperature. The temperature is about 80 Kelvin or lower. An electric field is applied between an extraction electrode and the nanotip field emitter to induce emission of electrons from the nanotip field emitter.