A photocathode is formed on a monocrystalline silicon substrate having opposing illuminated (top) and output (bottom) surfaces. To prevent oxidation of the silicon, a thin (e.g., 1-5 nm) boron layer is disposed directly on the output surface using a process that minimizes oxidation and defects. An optional second boron layer is formed on the illuminated (top) surface, and an optional anti-reflective material layer is formed on the second boron layer to enhance entry of photons into the silicon substrate. An optional external potential is generated between the opposing illuminated (top) and output (bottom) surfaces. The photocathode forms part of novel electron-bombarded charge-coupled device (EBCCD) sensors and inspection systems.

A method of controlling the performance of a night vision device includes supplying, by a power supply, to a microchannel plate of a light intensifier tube, a control voltage that controls a gain of the microchannel plate, determining an amount of compensation to apply to the control voltage based on a change to the control voltage attributed to a change in temperature of an operating environment of the night vision device, adjusting the control voltage in accordance with the amount of compensation to obtain a compensated control voltage, and supplying, by the power supply, the compensated control voltage to the microchannel plate of the light intensifier tube. The method may further include determining whether the night vision device has been used for a predetermined amount of time, and only after that predetermined amount of time, is the method configured to supply the compensated control voltage.

A phosphor screen for a Micro-Electro-Mechanical-Systems (MEMS) image intensifier includes a wafer structure, a lattice of interior walls, a thin film phosphor layer, and a reflective metal layer. The wafer structure has a naturally opaque top layer and an active area defined within the naturally opaque top layer. The lattice of interior walls is formed, within the active area, from the naturally opaque top layer. The thin film phosphor layer is disposed in the active area, between the lattice of interior walls. The reflective metal layer that is disposed atop the thin film phosphor layer. In at least some instances, the thin film phosphor layer is a non-particle phosphor layer.

A light intensifier includes a semiconductor structure to multiply electrons and block stray particles. A thin gain substrate layer includes an electron multiplier region that is doped to generate a plurality of electrons for each electron that impinges on an input surface of the gain substrate layer and blocking structures that are doped to direct the plurality of electrons towards emission areas of an emission surface of the gain substrate layer. Respective ribs of a first plurality of ribs on the input surface of the gain substrate layer are vertically aligned with respective blocking structures, and respective blocking structures are vertically aligned with respective ribs of a second plurality of ribs at the emission surface. This alignment directs electrons along a path through the gain substrate layer to reduce noise. The support ribs provide mechanical strength to the gain substrate layer, improving robustness of the light intensifier while minimizing noise.

An image intensifier is provided in which a thin film (090) is arranged between an output surface of the electron multiplier (040) and the phosphorous screen. The thin film is a semi-conductor or insulator with a crystalline structure comprising a band gap equal or larger than 1 eV, wherein the crystalline structure has a carrier diffusion length equal or larger than 50% of the thickness of the thin film. In addition, the thin film has an anode directed surface which has a negative electron affinity. By way of provisioning a thin film of the above type in the image intensifier, an improvement in mean transfer function of the overall image intensifier is obtained.

An image intensifier is provided in which a thin film (090) is arranged between an output surface of the electron multiplier (040) and the phosphorous screen. The thin film is a semi-conductor or insulator with a crystalline structure comprising a band gap equal or larger than 1 eV, wherein the crystalline structure has a carrier diffusion length equal or larger than 50% of the thickness of the thin film. In addition, the thin film has an anode directed surface which has a negative electron affinity. By way of provisioning a thin film of the above type in the image intensifier, an improvement in mean transfer function of the overall image intensifier is obtained.

A light intensifier includes a semiconductor structure to multiply electrons and block stray particles. A thin gain substrate layer includes an electron multiplier region that is doped to generate a plurality of electrons for each electron that impinges on an input surface of the gain substrate layer and blocking structures that are doped to direct the plurality of electrons towards emission areas of an emission surface of the gain substrate layer. Respective ribs of a first plurality of ribs on the input surface of the gain substrate layer are vertically aligned with respective blocking structures, and respective blocking structures are vertically aligned with respective ribs of a second plurality of ribs at the emission surface. This alignment directs electrons along a path through the gain substrate layer to reduce noise. The support ribs provide mechanical strength to the gain substrate layer, improving robustness of the light intensifier while minimizing noise.

Night vision systems that are compact in size due to one or more of the design of the optical system and light detector module.

A neutron imaging system includes a neutron generator, a flight tube, a stage, a neutron imaging module, and a neutron shield. The neutron generator is configured to provide neutrons. The flight tube has an input opening, an output opening, and a flight tube wall extending from the input opening to the output opening. The flight tube is positioned relative to the neutron generator to enable neutrons from the neutron generator to enter the flight tube through the input opening and exit the flight tube through the output opening. The stage is configured to support a sample object at a position to receive neutrons that pass through the entire length of the flight tube and then pass through the output opening of the flight tube. The neutron imaging module has a neutron-sensitive component that is sensitive to neutrons and configured to receive neutrons that pass through the sample object and generate neutron detection signals that can be used to generate an image or video of the sample object. The neutron shield surrounds at least a portion of the flight tube and at least a portion of the neutron imaging module to block at least a portion of stray neutrons that travel toward the neutron-sensitive component of the neutron imaging module, in which the stray neutrons do not enter the flight tube through the input opening of the flight tube.

An image intensifier sensor for acquiring, amplifying and displaying images and including a vacuum envelope, the image intensifier sensor including a photocathode arranged for releasing photoelectrons into the vacuum envelope upon electromagnetic radiation acquired from the images which impinges the photocathode, an anode, spaced apart from and in facing relationship with the photocathode, arranged for receiving the photoelectrons and converting the photoelectrons for displaying the images on the basis thereof, and a power supply unit for providing power to the image intensifier sensor, wherein the image intensifier sensor further includes potting material, wherein the potting material comprises a foam compound.