Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.

A system for imaging an object includes an X-ray source operative to transmit X-rays through the object and a detector to receive the X-ray energy of the X-rays after passing through the object and to generate corresponding object X-ray intensity. The system also includes a controller to measure a detector entrance dose with no object being placed on the X-ray beam path and determine a relationship between an X-ray tube electrical parameter and the detector entrance dose. The controller further determines a relationship between the X-ray tube electrical parameter, the detector entrance dose and a detector average pixel intensity and obtains a normalized air map as a function of the X-ray tube electrical parameter based on calibration image data. The controller also generates an air map based on the normalized air map, the detector entrance dose and the detector average pixel intensity and reconstructs an image of the object based on the air map and the measured object X-ray intensity.

The X-ray tube disclosed herein includes an electron emission unit including an electron emission element using a cold cathode; an anode unit disposed opposite to the electron emission unit, with which electrons emitted from the electron emission unit collide; and a focus structure disposed between the electron emission unit and a target unit disposed on a surface of the anode unit that is opposed to the electron emission unit. The electron emission unit is divided into first and second regions which can independently be turned ON/OFF. The X-ray tube is focus-designed such that collision regions, at the anode unit, of electron beams emitted from the respective first and second regions substantially coincide with each other.

A radiation generator may include an elongate generator housing having a proximal end and a distal end, a target electrode within the elongate generator housing at the distal end thereof, a charged particle source within the elongate generator housing at the proximal end thereof to direct charged particles at the target electrode. A plurality of accelerator electrodes may be spaced apart within the elongate generator housing between the target electrode and the charged particle source to define a charged particle accelerator section. Each accelerator electrode may include an annular portion having a first opening therein, and a frustoconical portion having a base coupled to the first opening of the annular portion and having a second opening so that charged particles from the charged particle source pass through the first and second openings to reach the target electrode.

The present invention provides a bright, focused visible light source that is part of a visible light alignment assembly that is coupled to an X-ray generator. The visible light source projects a bright, focused visible light beam from the X-ray generator through a collimator and object or part to be radiographed and to a detector or film, just as a subsequent X-ray beam eventually is. This allows the operator to quickly and easily visually assess the eventual position and coverage or spread of the X-ray beam and align the X-ray generator, collimator, object or part to be radiographed, and/or detector or film, with a minimum of test radiographs.

A portable XRF analyzer includes a hand shield to substantially block x-rays from impinging on a hand of a user. The portable XRF analyzer includes a heat sink over an x-ray source and a heat sink over an x-ray detector. The heat sinks are separated from each other by a thermally insulative material.

Provided is an arc-shaped multi-focal point fixed anode gate controlled ray source, comprising an arc-shaped ray source housing, a ray tube bracket, a plurality of fixed anode reflected ray tubes and a plurality of gate controlled switches, wherein the plurality of fixed anode reflected ray tubes are fixed on the arc-shaped ray source housing by means of the ray tube bracket, and the focal points of the plurality of fixed anode reflected ray tubes are distributed on the same distribution circle; and the plurality of gate controlled switches are correspondingly connected to the plurality of fixed anode reflected ray tubes. By splicing the plurality of arc-shaped multi-focal point fixed anode gate controlled ray sources into an integral ring stricture, the focal points of all the fixed anode reflected ray tubes therein can be distributed on, the same distribution circle.

An on-chip miniature X-ray source, comprising: an on-chip miniature electron source (10); a first insulating spacer (11) located on one side of the on-chip miniature electron source (10) emitting electrons, the first insulating spacer (11) being of a cavity structure; and an anode (12) located on the first insulating spacer (11), a closed vacuum cavity being formed between the on-chip miniature electron source (10) and the anode (12). The on-chip miniature electron source can be obtained by means of a micromachining technique, further reducing the size thereof, and reducing the manufacturing costs. The on-chip miniature X-ray source has the advantages of stable X-ray dose, low operation vacuum requirement, fast switch response, integrated and mass processing, etc. and can be used in various types of small and portable X-ray detection, analysis and treatment devices.

A method is for closed-loop control of an X-ray pulse chain generated via a linear accelerator system. In an embodiment, the method includes modulating a first electron beam within a first radio-frequency pulse duration, wherein the first multiple amplitude X-ray pulse is produced on modulating the first electron beam; measuring time-resolved actual values of the first multiple amplitude X-ray pulse; adjusting at least one pulse parameter as a function of a comparison of the specified multiple amplitude X-ray pulse profile and the measured time-resolved actual values; and modulating a second electron beam within a second radio-frequency pulse duration as a function of the at least one adjusted pulse parameter for production of the second multiple amplitude X-ray pulse, so the X-ray pulse chain is controlled.

Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.