In-situ methods for the batch fabrication of flat-panel micro-channel plate (MCP) photomultiplier tube (PMT) detectors (MCP-PMTs), without transporting either the window or the detector assembly inside a vacuum vessel are provided. The method allows for the synthesis of a reflection-mode photocathode on the entrance to the pores of a first MCP or the synthesis of a transmission-mode photocathode on the vacuum side of a photodetector entrance window.

In-situ methods for the batch fabrication of flat-panel micro-channel plate (MCP) photomultiplier tube (PMT) detectors (MCP-PMTs), without transporting either the window or the detector assembly inside a vacuum vessel are provided. The method allows for the synthesis of a reflection-mode photocathode on the entrance to the pores of a first MCP or the synthesis of a transmission-mode photocathode on the vacuum side of a photodetector entrance window.

An ion detector for a mass and/or ion mobility spectrometer is disclosed. The ion detector comprises a dynode arranged and configured such that primary ions to be detected by the ion detector impact upon the dynode and generate first electrons and secondary positive ions, an electron detector arranged and configured to attract and detect said first electrons, and an apertured electrode. The apertured electrode comprises a plurality of apertures and is arranged and configured such that at least some of said secondary positive ions pass through the apertures of the electrode.

A method for determining a performance parameter of an electron multiplier having a series of electron emissive surfaces forming electron multiplication chain, by comparing a first electron flux of a first electron emissive surface of the electron multiplication chain with a second electron flux of a second electron emissive surface of the electron multiplication chain, or of an electron collector of the electron multiplier. A method of operating an electron multiplier and an electron multiplier or an electron multiplication system is also described.

A method for determining a performance parameter of an electron multiplier having a series of electron emissive surfaces forming electron multiplication chain, by comparing a first electron flux of a first electron emissive surface of the electron multiplication chain with a second electron flux of a second electron emissive surface of the electron multiplication chain, or of an electron collector of the electron multiplier. A method of operating an electron multiplier and an electron multiplier or an electron multiplication system is also described.