H01J43/30

DISCHARGE REDUCTION IN SEALED COMPONENTS
20220148865 · 2022-05-12 ·

Systems and methods for partial discharge reduction are provided. The systems and methods can receive an input voltage at a high voltage sensor configured within a sealed sensor assembly. The input voltage can be received via a discharge reduction of the sealed sensor assembly. The discharge reduction circuit can reduce an incidence of discharge associated with an ionization breakdown of an air gap between an output circuit of the sealed sensor assembly and an insulator conveying the output circuit through a hermetic barrier of the sealed sensor assembly.

ELEMENTARY PARTICLE DETECTOR
20220082709 · 2022-03-17 ·

An elementary particle detector including first sensors able to measure an amount of electric charge on electrodes of a readout plate and a processing unit able to determine the location of an avalanche of secondary electrons from the amount of electric charge measured by the first sensors and from the known location of the electrodes. The detector also includes at least one second sensor, each second sensor being able to measure an electrical signal produced by the secondary electrons when they pass through a conductive gate. The processing unit is additionally able to establish an arrival time of the elementary particle from a time at which the electrical signal is measured by the second sensor.

AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT METHOD
20210310933 · 2021-10-07 ·

Provided are an automatic analyzer and an optical measurement method for correcting a variation in the multiplication factor of a photoelectric element with high accuracy. The automatic analyzer comprises: a photoelectric element which generates electrons by light and outputs a current signal; a voltage application unit which applies a voltage to the photoelectric element; and a processing unit which corrects a variation in the multiplication factor of the photoelectric element, wherein the photoelectric element outputs a pulse signal as the current signal, and the processing unit corrects the variation in the multiplication factor on the basis of the pulse area of the pulse signal.

SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION
20210104388 · 2021-04-08 ·

A photomultiplier tube (PMT) detector assembly includes a PMT and an analog PMT detector circuit. The PMT includes a photocathode configured to emit an initial set of photoelectrons in response to an absorption of photons. The PMT includes a dynode chain with a plurality of dynodes. The dynode chain is configured to receive the initial set of photoelectrons, generate at least one amplified set of photoelectrons, and direct the at least one amplified set of photoelectrons. The PMT includes an anode configured to receive the at least one amplified set of photoelectrons, with a digitized image being generated based on a measurement of the final amplified set of photoelectrons. The digitized image is corrected by applying an output of the signal measured by the analog PMT detector circuit to the digitized image.

SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION
20210104388 · 2021-04-08 ·

A photomultiplier tube (PMT) detector assembly includes a PMT and an analog PMT detector circuit. The PMT includes a photocathode configured to emit an initial set of photoelectrons in response to an absorption of photons. The PMT includes a dynode chain with a plurality of dynodes. The dynode chain is configured to receive the initial set of photoelectrons, generate at least one amplified set of photoelectrons, and direct the at least one amplified set of photoelectrons. The PMT includes an anode configured to receive the at least one amplified set of photoelectrons, with a digitized image being generated based on a measurement of the final amplified set of photoelectrons. The digitized image is corrected by applying an output of the signal measured by the analog PMT detector circuit to the digitized image.

Ion detectors and methods of using them

Certain embodiments described herein are directed to ion detectors and systems. In some examples, the ion detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In other configurations, each dynode can be coupled to a respective electrometer. Methods using the ion detectors are also described.

Ion detectors and methods of using them

Certain embodiments described herein are directed to ion detectors and systems. In some examples, the ion detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In other configurations, each dynode can be coupled to a respective electrometer. Methods using the ion detectors are also described.

Electron multipliers
10916413 · 2021-02-09 · ·

An apparatus for amplifying an electron signal caused by the impact of a particle with an electron emissive surface. The apparatus includes: a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons, a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces. The bias voltage(s) is sufficient to form the amplified electron signal. The apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s). The apparatus may be used as part of detector in a mass spectrometer, for example.

IMPROVED CHARGED PARTICLE DETECTOR
20200194246 · 2020-06-18 ·

Components of scientific analytical equipment and to complete items of analytic equipment. An apparatus and methods useful for detecting an ion in mass spectrometry applications are provided. The apparatus may include an electron multiplier having a high sensitivity and low sensitivity sections, or the combination of an electron multiplier with a separately powered conversion dynode (and particularly a high energy conversion dynode), or the combination of a conversion dynode that is physically incorporated within or about an electron multiplier.

IMPROVED CHARGED PARTICLE DETECTOR
20200194246 · 2020-06-18 ·

Components of scientific analytical equipment and to complete items of analytic equipment. An apparatus and methods useful for detecting an ion in mass spectrometry applications are provided. The apparatus may include an electron multiplier having a high sensitivity and low sensitivity sections, or the combination of an electron multiplier with a separately powered conversion dynode (and particularly a high energy conversion dynode), or the combination of a conversion dynode that is physically incorporated within or about an electron multiplier.