An ion detector includes a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon and multiply and output the generated secondary electrons; a plurality of electron impact-type diodes configured to have effective regions narrower than an effective region of the microchannel plate, receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons; a focus electrode configured to be disposed between the microchannel plate and the electron impact-type diodes and focus the secondary electrons toward the electron impact-type diodes; and a voltage supply part configured to apply a drive voltage to each of the plurality of electron impact-type diodes.

A mass spectrometer is disclosed comprising an ion optics device housing having one or more external electrical connectors (1719) provided thereon. An ion optics device (301) is arranged inside the ion optics device housing, the ion optics device (301) comprising one or more electrodes for manipulating ions, the one or more electrodes being electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing. A voltage supply housing (1717) is provided having one or more external electrical connectors provided thereon. One or more voltage supplies are arranged inside the voltage supply housing (1717), the one or more voltage supplies being in electrical communication with the one or more external electrical connectors provided on the voltage supply housing. The one or more external electrical connectors provided on the voltage supply housing are directly physically and electrically connected to the one or more external electrical connectors (1719) provided on the ion optics device housing.

A dual-mode ion detector for a mass and/or ion mobility spectrometer comprising a first conversion electrode (20) that is maintained, in use, at a negative potential and arranged for converting incident positive ions (32) into secondary electrons (34), and a second conversion electrode (22) that is maintained, in use, at a positive potential and arranged for converting incident negative ions (42) into secondary positive ions (44) and/or secondary electrons (74). The detector also comprises an electron detecting surface (26) and an entrance electrode (24) for drawing ions into the ion detector. The ion detector is switchable between a first mode for detecting positive ions and a second mode for detecting negative ions.

Ultrasensitive, miniaturized, and inexpensive ion and ionizing radiation detection devices are provided. The devices include an insulating substrate, metallic contact pads disposed on a surface of the substrate, and a strip of an ultrathin two-dimensional material having a thickness of one or a few atomic layers. The strip is in contact with the contact pads, and a voltage is applied across the two-dimensional sensor material. Individual ions contacting the two-dimensional material alter the current flowing through the material and are detected. The devices can be used in a network of monitors for high energy ions and ionizing radiation.

The resolution of a TOF mass analyzer is maintained despite a loss of resolution in one or more channels of a multichannel ion detection system by selecting the highest resolution channels for qualitative analysis. Ion packets that impact a multichannel detector are converted into multiplied electrons and emitted from two or more segmented electrodes that correspond to impacts in different regions across a length of the detector. The electrons received by each electrode of the two or more segmented electrodes for each ion packet are converted into digital values in a channel of a multichannel digitizer, producing digital values for at least two or more channels Qualitative information about the ion packets is calculated using digital values of a predetermined subset of one or more channels of the at least two or more channels known to provide the highest resolution.

A method of ion imaging is disclosed that includes automatically sampling a plurality of different locations on a sample using a front device which is arranged and adapted to generate aerosol, smoke or vapour from the sample. Mass spectral data and/or ion mobility data corresponding to each location is obtained and the obtained mass spectral data and/or ion mobility data is used to construct, train or improved a sample classification model.

A method is disclosed comprising providing a biological sample on a swab, directing a spray of charged droplets onto a surface of the swab in order to generate a plurality of analyte ions, and analysing the analyte ions.

A technique for accurately determining a performance of a single detector detecting ions having passed through ap mass analysis unit. A mass analysis system includes, a first converter configured to calculate a first measured value based on an intensity and an area of a pulse in an electric signal output from the detector configured to detect the ions having passed through the mass analysis unit, a second converter configured to obtain a second measured value by counting the number of pulses of the electric signal, a calculation unit configured to calculate an A/P ratio indicating a ratio of the first measured value to the second measured value, a determination unit configured to determine a performance of the detector based on a value of the A/P ratio, and a control unit configured to control at least an output of a determination result obtained by the determination unit.

The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65. Negative ions entering form the ion entrance 62 are attracted to and collide with the negative ion CD 53 to generate positive ions. The generated positive ions collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 and are detected by the photomultiplier tube 58.