Disclosed are various embodiments for transferring molecules from a surface for mass spectrometry and other sample analysis methods, and the like. A laser is focused onto a tip of an atomic force microscope to remove and capture a quantity of molecules from the surface, so they can be transferred to a mass spectrometer or another instrument for analysis.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

Disclosed herein are systems and methods for mass spectrometry using laserspray ionization (LSI). LSI can create multiply-charged ions at atmospheric pressure for analysis and allows for analysis of high molecular weight molecules including molecules over 4000 Daltons. The analysis can be solvent-based or solvent-free. Solvent-free analysis following LSI allows for improved spatial resolution beneficial in surface and/or tissue imaging.

A method of mass spectrometry or ion mobility spectrometry is disclosed in which analyte ions of a desired charge state are isolated. The method comprises: separating analytes according to their electrophoretic mobility; ionising the analytes; and mass filtering the resulting analyte ions, wherein the mass to charge ratios of the ions transmitted by a mass filter are varied as a function of the electrophoretic mobility and according to a predetermined relationship such that substantially only ions having said desired charge state are transmitted by the mass filter.

A cylindrically-shaped auxiliary electrode and a cylindrically-shaped reflecting electrode are located anterior to a spray flow ejected from an ESI ionization probe. An inlet end of a heated capillary extends into the space between the two electrodes. The auxiliary electrode and heated capillary are grounded, while the reflecting electrode is supplied with a direct-current voltage having the same polarity as measurement target ions. As a result, a reflecting electric field which reflects ions originating from sample components and charged droplets, being carried by the spray flow, is created within the space between the two electrodes. A focusing electric field for focusing ions onto the inlet end is also created in an area near the inlet end. The ions originating from sample components are thereby separated from the gas flow and gathered around the inlet end, to be drawn into the heated capillary and sent into a vacuum chamber.

In a device adjustment process, when a solenoid valve is opened, a gas resulting from vaporization of PFTBA held in a container is drawn into an ion source, a relationship between ambient temperature and a correction coefficient for actual signal values is experimentally determined beforehand. In an actual adjustment process, an ambient temperature acquirer reads the ambient temperature and refers to the correction information to determine the correction coefficient corresponding to the ambient temperature at that moment. A signal value corrector multiplies an actually measured peak area value by the correction coefficient to correct the actual signal value. A device adjustment controller adjusts a voltage applied to an ion detector so that the corrected actual signal value matches with a reference signal value. The voltage applied to the ion detector can be thereby adjusted so that the detector has the same level of gain independent of the ambient temperature.

A sample is ionized using an ion source and the ion beam is received using a tandem mass spectrometer. An m/z range is divided into two or more precursor ion isolation windows. Two or more values for a fragmentation parameter are selected. A first value of the two or more values for the fragmentation parameter has a level that fragments a minimal amount of ions of the ion beam. The one or more additional values have increasingly aggressive levels that produce increasingly more fragmentation of the ions of the ion beam. For each precursor ion isolation window, the tandem mass spectrometer is instructed to perform a selection and fragmentation of the ion beam using the precursor ion isolation window and the first value and is instructed to perform one or more additional selections and fragmentations of the ion beam using the precursor ion isolation window and using the one or more additional values.

A sample is ionized using an ion source and the ion beam is received using a tandem mass spectrometer. An m/z range is divided into two or more precursor ion isolation windows. Two or more values for a fragmentation parameter are selected. A first value of the two or more values for the fragmentation parameter has a level that fragments a minimal amount of ions of the ion beam. The one or more additional values have increasingly aggressive levels that produce increasingly more fragmentation of the ions of the ion beam. For each precursor ion isolation window, the tandem mass spectrometer is instructed to perform a selection and fragmentation of the ion beam using the precursor ion isolation window and the first value and is instructed to perform one or more additional selections and fragmentations of the ion beam using the precursor ion isolation window and using the one or more additional values.

The invention generally relates to probes, systems, cartridges, and methods of use thereof. In certain embodiments, the invention provides a probe including a porous material and a hollow member coupled to a distal portion of the porous material.