H01J49/10

Sample analysis for mass cytometry
11630050 · 2023-04-18 · ·

The invention relates to methods and devices for analysis of samples using laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). The invention provides methods and devices in which individual ablation plumes are distinctively captured and transferred to the ICP, followed by analysis by mass cytometry.

Inductively coupled plasma mass spectrometry (ICP-MS) with improved signal-to-noise and signal-to-background ratios

In an inductively coupled plasma-mass spectrometry (ICP-MS) system, ions are transmitted into a collision/reaction cell. A DC potential is applied at an exit of the cell at a first magnitude to generate a DC potential barrier effective to prevent the ions from exiting the cell. The DC potential barrier is maintained during a confinement period to perform an interaction. After the confinement period, analyte ions or product ions are transmitted to a mass spectrometer by switching the exit DC potential to a second magnitude effective to allow the analyte ions or product ions to pass through the cell exit as a pulse. The analyte ions or product ions are then counted during a measurement period. The interaction may be ion-molecule reactions or ion-molecule collisions.

Integrated electrospray ion source

In one aspect, an ion source for use in a mass spectrometry system is disclosed, which comprises a housing, a first and a second ion probe coupled to said housing, and a first and a second emitter configured for coupling, respectively, to said first and second ion probes. The first ion probe is configured for receiving a sample at a flow rate in nanoflow regime and the second ion probe is configured for receiving a sample at a flow rate above the nanoflow regime. Each of the ion probes includes a discharge end (herein also referred to as the discharge tip) for ionizing at least one constituent of the received sample. In some embodiment, each ion probe receives the sample from a liquid chromatography (LC) column. Further, the ion probes can be interchangeably disposed within the housing.

Method for simultaneously measuring the value of forsterite and trace elements in olivine

The present disclosure provides a method for simultaneously measuring the value of forsterite and trace elements in olivine, comprising the following steps: Step S1: selecting samples, wherein the samples are olivine samples; Step S2: placing the samples in a sample chamber of LA-ICP-MS, and adjusting the position of the samples in the optical axis direction so that the laser beam is well focused; Step S3: optimizing the instrument to make the signal-to-noise ratio of .sup.57Fe be the best; Step S4: adopting LA-ICP-MS peak hopping mode and receiving all the mass peaks of the samples by single electron multiplier (SEM). The present disclosure overcomes the disadvantages of long test cycle and high test cost in the prior art.

DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING THE SAME

Provided are ion detectors and systems that may employ such ion detectors such as mass spectrometers and other instruments. The ion detectors include a deflector that serves to generate an electric field with designed shape and strength that causes the ions passing into the detector to move along a deflection path. By selectively deflecting the charged ions from an initial propagation axis, the deflector effectively removes unwanted neutral particles from the ion path and reduces background in the resulting spectra.

DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING THE SAME

Provided are ion detectors and systems that may employ such ion detectors such as mass spectrometers and other instruments. The ion detectors include a deflector that serves to generate an electric field with designed shape and strength that causes the ions passing into the detector to move along a deflection path. By selectively deflecting the charged ions from an initial propagation axis, the deflector effectively removes unwanted neutral particles from the ion path and reduces background in the resulting spectra.

QUANTITATION OF TAMOXIFEN AND METABOLITES THEREOF BY MASS SPECTROMETRY

Provided are methods for determining the amount of tamoxifen and its metabolites in a sample by mass spectrometry. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen and other tamoxifen metabolites. In some aspects, the methods provided herein determine the amount of tamoxifen, N-Desmethyl Tamoxifen, and other tamoxifen metabolites.

QUANTITATION OF TAMOXIFEN AND METABOLITES THEREOF BY MASS SPECTROMETRY

Provided are methods for determining the amount of tamoxifen and its metabolites in a sample by mass spectrometry. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen and other tamoxifen metabolites. In some aspects, the methods provided herein determine the amount of tamoxifen, N-Desmethyl Tamoxifen, and other tamoxifen metabolites.

SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTING WAFER

Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.

Spray chamber, sample atomization and introduction device, analysis device, and method of analyzing component in sample

Provided is a spray chamber including a sample introduction port portion into which a gas flow containing sample droplets that have been atomized by a nebulizer is introduced, a discharge port portion that discharges at least a part of the gas flow introduced into the sample introduction port portion to the outside, and a flow passage tube portion that has the sample introduction port portion on one end portion thereof and the discharge port portion on the other end portion thereof and serves as a flow passage for the introduced gas flow, wherein the flow passage tube portion includes a first tube portion having the discharge port portion on one end portion thereof and a second tube portion having the sample introduction port portion on one end portion thereof, the spray chamber includes a double tube portion.