The invention generally relates to mass spectrometers that utilize ionic wind and methods of use thereof.

The invention generally relates to mass spectrometers that utilize ionic wind and methods of use thereof.

A gas analyzer and a method for performing mass spectrometry analysis includes a membrane configured to receive an input flow of carrier gas. The membrane defines a variable thickness region between first and second positions along an input face of the membrane and separates the analyte sample into an output flow of analyte molecules. A mass spectrometer is disposed downstream of the membrane and includes an input orifice for receiving the output flow. The mass spectrometer is configured to perform a response profile analysis of the analyte molecules in the sample analyte.

A gas analyzer and a method for performing mass spectrometry analysis includes a membrane configured to receive an input flow of carrier gas. The membrane defines a variable thickness region between first and second positions along an input face of the membrane and separates the analyte sample into an output flow of analyte molecules. A mass spectrometer is disposed downstream of the membrane and includes an input orifice for receiving the output flow. The mass spectrometer is configured to perform a response profile analysis of the analyte molecules in the sample analyte.

In a system for processing gas, a gas analyzer in a gas analyzer chamber measures a quantity of ions generated from a gas. An ionization source includes an ionization chamber and an electron source for generating ions for the gas analyzer. The ionization chamber encompasses an ionization region in which particles of the gas are charged to form the ions. A channel directs the gas from a gas source into the ionization chamber, and the channel extends to a surface of the ionization chamber. An ionization source vacuum pump is in gaseous communication with the ionization chamber via a substantially large opening, and operates to draw gas from the ionization chamber.

In a system for processing gas, a gas analyzer in a gas analyzer chamber measures a quantity of ions generated from a gas. An ionization source includes an ionization chamber and an electron source for generating ions for the gas analyzer. The ionization chamber encompasses an ionization region in which particles of the gas are charged to form the ions. A channel directs the gas from a gas source into the ionization chamber, and the channel extends to a surface of the ionization chamber. An ionization source vacuum pump is in gaseous communication with the ionization chamber via a substantially large opening, and operates to draw gas from the ionization chamber.

The present mass spectrometer has one or more intermediate vacuum chambers between an ion source to generate ions derived from a sample component in an atmospheric pressure atmosphere and a vacuum chamber where a mass separator is arranged, including an ion transport unit to have an ion outlet in a first intermediate vacuum chamber at a subsequent stage of the ion source and send ions to the first chamber, an exhaust opening portion to evacuate the first chamber, which is provided in front of ion flow discharged from the ion outlet into the first chamber, an ion delivery opening portion to send ions to a next stage, which is provided on a line intersecting a straight line connecting the ion outlet and the exhaust opening portion, and an ion guide to guide ions to the ion delivery opening portion by an action of a radio-frequency electric field.

The present mass spectrometer has one or more intermediate vacuum chambers between an ion source to generate ions derived from a sample component in an atmospheric pressure atmosphere and a vacuum chamber where a mass separator is arranged, including an ion transport unit to have an ion outlet in a first intermediate vacuum chamber at a subsequent stage of the ion source and send ions to the first chamber, an exhaust opening portion to evacuate the first chamber, which is provided in front of ion flow discharged from the ion outlet into the first chamber, an ion delivery opening portion to send ions to a next stage, which is provided on a line intersecting a straight line connecting the ion outlet and the exhaust opening portion, and an ion guide to guide ions to the ion delivery opening portion by an action of a radio-frequency electric field.

The invention relates to a mass spectrometer, a mass spectrometry method and a detection system. The mass spectrometer includes a vacuum chamber having a working pressure being 0.1 Pa≤P≤10 Pa; a linear ion trap, arranged in the vacuum chamber, wherein a field radius r of the linear ion trap is r≤5 mm; and a power supply, configured to provide a radio-frequency voltage for the linear ion trap, a frequency f of the radio-frequency voltage being 2 MHz≤f≤10 MHz. Because a vacuum level is relatively low, this vacuum condition may be realized by selecting a roughing pump for evacuating; and compared with a combined pump unit which is generally selected by a traditional mass spectrometer using the linear ion trap and is composed of a turbo molecular pump and a roughing pump, the roughing pump has a lower pumping speed, smaller size and lower manufacturing cost.

The invention relates to a mass spectrometer, a mass spectrometry method and a detection system. The mass spectrometer includes a vacuum chamber having a working pressure being 0.1 Pa≤P≤10 Pa; a linear ion trap, arranged in the vacuum chamber, wherein a field radius r of the linear ion trap is r≤5 mm; and a power supply, configured to provide a radio-frequency voltage for the linear ion trap, a frequency f of the radio-frequency voltage being 2 MHz≤f≤10 MHz. Because a vacuum level is relatively low, this vacuum condition may be realized by selecting a roughing pump for evacuating; and compared with a combined pump unit which is generally selected by a traditional mass spectrometer using the linear ion trap and is composed of a turbo molecular pump and a roughing pump, the roughing pump has a lower pumping speed, smaller size and lower manufacturing cost.