H01J49/24

TIME-OF-FLIGHT MASS ANALYSERS

The present invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer wherein the time-of-flight mass spectrometer is contained within the vacuum chamber. The time-of-flight mass spectrometer comprising a first electrode and a second electrode, the second electrode being spaced apart from the first electrode at a distance defining a portion of an ion-flight path therebetween. The assembly further comprising a first support for supporting the first electrode, the first support arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to permit relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The present invention also relates to a multi-reflection time-of-flight mass analyser. The present invention also relates to an apparatus for out-gassing to remove contaminants from surfaces within a vacuum chamber by heating and subsequently cooling the surfaces.

TIME-OF-FLIGHT MASS ANALYSERS

The present invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer wherein the time-of-flight mass spectrometer is contained within the vacuum chamber. The time-of-flight mass spectrometer comprising a first electrode and a second electrode, the second electrode being spaced apart from the first electrode at a distance defining a portion of an ion-flight path therebetween. The assembly further comprising a first support for supporting the first electrode, the first support arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to permit relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The present invention also relates to a multi-reflection time-of-flight mass analyser. The present invention also relates to an apparatus for out-gassing to remove contaminants from surfaces within a vacuum chamber by heating and subsequently cooling the surfaces.

MASS SPECTROMETER
20220406588 · 2022-12-22 · ·

A mass spectrometer 1 includes a vacuum container 5 divided into a first chamber 51 containing an ion trap 3 and a second chamber 52 containing a time-of-flight mass spectrometer 4. The ion trap 3 is held within an ion-trap-holding space 610 surrounded by a wall 61. In this wall 61, a cooling-gas discharge port 64 is formed in addition to an introduction-side ion passage port 62 and an ejection-side ion passage port 63. A cooling gas supplied into an ion-capturing space 315 of the ion trap 3 is discharged from the ion-trap-holding space 610 through the three ports. The provision of the cooling-gas discharge port 64 reduces the amount of cooling gas flowing into the ejection-side ion passage port 63 and interfering with the ejection of ions from the ion trap 3 into the time-of-flight mass spectrometer 4. Consequently, the detection intensity of the ions is improved.

MASS SPECTROMETER
20220406588 · 2022-12-22 · ·

A mass spectrometer 1 includes a vacuum container 5 divided into a first chamber 51 containing an ion trap 3 and a second chamber 52 containing a time-of-flight mass spectrometer 4. The ion trap 3 is held within an ion-trap-holding space 610 surrounded by a wall 61. In this wall 61, a cooling-gas discharge port 64 is formed in addition to an introduction-side ion passage port 62 and an ejection-side ion passage port 63. A cooling gas supplied into an ion-capturing space 315 of the ion trap 3 is discharged from the ion-trap-holding space 610 through the three ports. The provision of the cooling-gas discharge port 64 reduces the amount of cooling gas flowing into the ejection-side ion passage port 63 and interfering with the ejection of ions from the ion trap 3 into the time-of-flight mass spectrometer 4. Consequently, the detection intensity of the ions is improved.

COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

A mass spectrometry method comprises: (1) introducing ions and gas into an first electrode section of an ion transport apparatus through a slot of an ion transfer tube, the ion tunnel section comprising a first longitudinal axis that is contained within a slot plane of the ion transfer tube, the first longitudinal axis not intersecting an outlet of the ion transfer tube, wherein the apparatus further comprises: (a) a second electrode section configured to receive the ions from the first electrode section and comprising a second longitudinal axis that is not coincident with the first longitudinal axis; and (b) an ion outlet aperture; (2) providing voltages to electrodes of the ion transport apparatus that urge the ions to migrate towards the first longitudinal axis within the first electrode section; and (3) exhausting gas through a port that is offset from the ion outlet aperture.

COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

A mass spectrometry method comprises: (1) introducing ions and gas into an first electrode section of an ion transport apparatus through a slot of an ion transfer tube, the ion tunnel section comprising a first longitudinal axis that is contained within a slot plane of the ion transfer tube, the first longitudinal axis not intersecting an outlet of the ion transfer tube, wherein the apparatus further comprises: (a) a second electrode section configured to receive the ions from the first electrode section and comprising a second longitudinal axis that is not coincident with the first longitudinal axis; and (b) an ion outlet aperture; (2) providing voltages to electrodes of the ion transport apparatus that urge the ions to migrate towards the first longitudinal axis within the first electrode section; and (3) exhausting gas through a port that is offset from the ion outlet aperture.

Ion confinement device
11521844 · 2022-12-06 · ·

An ion confinement device (2) comprising: a plurality of electrodes arranged and configured for confining ions when an AC or RF voltage is applied thereto; and at least one inductive ballast (10a,10b), each ballast connected to at least some of said electrodes so as to form a resonator circuit therewith.

Ion confinement device
11521844 · 2022-12-06 · ·

An ion confinement device (2) comprising: a plurality of electrodes arranged and configured for confining ions when an AC or RF voltage is applied thereto; and at least one inductive ballast (10a,10b), each ballast connected to at least some of said electrodes so as to form a resonator circuit therewith.

Spectrometric analysis

A method of spectrometric analysis comprises obtaining one or more sample spectra for an aerosol, smoke or vapour sample. The one or more sample spectra are subjected to pre-processing and then multivariate and/or library based analysis so as to classify the aerosol, smoke or vapour sample. The results of the analysis are used for various surgical or non-surgical applications.

Spectrometric analysis

A method of spectrometric analysis comprises obtaining one or more sample spectra for an aerosol, smoke or vapour sample. The one or more sample spectra are subjected to pre-processing and then multivariate and/or library based analysis so as to classify the aerosol, smoke or vapour sample. The results of the analysis are used for various surgical or non-surgical applications.