A method and system for measuring an inert gas by an ion probe. Embedding a to-be-measured sample into an epoxy resin, to obtain a sample target, where the to-be-measured sample includes an inert gas atom; after putting the obtained sample target into an analysis chamber of the ion probe, vacuumizing the analysis chamber, where the ion probe includes a primary ion source, an electron gun, a mass analyzer, and an ion detector; bombarding the sample target by using a primary ion beam formed by the primary ion source to release the inert gas atom in the sample target; ionizing the released inert gas atom by using an electron beam formed by the electron gun to form an inert gas ion; and analyzing a secondary ion containing the inert gas ion by using the mass analyzer and the ion detector to achieve measurement of the inert gas.

An ion mobility separation apparatus comprises: a compartment having a gas therein; an electrode structure comprising a first plurality of electrodes within the compartment, the electrode structure defining a longitudinal axis; one or more power supplies electrically coupled to the electrodes, wherein the plurality of electrodes and the power supply are configured to maintain an electrical pseudopotential well encompassing and disposed parallel to the longitudinal axis and to maintain an electric field directed parallel to the longitudinal axis; an entrance ion gate disposed at a first end of the longitudinal axis; an exit ion gate disposed at a second end of the longitudinal axis; and at least one additional ion gate disposed between the entrance and exit ion gates.

An ion mobility separation apparatus comprises: a compartment having a gas therein; an electrode structure comprising a first plurality of electrodes within the compartment, the electrode structure defining a longitudinal axis; one or more power supplies electrically coupled to the electrodes, wherein the plurality of electrodes and the power supply are configured to maintain an electrical pseudopotential well encompassing and disposed parallel to the longitudinal axis and to maintain an electric field directed parallel to the longitudinal axis; an entrance ion gate disposed at a first end of the longitudinal axis; an exit ion gate disposed at a second end of the longitudinal axis; and at least one additional ion gate disposed between the entrance and exit ion gates.

Disclosed herein are embodiments of a system for selectively ionizing samples that may comprise a plurality of different analytes that are not normally detectable using the same ionization technique. The disclosed system comprises a unique split flow tube that can be coupled with a plurality of ionization sources to facilitate using different ionization techniques for the same sample. Also disclosed herein are embodiments of a method for determining the presence of analytes in a sample, wherein the number and type of detectable analytes that can be identified is increased and sensitivity and selectivity are not sacrificed.

A zircon ID-TIMDS Pb isotope determination method by multiple ion counters with a dynamic multi-collection protocol is provided. Compared with a commonly used multi-ion counter static determination method, the method provided by the present invention completely eliminates influences of gain differences of the different ion counters on determination results of Pb isotopes. Compared with a conventional single-ion counter determination method with five times of peak-jumps, the method provided by the present invention can obtain all of Pb isotope ratios with two times of peak-jumps, which increases the collection efficiency of Pb isotope ion beams and decreases influences of ion beam stability on Pb isotope analysis results. Consequently, compared with a multi-ion counter static method and a single-ion counter peak-jumping method, the method provided by the present invention improves the Pb isotope analysis precision for the single-grain zircon ID-TIMS U—Pb dating method (with a .sup.205Pb tracer), having application potentials.

A zircon ID-TIMDS Pb isotope determination method by multiple ion counters with a dynamic multi-collection protocol is provided. Compared with a commonly used multi-ion counter static determination method, the method provided by the present invention completely eliminates influences of gain differences of the different ion counters on determination results of Pb isotopes. Compared with a conventional single-ion counter determination method with five times of peak-jumps, the method provided by the present invention can obtain all of Pb isotope ratios with two times of peak-jumps, which increases the collection efficiency of Pb isotope ion beams and decreases influences of ion beam stability on Pb isotope analysis results. Consequently, compared with a multi-ion counter static method and a single-ion counter peak-jumping method, the method provided by the present invention improves the Pb isotope analysis precision for the single-grain zircon ID-TIMS U—Pb dating method (with a .sup.205Pb tracer), having application potentials.

A cleanliness monitor, an evaluation system and a method. The cleanliness monitor may include: a first vacuum chamber, a second vacuum chamber, a molecule collector, a release unit, a mass spectrometer, a manipulator that may be configured to move the molecule collector from the first position to the second position, and an analyzer. The mass spectrometer may have a line of sight to an inner space of the second vacuum chamber. The mass spectrometer may be configured to monitor the inner space of the second vacuum chamber and to generate detection signals that are indicative of a content of the inner space of the second vacuum chamber. A first subset of the detection signals may be indicative of a presence of the at least subset of released organic molecules. The analyzer may be configured to determine, based on the detection signals, the cleanliness of at least one out of (a) the first vacuum chamber, and (b) a tested vacuum chamber. The tested vacuum chamber is fluidly coupled to the first vacuum chamber.

A cleanliness monitor, an evaluation system and a method. The cleanliness monitor may include: a first vacuum chamber, a second vacuum chamber, a molecule collector, a release unit, a mass spectrometer, a manipulator that may be configured to move the molecule collector from the first position to the second position, and an analyzer. The mass spectrometer may have a line of sight to an inner space of the second vacuum chamber. The mass spectrometer may be configured to monitor the inner space of the second vacuum chamber and to generate detection signals that are indicative of a content of the inner space of the second vacuum chamber. A first subset of the detection signals may be indicative of a presence of the at least subset of released organic molecules. The analyzer may be configured to determine, based on the detection signals, the cleanliness of at least one out of (a) the first vacuum chamber, and (b) a tested vacuum chamber. The tested vacuum chamber is fluidly coupled to the first vacuum chamber.

A method of analysing a sample is disclosed that comprises surveying a sample in a first mode of operation by directing a spray of charged droplets onto the sample, determining one or more regions of interest in the sample, and analysing the one or more regions of interest in a second different mode of operation by directing a spray of charged droplets onto the sample. The spot size of the spray of charged droplets at a point of impact with the sample may be varied.

A method of analysing a sample is disclosed that comprises surveying a sample in a first mode of operation by directing a spray of charged droplets onto the sample, determining one or more regions of interest in the sample, and analysing the one or more regions of interest in a second different mode of operation by directing a spray of charged droplets onto the sample. The spot size of the spray of charged droplets at a point of impact with the sample may be varied.