Patent classifications
H
H01
H01J
2237/00
H01J2237/04
H01J2237/043
H01J2237/043
Multiple landing energy scanning electron microscopy systems and methods
Inspection systems and methods are disclosed. An inspection system may include a first energy source configured to provide a first landing energy beam and a second energy source configured to provide a second landing energy beam. The inspection system may also include a beam controller configured to selectively deliver one of the first and second landing energy beams towards a same field of view, and to switch between delivery of the first and second landing energy beams according to a mode of operation of the inspection system.