A loading station (100, 200) for translocating a frozen sample for electron microscopy, encompassing a chamber (104, 204), open toward the top, that is fillable at least partly with a coolant, the chamber (104, 204) comprising in its side wall at least two ports (101a, 102a, 103a) each for different sample transfer devices (101, 102, 103), the ports (101a, 102a, 103a) permitting introduction of a frozen sample into the chamber (104, 204) via a selected sample transfer device and withdrawal of a frozen sample from the chamber via a respective different sample transfer device; and wherein a receptacle (108, 208) for at least two differently configured sample holders (109, 110) is arranged in the chamber (104, 204), the at least two sample holders (109, 110) being detachably fastenable to at least one of the sample transfer devices (101) for introduction of the frozen sample into the chamber (104, 204) and for withdrawal of the frozen sample from the chamber (104, 204).

Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.

A permanently sealed vacuum tube is used to provide the electrons for an electron microscope. This advantageously allows use of low vacuum at the sample, which greatly simplifies the overall design of the system. There are two main variations. In the first variation, imaging is provided by mechanically scanning the sample. In the second variation, imaging is provided by point projection. In both cases, the electron beam is fixed and does not need to be scanned during operation of the microscope. This also greatly simplifies the overall system.

An environmental transmission electron microscope (ETEM) suffers from gas-induced resolution deterioration. Inventors conclude that the deterioration is due to ionization of gas in the sample chamber of the ETEM, and propose to use an electric field in the sample chamber to remove the ionized gas, thereby diminishing the gas-induced resolution deterioration. The electric field need not be a strong field, and can be caused by, for example, biasing the sample with respect to the sample chamber. A bias voltage of 100 V applied via voltage source is sufficient for a marked improvement the gas-induced resolution deterioration. Alternatively an electric field perpendicular to the optical axis can be used, for example by placing an electrically biased wire or gauze off-axis in the sample chamber.