A semiconductor package includes; a chip structure including vertically stacked semiconductor chips disposed on a package substrate, a spacer disposed on an uppermost semiconductor chip among the semiconductor chips, an encapsulant covering at least part of the chip structure, and including an upper portion of the encapsulant covering at least part of the spacer, and a marking pattern visually identifiable through an opening in the upper portion of the encapsulant selectively exposing portions of the spacer.

Provided is a semiconductor package including a first semiconductor chip having a bottom surface adjacent to a first active layer and an top surface opposite to the bottom surface; a first adhesive layer disposed on the top surface of the first semiconductor chip; a first conductive stud disposed on the bottom surface of the first semiconductor chip and electrically connected to the first active layer; a first conductive post disposed outside the first semiconductor chip; a redistribution structure disposed under the first semiconductor chip and including a redistribution pattern connected to the first conductive stud and the first conductive post and a redistribution insulation layer surrounding the redistribution pattern; and a molding layer surrounding the first semiconductor chip, the first adhesive layer, the first conductive stud, and the first conductive post on the redistribution structure. Also, a top surface of the molding layer, a top surface of the conductive post, and a top surface of the first adhesive layer may be coplanar.

The present disclosure provides a method that includes receiving a circuit layout that includes circuit features and a mark pattern to be formed on a same material layer over an integrated circuit (IC) substrate, the circuit features being longitudinally oriented along a first direction and being distanced from each other along a second direction that is orthogonal to the first direction; fragmenting the mark pattern to generate a fragmented mark pattern having fragmented mark features such that the fragmented mark features are configured in parallel and are longitudinally oriented along a third direction; and generating a modified circuit layout for circuit fabrication, the modified circuit layout including the circuit features and the fragmented mark pattern.

Information regarding a semiconductor package is written on a stiffener and not on an upper surface of a semiconductor chip. The stiffener is positioned outside an outer edge of the semiconductor chip and inside an outer edge of a package base material. Further, a thermally conductive material having fluidity is disposed between the upper surface of the semiconductor chip and a radiator. Therefore, the semiconductor chip provides high cooling performance.

An elastic wave device includes an elastic wave element mounted on a mounting substrate, with the elastic wave element being sealed by a sealing resin layer. The elastic wave element is bonded to electrode lands on the mounting substrate using bumps. Recessed portions are provided on a surface of the sealing resin layer on a side opposite to the side facing the mounting substrate. A ratio D/H between a depth of the recessed portions, and a distance of a portion of the sealing resin layer from the surface to a second main surface of a piezoelectric substrate, is no less than about 1/3.

The present invention provides a display panel and a display device. The display panel includes a first substrate, a second substrate, and multiple process markings. The first substrate includes multiple scan lines and multiple data lines. The scan lines and the data lines are intersected with each other to form multiple grids. The second substrate is arranged corresponding to the first substrate. The process markings are arranged on an inner surface of the first substrate. Projections of the process markings projected on the first substrate are located within projections of the grids projected on the first substrate.

A package includes a corner, a device die having a front side and a backside, and a molding material molding the device die therein. A plurality of redistribution lines is on the backside of the device die. The plurality of redistribution lines includes a plurality of metal pads. A polymer layer contacts the plurality of metal pads. A plurality of openings is formed in the polymer layer, with the plurality of metal pads aligned to and exposed to the plurality of openings. The plurality of openings includes a corner opening that is elongated and an additional opening farther away from the corner than the corner opening. The additional opening is non-elongated.

A semiconductor device includes: a semiconductor wafer with a chip region and an edge region and with an identification mark formed on one surface of the semiconductor wafer in the edge region; conductive connectors formed on the one surface of the semiconductor wafer in the chip region; and dummy conductive connectors formed on the one surface of the semiconductor wafer in the edge region, wherein the dummy conductive connectors do not overlap with the identification mark.

A method for marking a semiconductor substrate at the die level for providing unique authentication and serialization includes projecting a first pattern of actinic radiation onto a layer of photoresist on the substrate using mask-based photolithography, the first pattern defining semiconductor device structures and projecting a second pattern of actinic radiation onto the layer of photoresist using direct-write projection, the second pattern defining a unique wiring structure having a unique electrical signature.

The present disclosure relates to a display device including a first substrate and a second substrate facing each other; and a first identification number (ID) pattern positioned on a first side surface of the first substrate.