A machine learning apparatus includes: a state amount observation unit that observes a state amount of a laser apparatus including output data from an optical output detection unit, an optical output characteristic recording unit that records history of a driving current and optical output characteristics, and a driving condition/state amount recording unit that records history of a LD unit driving condition data and the state amount; an operation result acquisition unit that acquires a prediction result of characteristics and measurement result of optical output characteristics of the LD unit; a learning unit that learns the LD unit driving condition data with the state amount and the results of the LD unit driving condition data; and a decision-making unit that decides, from a learning result, the LD unit driving condition data.

There are provided high power, high brightness solid-state laser systems that maintain initial beam properties, including power levels, and do not have degradation of performance or beam quality, for at least 10,000 hours of operation. There are provided high power, high brightness solid-state laser systems containing Oxygen in their internal environments and which are free from siloxanes.

A light source device includes: a first optical element through which emission light emitted from each of semiconductor laser elements propagates; a first light receiver that receives first propagating light that has propagated through the first optical element; a laser driving controller that controls the semiconductor laser elements; and a measurement circuit that measures a first output value that indicates a received-light intensity of the first propagating light that has been received by the first light receiver. The first light receiver is disposed downstream of the first optical element. The laser driving controller drives the semiconductor laser elements by using a plurality of values of a driving current that are different from each other. The measurement circuit measures the first output value of the first propagating light received by first light receiver for each of the plurality of values of the driving current that are different from each other.

Systems, methods, and devices are described for in-situ testing of vertical-cavity surface-emitting lasers (VCSELs), VCSEL arrays or laser diodes (each a laser). Testing may comprise bias voltage measurements of one or more lasers. Embodiments may comprise one of a laser, a driver circuit providing a bipolar drive to the laser, and a sensing circuit to measure and/or monitor damage or degradation of the laser. The bipolar drive may comprise a pulsed forward bias output configured to produce a light output during an on-time of the laser, and a pulsed reverse bias output during an off-time of the pulsed forward bias output. The pulsed outputs may comprise a variable, chirped frequency. One or more of a reverse leakage current, and a junction temperature may be measured to monitor a state of health of the laser.

Disclosed are a testing unit, system, and method for testing and predicting failure of optical receivers. The testing unit and system are configured to apply different values of current, voltage, heat stress, and illumination load on the optical receivers during testing. The test methods are designed to check dark current, photo current, forward voltage, and drift over time of these parameters.

In some implementations, a semiconductor wafer includes a plurality of optical emitters, wherein an optical emitter, of the plurality of optical emitters, is associated with a receiver conducting medium for receiving wireless power transfer, wherein the receiver conducting medium is configured to couple to a wireless power transfer component for wireless power transfer at a common resonant frequency, and wherein the receiver conducting medium is configured to power the optical emitter to provide an optical output when the wireless power transfer is applied at the common resonant frequency.

A laser structure may include a substrate, an active region arranged on the substrate, and a waveguide arranged on the active region. The waveguide may include a first surface and a second surface that join to form a first angle relative to the active region. A material may be deposited on the first surface and the second surface of the waveguide.

The present disclosure provides fabrication of a laser diode with reliability at a high temperature of 80° C. or more in a high-power single mode by a process of thinly growing a second upper clad (P clad) layer at 1 μm or less in primary growth, appropriately controlling an upper portion Wt to 1.5 μm or more and a lower portion Wb to 4.0 μm or less of the wave guide, and then compensating for a second upper clad layer to 0.5 μm or more in regrowth, in order to compensate for disadvantages of a high-power and high-reliability laser diode device with a thick second upper clad layer (P clad). A second upper clad regrowth layer is applied to reduce internal resistance and voltage and reduce heat generated in the device to increase a Kink and a COD power, thereby improving the performance of a high-power and high-reliability laser diode.

A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a housing including a reflecting surface configured to surround a space together with the laser diode bar and reflect, toward the space, light leaked from the rear surface, in a scattering manner; and a detector configured to detect light reflected by the reflecting surface. A laser module includes: a laser diode bar including a plurality of emitters configured to emit laser light from a front surface and leak light from a rear surface; a condenser lens on which light leaked from rear surfaces of all of the plurality of emitters impinges; and a detector configured to detect light transmitted through the condenser lens.

A vertical cavity surface emitting laser element includes a first light reflecting film, a nitride semiconductor layered body, a p-electrode and a second light reflecting film. The nitride semiconductor layered body includes an n-side semiconductor layer disposed on the first light reflecting film, an active layer disposed on the n-side semiconductor layer, and a p-side semiconductor layer disposed on the active layer. The p-side semiconductor layer includes a protrusion and a surface around the protrusion. The p-electrode is in contact with an upper surface of the protrusion, and extends to the surface around the protrusion. The p-electrode is light-transmissive. The second light reflecting film is disposed on the p-electrode. A height of the protrusion as measured from the surface around the protrusion is smaller than a thickness of the p-electrode.